Abstract: Techniques are described to provide a universal direct docking tester to prober interface between the test head and a prober of semiconductor wafer prober for testing die within semiconductor wafers. In an implementation, a universal direct docking tester to prober interface includes a tray assembly configured to be mounted within an opening of the prober housing and a stiffener assembly configured to be mounted to a test head to support a load board PCB that includes a probe head. The stiffener assembly includes a skirt that is received in the tray assembly when the test head is interfaced with the prober to position the load board PCB within the prober to facilitate engagement of the probe head with the wafer.

Abstract: Embodiments relate to an apparatus for determining a sensitivity of a capacitive sensing device having a sensor capacitor with a variable capacitance. The apparatus includes a measurement module and a processor. The measurement module is configured to determine, in response to a first electrical input signal to the sensor capacitor, a first quantity indicative of a first capacitance of the sensor capacitor and to determine, in response to a second electrical input signal to the sensor capacitor, a second quantity indicative of a second capacitance of the sensor capacitor. The processor is configured to determine the sensitivity of the sensing device based on the determined first and second quantity.

Abstract: A sensor package and a method for manufacturing a sensor package are disclosed. An embodiment includes a sensor and a conductive line, wherein the sensor is arranged proximate to the conductive line. The sensor and the conductive line are isolated and at least partially encapsulated. A soft magnet is arranged in, on or around the encapsulation, wherein the soft magnet includes a composition of an insulating material and a material having soft magnetic properties.

Abstract: A testing device including a first connector, a control unit, a first detecting circuit and a memory controller is provided. The first connector is electrically connected to a first bus. The control unit generates a plurality of first control signals according to a first enable signal from the first connector. The first detecting circuit is electrically connected to a plurality of first transmission lines in the first bus, and sequentially conducts the first transmission lines to a ground according to the first control signals. The memory controller detects states of the signals transmitted by the first transmission lines and determines whether to generate a first abnormal indication signal according to a detecting result. The control unit controls a plurality of indication lights according to the first abnormal indication signal.

Abstract: A microelectromechanical system (MEMS) package is disclosed herein. The MEMS package includes a movable mass. The MEMS package further includes a first and second sense electrodes spaced apart from the movable mass. The first and second sense electrodes are configured to be electrically coupled with a controller. The MEMS package further includes a first test electrode and a second test electrode spaced apart from the movable mass. The first and the second test electrodes are configured to be electrically connected to first and second external electrical connectors, respectively. The first and second test electrodes are biased at a first voltage and a second voltage, respectively, when the first and second external electrical connectors are connected to external voltage sources.

Abstract: A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.

Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.

Abstract: A system, method and device for interrogating a downhole environment in a borehole beneath a surface includes a source of electromagnetic energy, operable to transmit an electromagnetic signal in the borehole, a sensor module, including a passive resonator having a resonant frequency that varies with changes in the condition in the downhole environment to reflect the electromagnetic signal and generates harmonic frequencies in response to a condition in the downhole environment in the borehole and a detector positionable to receive a returned electromagnetic signal. Embodiments include a filter to pass a harmonic of the resonant frequency of the resonating circuit and circuitry configured and arranged to measure the frequency of the harmonic signal.

Abstract: A method of operating a sensor 112 having a first transmit plate 114, a second receive plate 115 and a dielectric material between the two plates 114, 115. The method comprises the steps of: applying an alternating across the transmit and receive plates 114, 115, thereby to create an alternating electric field, which applied voltage results in a current Iz flowing through the two plates 114, 115; producing a voltage signal corresponding to the resultant current Iz; determining the average value of the product of the corresponding voltage signal and a reference voltage signal Vref3; and adjusting the phase of the reference voltage Vref3 until a null condition is achieved, at which condition the average value is approximately zero. A sensor 112 is also disclosed.

Abstract: A circuit arrangement (16) for monitoring electrical isolation in a power supply system (7). Electrical isolation is provided between a high-voltage system (8) and a low-voltage system (9), wherein the high-voltage system (8) and the low-voltage system (9) are connected to ground (14), and wherein the high-voltage system (8) has a first connection (T+) for a first supply voltage potential and a second connection (T?) for a second supply voltage potential of a voltage source (10). In each case, at least one variable resistor (Rm1, Rm2) is connected between the connections (T+, T?) and ground (14), and a voltage measuring device (17) for detecting a potential shift of the ground (14) relative to the supply voltage potentials when at least one of the resistors (Rm1, Rm2) is varied. And an evaluation device, which determines the ability of the electrical isolation to function depending on the detected potential shifts.

Abstract: Methods and systems are disclosed for wireless communication, and in particular using a coaxial antenna for distributed wireless transmission. In one example, a wireless transmitter is disclosed that includes a radio frequency signal source and a coaxial cable including a near end and a far end. The near end is electrically connected to the radio frequency signal source and configured to receive signals from the radio frequency signal source. The coaxial cable has an inner conductor and an outer conductor. The wireless transmitter includes a shorting connection at the far end of the coaxial cable, the shorting connection electrically connecting the inner conductor and the outer conductor, and a plurality of openings along the coaxial cable spaced at predetermined locations to output signals generated by the radio frequency signal source. The invention can be used for RF attenuation monitoring and/or testing applications.

Abstract: A cell test method for a liquid crystal display panel includes the following steps. A waveform sequence to shorting bars is provided, wherein the waveform sequence includes that the first gate line sends a voltage of “turn on” signal and the second and third gate lines send a voltage of “turn off” signal at the first and second time periods; and the waveform sequence further comprises that the first and second data lines respectively send first and second voltages at the first and second time periods, the first threshold voltage is higher than the first voltage, the first voltage is higher than the common voltage, the common voltage is higher than the second voltage, and the second voltage is higher than the second threshold voltage, whereby pixels defined by the first gate line and the first and second data lines is turn on.

Abstract: A marine electromagnetic survey source includes a power cable configured to couple to a high voltage power supply at one axial end and to a head unit at the other axial end. The head unit includes equipment configured to output a lower voltage at higher current than the current imparted thereto by high voltage power supply. The head unit has an electrically conductive exterior coupled to one output terminal of the equipment. An electromagnetic antenna cable having an electrode thereon is coupled to the head unit and configured to receive the output of another terminal of the head unit equipment. In some implementations, electromagnetic fields are induced in formations by conducting current to the equipment. Marine geophysical surveys are conducted utilizing such induction of electromagnetic fields.

Abstract: A measuring device used for registering a test signal originating from a circuit structure applied to a wafer. The measuring device provides at least one test probe and at least one test transformer. The at least one test transformer is connected to the at least one test probe in an electrically conductive manner. In this context, the test transformer is arranged on the test probe.

Abstract: Provided is a stud finder for determining the location of a stud within a wall. The stud finder includes a body having an internal compartment formed therein which is sized and configured to house a magnetic element therein. The stud finder is moveable along the wall to place the magnetic element in magnetic attraction with metallic fasteners (i.e., nails, screws, etc) disposed within the stud, such as for securing drywall to the stud. The magnetic attraction urges the magnetic element toward the metallic element to provide a visual indication as to the precise location of the metallic element, as well as the underlying stud.

Abstract: A probing apparatus includes a rotating device having a plurality of platforms for supporting DUTs, a probe device having a lifting stage movable between first and second positions, and a heating device mounted to the lifting stage so as to move along with it. The platforms are synchronously revolvable in a way that the platforms move to a test position sequentially The heating device is configured in a manner that when the lifting stage moves to the first position, the heating device is located away from the platform at the test position, and when the lifting stage moves to the second position, the heating device contacts and heats the platform at the test position. Therefore, the heating device and the probe device are movable simultaneously for heating up the platform and testing the DUT respectively.

Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.

Abstract: Inspecting jig operable to bring a probe into contact with a connector on a board includes a probe holding body; a guide guiding the probe to be in contact with the connector on the board, the guide being engaged with the connector to be positioned with respect to the connector; and a coupling unit coupling the probe holding body and the guide to move relative to each other between a first relative position and a second relative position, the first relative position where a distal end of the probe is brought into contact with the connector when the guide is positioned with respect to the connector, the second relative position where the distal end of the probe is separated from the board and is separated from an imaginary line perpendicular to the board and passing the connector, when the guide is positioned with respect to the connector.

Abstract: A power circuit configured to generate and distribute DC electrical power, the power circuit includes a photovoltaic (PV) system that includes an array of PV modules electrically coupled to a combiner box, and an inverter positioned to receive DC electrical power from the array of PV modules and output AC electrical power. The PV system also includes a signal generator coupled to a first portion of the PV system, and a signal detector coupled to a second portion of the PV system, the signal detector configured to detect secondary signals generated at a loose connection of an electrical joint in the PV system, wherein the secondary signals result from a signal generated by the signal generator.

Abstract: An object is to provide a current measurement method which enables a minute current to be measured. To achieve this, the value of a current flowing through an electrical element is not directly measured, but is calculated from a change in potential observed in a predetermined period. The detection of a minute current can be achieved by a measurement method including the steps of applying a predetermined potential to a first terminal of an electrical element comprising the first terminal and a second terminal; measuring an amount of change in potential of a node connected to the second terminal; and calculating, from the amount of change in potential, a value of a current flowing between the first terminal and the second terminal of the electrical element.