Patents Examined by Hoa Q. Pham
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Patent number: 11976916Abstract: An optical strain gauge system measures strain on the exterior surface of a pipe to identify areas of wear on the interior surface of the pipe. The optical strain gauge system comprises an optical sensing interrogator and at least one optical fiber. The optical sensing interrogator comprises a light source and a light sensor. The at least one optical fiber includes fiber Bragg gratings along the length of the optical fiber. The optical fiber is arranged on the exterior surface of the pipe with the fiber Bragg gratings forming a two-dimensional array of points at which strain measurements are obtained. The two-dimensional array of strain measurement points provides an accurate assessment of the strains on the exterior of the pipe which can be used to identify areas of wear on the interior surface of the pipe.Type: GrantFiled: June 30, 2021Date of Patent: May 7, 2024Assignee: CHEVRON U.S.A. INC.Inventors: Baha Tanju, Hariprasad Janakiram Subramani, Peter Crowder, Lee Rhyne, Nikolaos Ioannis Salmatanis, Pedro Vargas, Milind L. Prabhu
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Patent number: 11971485Abstract: A lidar system and method includes a photodiode array, a wafer, and a plurality of structures integrated on the wafer to form a metasurface lens. The metasurface lens is configured to focus the light pulses to the photodiode array and each of the plurality of structures includes at least one dimension that is less than a wavelength of the light pulses.Type: GrantFiled: March 26, 2019Date of Patent: April 30, 2024Assignee: Analog Devices, Inc.Inventors: Tyler Adam Dunn, Andrew William Sparks
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Patent number: 11971295Abstract: According to one embodiment, an automatic analyzing apparatus includes: a holder including a plurality of placement portions for a reaction tube to be placed thereon; a photometry unit for performing photometry on a solution inside the reaction tube, the photometry unit including a plurality of light emitters and a plurality of first light receivers respectively disposed in the plurality of placement portions; and processing circuitry configured to adjust quantities of light of the plurality of light emitters based on a light quantity signal from a second light receiver that receives light generated by the light emitters and guided by jig inserted into the placement portions.Type: GrantFiled: September 29, 2021Date of Patent: April 30, 2024Assignee: Canon Medical Systems CorporationInventor: Shin Iida
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Patent number: 11971361Abstract: Devices and methods for characterization and control of biopolymers and synthetic polymers during manufacturing. The device may include a body defining a fluid flow path. The body may be configured to receive a process flow liquid such that the process flow liquid may flow through an interior portion of the body. The body may also include a plurality of detectors inserted into said body, each of the plurality of detectors configured to monitor one or more process characteristics.Type: GrantFiled: August 10, 2018Date of Patent: April 30, 2024Assignee: YOKOGAWA FLUENCE ANALYTICS, INC.Inventors: Wayne Frederick Reed, Michael Felix Drenski, Alex W. Reed
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Patent number: 11971345Abstract: A smoke detector includes: a casing; a first light emitting unit; a second light emitting unit; and a light receiving unit. A second scattering angle that is an angle between the reception axis of the light receiving unit and a second extension extending from an intersection of the second emission axis and the reception axis in a direction away from the second light emitting unit is larger than a first scattering angle that is an angle between the reception axis of the light receiving unit and a first extension extending from an intersection of the first emission axis and the reception axis in a direction away from the first light emitting unit.Type: GrantFiled: March 10, 2020Date of Patent: April 30, 2024Assignee: NOHMI BOSAI LTD.Inventors: Masamichi Uchida, Takahiro Noguchi, Taizo Matsuda, Tomohiro Kato, Kenji Mizutani, Takahiro Kaneko, Takahiro Watanabe
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Patent number: 11965811Abstract: A particle sorting apparatus includes: a flow cell including a flow channel; an imaging element; and a controller. The controller performs a coarse adjustment onto a position of the flow cell based on an image regarding a flow axis of the flow channel and obtained by the imaging element, while continuously moving the flow cell at a first speed. The controller performs a final adjustment onto the position of the flow cell to allow the first intensity of the first light emitted from the light emitting object flowing in the flow channel to be maximum while moving the flow cell at a second speed that is lower than the first speed.Type: GrantFiled: July 16, 2019Date of Patent: April 23, 2024Assignee: Allied Flow Inc.Inventor: Masahiko Kanda
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Patent number: 11953055Abstract: A photographing step of obtaining an original image by photographing a part or all of a sliding surface using a camera is performed and then an imaging process of detecting machining marks on the original image is performed; a detecting step of obtaining a detection image is performed; and an evaluating step of estimating a difference of a rotation torque of the raceway ring member with respect to another raceway ring member on the basis of the detection image in a direction of relative rotation between the raceway ring member and the other raceway ring member when a rolling bearing is constituted by combining a raceway ring member with the other raceway ring member is performed.Type: GrantFiled: December 2, 2019Date of Patent: April 9, 2024Assignee: NSK LTD.Inventor: Hidekazu Suzuki
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Patent number: 11955390Abstract: A semiconductor wafer evaluation method includes acquiring a reflection image as a bright-field image by receiving reflected light which is obtained when irradiating one surface side of a semiconductor wafer to be evaluated with light; acquiring a scattered image as a dark-field image by receiving scattered light which is obtained when irradiating the surface side of the semiconductor wafer with light; and obtaining a distance between a bright zone that is observed in the reflection image and a bright zone that is observed in the scattered image. The semiconductor wafer to be evaluated is a semiconductor wafer in which a chamfered surface is formed in a wafer outer peripheral edge section, and the method includes evaluating a shape of a boundary part between a main surface on the surface side irradiated with the light of the semiconductor wafer to be evaluated and a chamfered surface adjacent to the main surface.Type: GrantFiled: January 7, 2019Date of Patent: April 9, 2024Assignee: SUMCO CORPORATIONInventors: Takahiro Nagasawa, Yasuyuki Hashimoto, Hirotaka Kato
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Patent number: 11949208Abstract: The present disclosure discloses a degassing-free underwater dissolved carbon dioxide detection device and a detection method. The degassing-free underwater dissolved carbon dioxide detection device includes a computer, which is used to provide the driving signal and controlling parameters for the power tuning unit; the computer is connected with a laser driving control module and the power tuning unit, respectively; the laser driving control module is connected with a laser; the laser is connected with a photo-isolator; the photo-isolator is connected with a thulium-doped fiber vertical-cavity laser system; the thulium-doped fiber vertical-cavity laser system is connected with a photoacoustic cell system through a fiber collimator; the photoacoustic cell system is connected with a pre-amplifier circuit and a lock-in amplifier in sequence, and the lock-in amplifier is connected with the computer.Type: GrantFiled: November 10, 2021Date of Patent: April 2, 2024Assignee: Ocean University Of ChinaInventors: Fupeng Wang, Rui Liang, Qingsheng Xue, Jinghua Wu, Xijie Hao
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Patent number: 11940739Abstract: A metrology tool for determining a parameter of interest of a structure fabricated on a substrate, the metrology tool comprising: an illumination optical system for illuminating the structure with illumination radiation under a non-zero angle of incidence; a detection optical system comprising a detection optical sensor and at least one lens for capturing a portion of illumination radiation scattered by the structure and transmitting the captured radiation towards the detection optical sensor, wherein the illumination optical system and the detection optical system do not share an optical element.Type: GrantFiled: December 27, 2021Date of Patent: March 26, 2024Assignee: ASML Netherlands B.V.Inventors: Nitesh Pandey, Arie Jeffrey Den Boef, Duygu Akbulut, Marinus Johannes Maria Van Dam, Hans Butler, Hugo Augustinus Joseph Cramer, Engelbertus Antonius Fransiscus Van Der Pasch, Ferry Zijp, Jeroen Arnoldus Leonardus Johannes Raaymakers, Marinus Petrus Reijnders
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Patent number: 11914303Abstract: The invention relates to an apparatus and a method for characterizing a microlithographic mask. According to one aspect, an apparatus according to the invention comprises at least one light source which emits coherent light, an illumination optical unit which produces a diffraction-limited light spot on the mask from the coherent light of the at least one light source, a scanning device, by use of which it is possible to implement a scanning movement of the diffraction-limited light spot relative to the mask, a sensor unit, and an evaluation unit for evaluating the light that is incident on the sensor unit and has come from the mask, an output coupling element for coupling out a portion of the coherent light emitted by the at least one light source, and an intensity sensor for capturing the intensity of this output coupled portion.Type: GrantFiled: June 11, 2021Date of Patent: February 27, 2024Assignee: Carl Zeiss SMT GmbHInventors: Johannes Ruoff, Heiko Feldmann, Ulrich Matejka, Thomas Thaler, Sascha Perlitz, Shao-Chi Wei, Joerg Frederik Blumrich, Markus Deguenther
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Patent number: 11898949Abstract: By irradiating target liquid L containing fine bubbles with ultrasonic waves from an ultrasonic irradiation device 102, the fine bubbles in the target liquid L is reduced. By irradiating the target liquid L with ultrasonic waves, fine bubbles in the target liquid L can be reduced effectively. By using ultrasonic waves, bubbles with small diameters, particularly fine bubbles, can be effectively reduced, so that fine bubbles in the target liquid L can be efficiently reduced.Type: GrantFiled: November 29, 2018Date of Patent: February 13, 2024Assignees: Shimadzu Corporation, National Institute of Technology and Evaluation, Fine Bubble Industries AssociationInventors: Seika Ohuchi, Mitsuru Tanaka, Haruo Shimaoka
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Patent number: 11898969Abstract: A method and an apparatus for the surface quality inspection of the external surface of at least one component for inhalers or vaporizers, in particular a cartomizer for electronic cigarettes, verifies whether there are surface imperfections on the external surface of the components.Type: GrantFiled: May 21, 2019Date of Patent: February 13, 2024Assignee: I.M.A. INDUSTRIA MACCHINE AUTOMATICHE S.P.A.Inventor: Carlo Zaniboni
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Patent number: 11898249Abstract: A method of processing a substrate according to a PECVD process is described. Temperature profile of the substrate is adjusted to change deposition rate profile across the substrate. Plasma density profile is adjusted to change deposition rate profile across the substrate. Chamber surfaces exposed to the plasma are heated to improve plasma density uniformity and reduce formation of low quality deposits on chamber surfaces. In situ metrology may be used to monitor progress of a deposition process and trigger control actions involving substrate temperature profile, plasma density profile, pressure, temperature, and flow of reactants.Type: GrantFiled: February 13, 2023Date of Patent: February 13, 2024Assignee: Applied Materials, Inc.Inventors: Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang, Juan Carlos Rocha-Alvarez, Thomas Nowak, Jianhua Zhou, Ramprakash Sankarakrishnan, Amit Kumar Bansal, Jeongmin Lee, Todd Egan, Edward W. Budiarto, Dmitriy Panasyuk, Terrance Y. Lee, Jian J. Chen, Mohamad A. Ayoub, Heung Lak Park, Patrick Reilly, Shahid Shaikh, Bok Hoen Kim, Sergey Starik, Ganesh Balasubramanian
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Patent number: 11885612Abstract: An apparatus for three-dimensional measurement of an object includes a trigger configured to obtain image information from a measurement camera and to trigger, in dependence on image content of the image information, a measurement output or an evaluation of the image information by an evaluator for determining measurement results. Further, a respective method and a respective computer program are described.Type: GrantFiled: September 21, 2018Date of Patent: January 30, 2024Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.Inventors: Jens Döge, Christoph Hoppe, Willi Neudeck
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Patent number: 11885751Abstract: A testing device for detecting defects of transparent test specimens, in particular of ophthalmological lenses, has an illumination device for transilluminating test specimens to be examined and with an image acquisition device for imaging the test specimen transilluminated by the illumination device. The illumination device includes a plurality of linearly adjustable light sources for generating a stripe pattern. To capture the stripe pattern, the acquisition duration of the image acquisition device can be adjusted in such a way that the light emitted by each of the light sources is detected as a light stripe. Further, the disclosure relates to a testing method for detecting a defect of a transparent specimen.Type: GrantFiled: September 18, 2023Date of Patent: January 30, 2024Assignee: Carl Zeiss Vision International GmbHInventors: Marc Flemming, Hannes Scheibe, Dominik Wiedemann, Alexander Friedl, Daniel Schoebel
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Patent number: 11877527Abstract: In one aspect, a system for controlling the operation of an agricultural implement may include a ground-engaging tool configured to engage soil within a field such that the tool creates a field material cloud aft of the tool as the implement is moved across the field. Furthermore, the system may include an imaging device configured to capture image data associated with the field material cloud created by the ground-engaging tool. Moreover, a controller of the disclosed system may be configured to identify a plurality of field material units within the field material cloud based on the image data captured by the imaging device. Additionally, the controller may be configured to determine a characteristic associated with the identified plurality of field material units.Type: GrantFiled: October 17, 2019Date of Patent: January 23, 2024Assignee: CNH Industrial America LLCInventors: Douglas James Rylander, Trevor Stanhope
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Patent number: 11879774Abstract: The invention provides a light indicator (100) for use in evaluating melanopsin active radiation in a flux of light, the light indicator (100) comprising a first light indicator element (110) comprising a first light reflective element (112) and a second light indicator element (120) comprising a second light reflective element (122), the light reflecting elements (112,122) having different wavelength dependencies of the spectral reflectivity, wherein the light reflecting elements (112,122) are selected to provide the same intensity of reflected light of two or more different types of light irradiating on the light indicator elements (110,120), wherein the two or more different types of light have different spectral power distributions in the visible wavelength range but having the same ratios of the melanopic flux and the luminous flux, wherein the ratio of the melanopic flux and the luminous flux of light is defined as MEF = 1.Type: GrantFiled: September 2, 2019Date of Patent: January 23, 2024Assignee: SIGNIFY HOLDING B.V.Inventors: Marcel Lucassen, Tobias Borra, Dragan Sekulovski
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Patent number: 11879765Abstract: A measurement apparatus for weight measuring composite sheet including a sheet material having a second material thereon as a coating and/or as embedded particles therein. The apparatus includes an x-ray sensor for providing an x-ray signal from x-ray irradiating the composite sheet and an infrared (IR) sensor for providing an IR signal from IR irradiating the composite sheet. A computing device is coupled to receive the x-ray signal and the IR signal that includes a processor having an associated memory for implementing an algorithm, where the algorithm uses the x-ray signal and the IR signal to compute a plurality of weights selected from a weight of the sheet material, a weight of the second material, and a total weight of the composite sheet.Type: GrantFiled: September 4, 2019Date of Patent: January 23, 2024Assignee: HONEYWELL INTERNATIONAL INC.Inventors: Tobias Nebel, Sebastien Tixier, Michael Kon Yew Hughes, Gertjan Hofman, Paul Mounter
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Patent number: 11867597Abstract: A method for making a plasmonic mushroom array includes: forming a plurality of metal nano-islands each having nanometer-range dimensions on a surface of a glass substrate; and subjecting to the glass substrate having the plurality of metal nano-islands formed thereon to reactive ion etching such that the plurality of metal nano-islands are converted to a plurality of mushroom-shaped structures each having a metal cap supported by a pillar made of a material of the glass substrate and each having dimensions smaller than the dimensions of the nano-islands, the plurality of mushroom-shaped structures being arranged in a substantially regular pattern with intervals smaller than average intervals between the nano-islands, thereby forming the plurality of nano-scale mushroom-shaped structures on the glass substrate that can exhibit localized surface plasmon resonance.Type: GrantFiled: February 22, 2022Date of Patent: January 9, 2024Assignee: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATIONInventors: Nikhil Bhalla, Amy Shen Fried, Kang-Yu Chu