Patents Examined by Hal P. Wachsman
  • Patent number: 5572536
    Abstract: Digital circuitry in a data processing system includes parallel signature analysis circuitry having a sampling feature which permits sampling any given signal on all clock phases of the digital circuitry. The parallel signature analysis circuitry provides for selective coupling of a target node to each of the respective inputs of a pair of serially-coupled latches.
    Type: Grant
    Filed: May 26, 1994
    Date of Patent: November 5, 1996
    Assignee: Texas Instruments Incorporated
    Inventor: Sudha Thiruvengadam
  • Patent number: 5566092
    Abstract: The invention provides a machine fault diagnostic system to help ensure effective equipment maintenance. The major technique used for fault diagnostics is a fault diagnostic network (FDN) which is based on a modified ARTMAP neural network architecture. A hypothesis and test procedure based on fuzzy logic and physical bearing models is disclosed to operate with the FDN for detecting faults that cannot be recognized by the FDN and for analyzing complex machine conditions. The procedure described herein is able to provide accurate fault diagnosis for both one and multiple-fault conditions. Furthermore, a transputer-based parallel processing technique is used in which the FDN is implemented on a network of four T800-25 transputers.
    Type: Grant
    Filed: December 30, 1993
    Date of Patent: October 15, 1996
    Assignee: Caterpillar Inc.
    Inventors: Hsu-Pin Wang, Hsin-Hao Huang, Gerald M. Knapp, Chang-Ching Lin, Shui-Shun Lin, Julie K. Spoerre
  • Patent number: 5561607
    Abstract: A standard cell topography has a generally rectangular topography, circumscribed by a set of four mutually orthogonal cell boundary edges. Coupled in circuit with a standard AND gate circuit within the cell are a pair of sense nodes for testing the AND gate. The sense MOSFETs are adjacent to opposite cell edges and are connected to respective sense nodes. First and second parallel metallic control links, which are used to gate the sense MOSFETs, extend the width of the cell between opposing cell boundary edges, so as to facilitate placement of the cells in boundary edge-abutting relationship, so that abutting control links may effectively form continuous runs through all the cells of a respective row of cells. A first output terminal of the first sense MOSFET is adjacent to one boundary edge and a second output node of the second terminal of the second sense MOSFET is adjacent to the other opposing cell boundary edge.
    Type: Grant
    Filed: October 12, 1993
    Date of Patent: October 1, 1996
    Assignee: Harris Corporation
    Inventor: Robert Makofske
  • Patent number: 5546327
    Abstract: The zenithal angle of a spherical surface is divided at regular intervals, the horizontal angle thereof is also divided at regular intervals in correspondence with each of the zenithal angles, and in addition, the intensity of each energy line emitted from the center of the bottom surface of the spherical surface at the divided zenithal and horizontal angles corresponds to each zenithal angle. Thus, the energy lines can be isotropically emitted from the center of the bottom surface the spherical surface. The emitted energy lines are traced from the center to each object surface and the intensity of each energy line which has reached each object surface are added to each other. Then, the intensity obtained by the addition is divided by the intensity of entire energy lines emitted from the center. Thus, the geometrical view factor of each object surface can be found quickly and accurately.
    Type: Grant
    Filed: July 11, 1994
    Date of Patent: August 13, 1996
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Yoshihiro Hattori, Sachio Nagamitsu, Yoichi Nagata, Hisashi Kodama
  • Patent number: 5537334
    Abstract: A system for the processing of signals collected by an eddy current absolute point transducer moving along an inner surface of a conductive material tube and supplying a representative signal concerning the state of the inner surface. The system incorporates a stage for scanning the surface in accordance with a given order or sequence of elementary measurement zones and recording the sampled values of the signal supplied by the transducer for each of the elementary zones, which makes it possible to obtain a three-dimensional image representative of the surface. The system also constructs a background noise surface on the complete image, subtracts the background noise surface from the image and detects a defect or fault on the surface. Such an invention may find particular application to the inspection of steam generator tubes.
    Type: Grant
    Filed: October 1, 1993
    Date of Patent: July 16, 1996
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Pascale Attaoui, Bruno Benoist, Remy Besnard, Bernard David
  • Patent number: 5521851
    Abstract: A method and apparatus is disclosed to reduce noise which overlaps detected signals in a common frequency band for detection of distributed signals from multiple measurement points. The method decomposes a input signal into a noise-free part called basic signal and a noise-overlapping part called residual signal. Noise contained in residual signal is recognized by comparing it with a comparison signal. The comparison signal corresponding to a measurement point is computed by a linear combination of all other points weighted with parameters which reflect amplitude relationship of distributed signals and are calculated during a learning phase at the beginning of measurement. With residual signal and corresponding comparison signal, a noise index is calculated and then used to extract signal components from the residual signal. The extracted signal components are added to basic signal as the output of the method. The method is effective in reducing signal-overlapping noise with little distortion of signal.
    Type: Grant
    Filed: April 26, 1994
    Date of Patent: May 28, 1996
    Assignee: Nihon Kohden Corporation
    Inventors: Daming Wei, Eishi Harasawa, Hajime Harada
  • Patent number: 5502730
    Abstract: A method of selecting circuit elements in a sequential circuit for partial scan testing relies upon analyzing and breaking reconvergence through the selected circuit element. Different types of reconvergences present in the circuit and their affect on the circuit testability are considered. Harmful reconvergence present in the circuit are broken by scanning a memory element present in the reconvergence path.
    Type: Grant
    Filed: June 10, 1994
    Date of Patent: March 26, 1996
    Assignees: NEC USA, Inc., NEC Corporation
    Inventors: Rabindra K. Roy, Toshinobu Ono
  • Patent number: 5502657
    Abstract: A three-dimensional measuring method obtains three-dimensional information related to an image including one or a plurality of objects based on input information which describes the image. The method includes the steps of (a) selecting information necessary for calculating marks of presumed information from the input information, where each of the marks are used to evaluate the appropriateness of the presumed information, (b) calculating marks of each pixel of the image based on the information selected by the step (a) and based on feedback information which is derived from an internal state, where the internal state includes information related to the object for each pixel of the image, (c) adding the marks for each pixel calculated in the step (b) for each object so as to obtain a total mark, (d) arbitrarily changing the internal state so as to reduce the total mark, and (e) outputting the internal state in which the total mark is a local minimum as the three-dimensional information.
    Type: Grant
    Filed: January 11, 1993
    Date of Patent: March 26, 1996
    Assignee: Fujitsu Limited
    Inventor: Toshio Endoh
  • Patent number: 5475625
    Abstract: Method and arrangement for monitoring manipulations on computers (3) which are connected via a network (2), in the method attributes being inquired automatically from databases of the computers (3) and compared with protectedly stored reference values of the attributes, and an alarm being triggered in the event of non-correspondence. The inquiry, the comparison and the alarm triggering are carried out by a monitoring device (1) which is physically not accessible to intruders, is connected to the computers (3) and the databases of which, containing the reference values, cannot be interrogated.
    Type: Grant
    Filed: November 17, 1994
    Date of Patent: December 12, 1995
    Assignee: Siemens Nixdorf Informationssysteme Aktiengesellschaft
    Inventor: Rainer Glaschick