Abstract: A measurement apparatus and method for determining a substrate grid describing a deformation of a substrate prior to exposure of the substrate in a lithographic apparatus configured to fabricate one or more features on the substrate. Position data for a plurality of first features and/or a plurality of second features on the substrate is obtained. Asymmetry data for at least a feature of the plurality of first features and/or the plurality of second features is obtained. The substrate grid based on the position data and the asymmetry data is determined. The substrate grid and asymmetry data are passed to the lithographic apparatus for controlling at least part of an exposure process to fabricate one or more features on the substrate.

Abstract: A method and a system for comprehensively evaluating reliability of a multi-chip parallel IGBT module are provided. The method includes: establishing a gate-emitter voltage reliability model of the multi-chip parallel IGBT module, performing a chip fatigue failure test, and selecting a gate-emitter voltage as a failure characteristic quantity; establishing a transconductance reliability model of the multi-chip parallel IGBT module, performing a bonding wire shedding failure test, and selecting a transmission characteristic curve of the module as a failure characteristic quantity; using a Pearson correlation coefficient to characterize a degree of health of the IGBT module, and respectively calculating degrees of health PPMCCC and PPMCCB in different degrees of chip fatigue and bonding wire shedding failure states; and comprehensively evaluating the reliability of the multi-chip parallel IGBT module according to PPMCCC and PPMCCB.

Abstract: A system and method for automatically generating placement of vias within redistribution layers of a semiconductor package are described. In various implementations, a user defines attributes to use for automatic via generation in redistribution layers of a semiconductor package. The circuitry of a processor of a computing device used by the user executes instructions of an automatic redistribution layer (RDL) via generator. The automatic via generator uses the attributes, data indicative of the RDL netlist of signal routes within the RDL, and RDL mask layout data representing the signal masks of the metal layers within the RDL. The processor generates placement of vias for in the RDL based on the attributes and an identification of overlapping regions between metal layers.

Abstract: A controller executes an equalization process of equalizing capacities of a plurality of cells, and a cell abnormality determination process of, of detected voltages of the plurality of cells, calculating a voltage difference between a representative voltage based on the detected voltage of at least one cell to be compared and the detected voltage of one cell to be detected at a first time and a second time, and when a difference between the two voltage differences is greater than or equal to a threshold value, determining that the cell to be detected is abnormal. In the case of executing the cell abnormality determination process during the equalization process, the controller provides the detected voltage of a target cell to be subjected to the equalization process with a compensation value corresponding to a voltage change based on energy transfer in the target cell due to the equalization process between the first time and the second time, and calculates the voltage difference at the second time.

Abstract: Described is technology for automatically generating a routing for an integrated circuit (IC) design. Information describing pin-pairs of an integrated circuit (IC) design is received. An initial routing of the IC design is determined by (i) defining connected wires between each pin-pair in the set of pin-pairs, and (ii) evaluating a target resistance for the pin-pair over the connected wires, wherein each connected wire is routed with other connected wires. A resistance adjustment is applied to adjust wire resistance of the connected wires of the initial routing. The resistance adjustment can be based on a square routing in response to a wire resistance being below the target resistance; or the resistance adjustment can be based on a multi-layer stacking in response to the wire resistance being above the target resistance. The routing is provided in patterns as generated by the initial routing and the resistance adjustment.

Abstract: Embodiments include herein are directed towards a system and method for intelligent intent recognition based electronic design. Embodiments may include receiving, using a processor, a natural language input from a user at an intent recognition model. Embodiments may also include performing intent recognition on the natural language input at the intent recognition model and providing an output from the intent recognition model to a command generator. Embodiments may further include generating a command based upon, at least in part, the output and executing the command at a target tool environment.

Abstract: Methods and systems for providing concise data for analyzing checker completeness, in the context of formal verification analysis of circuit designs. The methods and systems concisely report information useful to a human user (e.g., circuit designer or verification engineer) for efficiently determining what manual action should be taken next to resolve holes in verification coverage. The reported information can include lists of signals on which checkers can be written, which lists can be ranked, can be limited to a subset of interest signals, and can include corresponding cover items for each reported interest signal. The present systems and methods thereby improve on reporting provided to the user, permitting the user to more quickly advance a formal verification process toward full coverage of the relevant portions of a circuit design.

Abstract: Disclosed are a quantum topology graph optimization method, apparatus, terminal and storage medium, comprising: obtaining a first quantum topology graph of a target quantum algorithm, determining an intermediate node in the first quantum topology graph, and removing connecting lines between other graph nodes other than the intermediate node so as to obtain a second quantum topology graph without the crossed connecting lines; if not, updating the first quantum topology graph to a third quantum topology graph; determining an optimized sub-graph corresponding to one node to be optimized and composed of N child nodes connected by connecting lines according to a preset way, assigning connecting lines between non-optimized nodes and each child node so as to obtain a fourth quantum topology graph; restoring connecting lines between non-optimized nodes in the fourth quantum topology graph so as to obtain an optimized quantum topology graph.

Abstract: A method and system for generating a physical layout for a grating coupler integrated in a photonically-enabled circuit are disclosed herein. In some embodiments, the method receives a parametrized wavelength, a parametrized first refractive index, a parametrized second refractive index, a parametrized taper length, a parametrized width, a parametrized grating length, and a parametrized incident angle of the optical beam incident onto the grating coupler and generates a physical layout for the grating coupler based on the received parametrized inputs, the generating of the physical layout is according to a predefined model, and outputs the physical layout of the grating coupler for manufacturing under a semiconductor fabrication process.

Abstract: Systems and methods are disclosed for automated generation of integrated circuit designs and associated data. These allow the design of processors and SoCs by a single, non-expert who understands high-level requirements; allow the en masse exploration of the design-space through the generation processors across the design-space via simulation, or emulation; allow the easy integration of IP cores from multiple third parties into an SoC; allow for delivery of a multi-tenant service for producing processors and SoCs that are customized while also being pre-verified and delivered with a complete set of developer tools, documentation and related outputs. Some embodiments, provide direct delivery, or delivery into a cloud hosting environment, of finished integrated circuits embodying the processors and SoCs.

Abstract: A computer-aided design (CAD) tool is provided for logic optimization and synthesis. The CAD tool executes a process that involves optimizing power, performance, and area (PPA) of a logic circuit by minimizing a number of CMOS gates, and majority and/or minority gates in the circuit and its depth. The CAD tool implements a methodology of optimizing logic synthesis based on a mix of standard cell libraries (such as AND, OR, NAND, NOR, XOR, Multiplexer, full adder, half adder, etc.) and varying input majority and minority gates (where the number of inputs in the minority and majority gates could vary as odd numbers from 3 and above). The standard cell libraries cells may contain minority and/or majority gates.

Abstract: Systems and methods are disclosed for to generation of dynamic design flows for integrated circuits. For example, a method may include accessing a design flow configuration data structure, wherein the design flow configuration data structure is encoded in a tool control language; based on the design flow configuration data structure, selecting multiple flowmodules from a set of flowmodules, wherein each flowmodule provides an application programming interface, in the tool control language, to a respective electronic design automation tool; based on the design flow configuration data structure, generating a design flow as a directed acyclic graph including the selected flowmodules as vertices; and generating an output integrated circuit design data structure, based on one or more input integrated circuit design data structures, using the design flow to control the respective electronic design automation tools of the selected flowmodules.

Abstract: A method of manufacturing an apparatus is provided. The apparatus is formed on a wafer or a package. The apparatus includes a polynomial generator, a plurality of matrix generators connected to an output of the polynomial generator, and a convolution generator connected to an output of the plurality of matrix generators. The apparatus is tested using one or more electrical to optical converters, one or more optical splitters, and one or more optical to electrical converters.

Abstract: A method, a device, and an electronic apparatus are provided. When a user performs the design operation in a display panel design program, the method includes steps of collecting display panel design parameters corresponding to a design operation of the user in the display panel design program obtaining a design strategy preset in the display panel; checking if the display panel design parameters are normal based upon the design strategy of the display panel; and alerting in the display panel design program when the display panel design parameters are abnormal.

Abstract: Embodiments include herein are directed towards a method for electronic circuit design. Embodiments may include receiving a selection of an instance associated with an electronic design at an electronic design schematic displayed on a graphical user interface. Embodiments may also include selecting a corresponding instance within an electronic design layout displayed on a graphical user interface. Embodiments may further include receiving a selection of a source topology and routing at the electronic design layout displayed on the graphical user interface, based upon at least in part, the source topology.

Abstract: A pixel design method, a pixel design device, and equipment are provided. The method includes obtaining design dimension and resolution information of a display panel configured by a user; computing dimensions of a single pixel of the display panel based on the design dimension information of the display panel and design resolution information of the display panel; and drawing a pixel design diagram of the single pixel in the display panel based on the dimensions of the single pixel and the pixel design strategy information.

Abstract: Various embodiments provide for context-aware circuit design layout construct, which may be part of electronic design automation (EDA). In particular, some embodiments enable use of a circuit design layout construct with a layout of a circuit design (hereafter, a circuit design layout), where a programmable pattern of layout shapes of the circuit design layout construct can be inserted into a circuit design layout and can be adapted based on context information associated with the location of its placement within the circuit design layout.

Abstract: A system is disclosed that includes a memory, and a processor configured to perform operations stored in the memory. The processor performs the operations to analyze each of a first set of sequential elements of a plurality of sequential elements to determine an edge of a clock signal pattern of a clock associated with each of the first set of sequential elements causing an output change at corresponding one or more sequential elements of the first set of sequential elements. The processor further performs the operations to discard one or more cycles of the clock signal pattern of the clock from emulation that do not include the edge of the clock signal pattern that causes at least one sequential element of the first set of sequential elements to change the output and emulate remaining cycles of the clock signal pattern of the clock.

Abstract: A computer-aided design (CAD) tool is provided for logic optimization and synthesis. The CAD tool executes a process that involves optimizing power, performance, and area (PPA) of a logic circuit by minimizing a number of CMOS gates, and majority and/or minority gates in the circuit and its depth. The CAD tool implements a methodology of optimizing logic synthesis based on a mix of standard cell libraries (such as AND, OR, NAND, NOR, XOR, Multiplexer, full adder, half adder, etc.) and varying input majority and minority gates (where the number of inputs in the minority and majority gates could vary as odd numbers from 3 and above). The standard cell libraries cells may contain minority and/or majority gates.

Abstract: A computer-aided design (CAD) tool is provided for logic optimization and synthesis. The CAD tool executes a process that involves optimizing power, performance, and area (PPA) of a logic circuit by minimizing a number of CMOS gates, and majority and/or minority gates in the circuit and its depth. The CAD tool implements a methodology of optimizing logic synthesis based on a mix of standard cell libraries (such as AND, OR, NAND, NOR, XOR, Multiplexer, full adder, half adder, etc.) and varying input majority and minority gates (where the number of inputs in the minority and majority gates could vary as odd numbers from 3 and above). The standard cell libraries cells may contain minority and/or majority gates.