Patents Examined by Hwa S. A Lee
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Patent number: 7920272Abstract: A laser radar system using collocated laser beams to unambiguously detects a range of a target and a range rate at which the target is moving relative to the laser radar system. Another aspect of various embodiments of the invention may relate to a laser radar system that uses multiple laser radar sections to obtain multiple simultaneous measurements (or substantially so), whereby both range and range rate can be determined without various temporal effects introduced by systems employing single laser sections taking sequential measurements. In addition, other aspects of various embodiments of the invention may enable faster determination of the range and rate of the target, a more accurate determination of the range and rate of the target, and/or may provide other advantages.Type: GrantFiled: February 26, 2009Date of Patent: April 5, 2011Assignee: Digital Signal CorporationInventors: Richard Sebastian, Kendall Belsley
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Patent number: 7911623Abstract: Disclosed is a microelectromechanically tunable Fabry-Perot device and method of manufacturing tunable Fabry-Perot device and method of manufacturing. The F-P device comprises a first and second substrate which has partially reflective planar surfaces, and the partially reflective planar surfaces are separated by a predetermined separation distance and aligned to provide a F-P cavity, where one or more piezoelectric members are adapted to displace the first and second substrates when an electric field is applied.Type: GrantFiled: August 7, 2007Date of Patent: March 22, 2011Assignee: Xerox CorporationInventors: Pinyen Lin, Peter M. Gulvin, Yao Rong Wang, Lalit Keshav Mestha
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Patent number: 7907287Abstract: A positioning apparatus, which positions a stage, includes a measurement system that measures a position of the stage. The measurement system includes a plurality of measuring devices that are spaced apart from each other along a first direction and measure a position of the stage in a second direction. A switching unit switches between the measuring devices to measure the position of the stage when the stage moves in at least the first direction. A correction unit corrects, based on an acceleration of the stage, the value measured by the measurement system. When the switching unit switches between the plurality of measuring devices, the correction unit corrects, based on a value obtained by the correction, a value measured by a measuring device after the switching.Type: GrantFiled: October 11, 2007Date of Patent: March 15, 2011Assignee: Canon Kabushiki KaishaInventor: Hiroyuki Sekiguchi
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Patent number: 7903240Abstract: An optical sensing system and method are disclosed. The optical sensing system includes one or more bus waveguides. A first bus waveguide includes an input port that is in optical communication with a light source. The system further includes a microresonator optically coupled to the bus waveguides and an optical scattering center configured for alteration of a strength of optical coupling between the optical scattering center and the microresonator. In addition, the system includes a detector in optical communication one of the bus waveguides or the microresonator.Type: GrantFiled: December 1, 2006Date of Patent: March 8, 2011Assignee: 3M Innovative Properties CompanyInventors: Terry L. Smith, Yasha Yi, Barry J. Koch
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Patent number: 7898669Abstract: The present invention relates to absolute distance measurement method and system using an optical frequency generator. The absolute distance measurement method using the optical frequency generator includes (a) generating a plurality of different stabilized wavelengths by using the optical frequency generator; (b) obtaining an initial estimation value of a distance to be measured by using a frequency sweeping interferometer; (c) analyzing an uncertainty range of the obtained initial estimation value; (d) measuring excess fraction parts of the different wavelengths by analyzing interference signals for each of the wavelengths; (e) determining integer parts for each of the different wavelengths within the uncertainty range of the initial estimation value; and (f) measuring an absolute distance to be measured by using the excess fraction part and the integer parts for each of the different wavelengths.Type: GrantFiled: October 21, 2008Date of Patent: March 1, 2011Assignee: Korea Advanced Institute of Science and TechnologyInventors: Seung Woo Kim, Jonghan Jin, Young Jin Kim
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Patent number: 7894076Abstract: Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.Type: GrantFiled: February 14, 2008Date of Patent: February 22, 2011Assignee: QUALCOMM MEMS Technologies, Inc.Inventors: William J Cummings, Brian Gally
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Patent number: 7894072Abstract: A laser interferometer, such as a dual path Michelson interferometer, is used to generate fringe patterns resulting from one of a plurality of optical paths passing through a sample gas. An artificial neural network, such as, for example, a KASER neural network, is used to recognize patterns in the fringe interference patterns corresponding to known target gases.Type: GrantFiled: November 10, 2008Date of Patent: February 22, 2011Assignee: The United States of America as represented by the Secretary of the NavyInventor: Stuart H. Rubin
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Patent number: 7894075Abstract: The disclosure features multiple degree-of-freedom interferometers (e.g., non-dispersive interferometers) for monitoring linear and angular (e.g., pitch and/or yaw) displacements of a measurement object with compensation for variations in the optical properties of a gas in the interferometer measurement (and/or reference) beam paths. The disclosure also features interferometry systems that feature an array of interferometers (e.g., including one or more multiple degree-of-freedom interferometer), each configured to provide different information about variations in the optical properties of the gas in the system. Multiple degree-of-freedom interferometers are also referred to as multi-axis interferometers.Type: GrantFiled: December 11, 2007Date of Patent: February 22, 2011Assignee: Zygo CorporationInventor: Henry A. Hill
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Patent number: 7889355Abstract: A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.Type: GrantFiled: June 4, 2007Date of Patent: February 15, 2011Assignee: Zygo CorporationInventors: Xavier Colonna De Lega, Robert Stoner, Peter De Groot
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Patent number: 7880890Abstract: An interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a Micro-Electro-Mechanical Systems (MEMS) interferometer. The MEMS interferometer is further implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator.Type: GrantFiled: December 28, 2007Date of Patent: February 1, 2011Assignee: Block Engineering, LLCInventors: David Reyes, E. Robert Schildkraut, Jinhong Kim
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Patent number: 7876453Abstract: Techniques for ultrasonic determination of the interfacial relationship of multi-component systems are discussed. In implementations, a laser energy source may be used to excite a multi-component system including a first component and a second component at least in partial contact with the first component. Vibrations resulting from the excitation may be detected for correlation with a resonance pattern indicating if discontinuity exists at the interface of the first and second components.Type: GrantFiled: January 22, 2008Date of Patent: January 25, 2011Assignees: The Boeing Company, Battelle Energy Alliance, LLCInventors: Thomas K. Williams, Kenneth Telschow
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Patent number: 7872758Abstract: Determining linear modulator dynamics in an interferometric fiber-optic gyroscope may be accomplished by applying a stimulus at a point within the gyroscope, observing a response in an output of the gyroscope, and determining, from the observed response, the linear modulator dynamics.Type: GrantFiled: January 22, 2008Date of Patent: January 18, 2011Assignee: The Charles Stark Draper Laboratory, Inc.Inventors: Paul A. Ward, Michael Kishinevsky, Matthew Soucy, Stephen P. Smith, Farhad Zarinetchi
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Patent number: 7872756Abstract: A gas measuring apparatus includes: an infrared detecting section that receives an infrared ray from a measurement area and outputs infrared spectrum data relating to the infrared ray; a variation detecting section that detects, by using the infrared spectrum data, a variation in intensity of the infrared ray, which is caused in the infrared ray that radiates from the measurement area and which is caused by a measuring object gas in the measurement area; a converting section that converts the infrared spectrum data to radiance temperature spectrum data which represent wavelengths in an infrared region and radiance temperatures at each wavelength; a background temperature detecting section that detects, as background temperature of the measuring object gas, a maximum radiance temperature from among radiance temperatures represented by the radiance temperature spectrum data; a gas temperature detecting section that detects the temperature of the measuring object gas by using a radiance temperature in a wavelengType: GrantFiled: January 19, 2009Date of Patent: January 18, 2011Assignee: NEC CorporationInventor: Naoki Oda
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Patent number: 7869055Abstract: Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.Type: GrantFiled: August 20, 2007Date of Patent: January 11, 2011Assignee: QUALCOMM MEMS Technologies, Inc.Inventors: William Cummings, Brian Gally
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Patent number: 7864335Abstract: Deterioration of the resolution of tomographic images obtained by optical tomography measurement is prevented. Interference signals, which are obtained when a light beam L is emitted, are divided into a plurality of divided interference signals each having different wavelength bands. Spectral analysis is administered for each of the plurality of divided interference signals, to obtain a plurality of pieces of intermediate tomographic data. The plurality of pieces of intermediate tomographic data are employed to obtain tomographic data, a tomographic image is generated based on the tomographic data, then displayed.Type: GrantFiled: November 16, 2007Date of Patent: January 4, 2011Assignee: FUJIFILM CorporationInventors: Kensuke Terakawa, Wataru Ito
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Patent number: 7864326Abstract: A system and method includes a tunable light source and a gas cell configured to detect the presence of gases at terahertz frequencies. The light source is operable to emit a light signal at terahertz frequencies. The gas cell includes at least two high frequency mirrors adapted to reflect signals at terahertz frequencies. The gas cell is adapted to be tuned based on the frequency of the emitted light to obtain a Fabry-Perot resonance of the reflected light signal. A pair of detectors are operable to detect the original light signal and the light signal reflected through absorption paths in the gas cell. The system and method are operable to determine a presence and identity of a gas present in the gas cell.Type: GrantFiled: October 30, 2008Date of Patent: January 4, 2011Assignee: Honeywell International Inc.Inventors: James Allen Cox, Barrett E. Cole
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Patent number: 7859682Abstract: An optical interference apparatus for carrying out Fourier domain optical coherence tomography. Multiple beams are provided and respective interferograms are recorded simultaneously for a plurality of different focal depths within a substance to be examined. Combined images are derived from the interferograms for a plurality of different focal depths, whereby a single image may be constructed with an increased depth of field. The axial spacing of the foci is calculated to take into account the Rayleigh range of the focal waist in the substance to be examined.Type: GrantFiled: November 4, 2005Date of Patent: December 28, 2010Assignee: Michelson Diagnostics LimitedInventors: David Steven Smith, Simon Richard Hattersley, Andrew Gilkes
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Patent number: 7852483Abstract: Certain embodiments of the invention provide a light sensor comprising at least one interferometric element that absorbs light in at least one wavelength. The interferometric element comprises a first surface and a second surface substantially parallel to the first surface. The second surface is spaced a gap distance from the first surface in a direction substantially perpendicular to the first surface. The light wavelength absorbed is dependent on the gap distance. The interferometric element further comprises a temperature sensor. The temperature sensor is responsive to changes in temperature of at least a portion of the interferometric element due to absorption of light by the interferometric element.Type: GrantFiled: October 28, 2008Date of Patent: December 14, 2010Assignee: QUALCOMM MEMS Technologies, Inc.Inventor: Manish Kothari
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Patent number: 7852487Abstract: A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a, 4d). The interferometer is embodied such that a light beam (12) created by the light source (3) is split at least into a working beam (12a) and a reference beam (12b), with the working beam (12a) impinging the object (1) and the working beam (12a) is at least partially reflected by the object and interfered with the reference beam (12b) on the detector (4a, 4b). The signal processing unit (2) is connected to the detector (4a, 4b) and includes a vibrometer processing unit (2f), which detects the motion of the object (1) from the measuring signals of the detector (4a, 4d).Type: GrantFiled: February 29, 2008Date of Patent: December 14, 2010Assignee: Polytec GmbHInventors: Christian Rembe, Alexander Drabenstedt, Georg Siegmund
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Patent number: 7852490Abstract: An implantable product includes an optical cavity structure with first and second parts, each of which can operate as an optical cavity. The first part includes a container with at least one opening through which bodily fluid can transfer between the container's interior and exterior when the product is implanted in a body. The second part includes a container that is closed and contains a reference fluid. The implantable product can also include one or both of a light source component and a photosensing component. Photosensed quantities from the first part's output light can be adjusted based on photosensed quantities from the second part's output light. Both parts can have their light interface surfaces aligned so that they both receive input light from a light source component and both provide output light to a photosensing component.Type: GrantFiled: February 5, 2007Date of Patent: December 14, 2010Assignee: Palo Alto Research Center IncorporatedInventors: Peter Kiesel, Oliver Schmidt, Michael Bassler, Richard H. Bruce, Noble M. Johnson