Abstract: The invention relates to a system and a method for ascertaining a color recipe which produces a color product with a specified hue after an application onto a specified substrate using a specified application method. The method has the steps of: a) providing a database with a plurality of data sets, b) specifying a target application method, a target substrate, and a desired target hue by means of a user, c) searching the database using a computer program, and d) when at least one suitable database has been found in step c), displaying the information stored in the at least one data set, said information relating to the color recipe, wherein at least one of the data sets also comprises information on at least one reference hue, a reference application method, and a reference substrate.

Abstract: Embodiments include a method for retrieving atmospheric aerosol based on statistical segmentation. Firstly a multi-band remote sensing image including an apparent reflectance and an aerosol optical thickness look-up table corresponding to a retrieval band is obtained, then pixels are partitioned and screened according to apparent reflectance segments of a mid-infrared 2.1 micrometer band. After that the retained pixel sets are further partitioned and screened according to the apparent reflectance segments of the mid-infrared 1.6 micrometer band. Finally the obtained pixel sets are partitioned into two categories according to the pixel number, one category including pixels having more pixels, the other including those with less pixels. The category with more pixels is taken as the reference part for retrieval.

Abstract: An information processing apparatus includes an image obtaining unit configured to obtain an image, a first determining unit configured to determine a first image range to be used in making a determination related to inspection of an inspection target included in the image, based on a detection result of the inspection target from the image, and a second determining unit configured to determine a second image range to be used in recording an inspection result of the inspection target, the second image range being an image range indicating a wider range than a range indicated by the first image range.

Abstract: The present disclosure provides methods for identifying compounds that cause structural changes in tau protein monomer and oligomer conformation. The methods include the use of cells that include tau proteins labeled with one or more chromophores, and exposing the cells to a test compound. The method further includes detecting a change in fluorescence resonance energy transfer (FRET) between the chromophores.

Abstract: A device may receive a master data set for a first spectroscopic model; receive a target data set for a target population associated with the first spectroscopic model to update the first spectroscopic model; generate a training data set that includes the master data set and first data from the target data set; generate a validation data set that includes second data from the target data set and not the master data set; generate, using cross-validation and using the training data set and the validation data set, a second spectroscopic model that is an update of the first spectroscopic model; and provide the second spectroscopic model.

Abstract: A detector (110) for determining a position of at least one object is proposed.

Abstract: A system and method indicate capability for detecting methane leaks inside buildings. This approach provides the ability to detect methane behind high efficiency coated windows and can extract methane concentration (rather than concentration-path length product CL). Lock-in imaging technologies can facilitate lower laser transmitter power. A field deployable, hand held prototype sensor for use in remote sensing a appropriate standoff distances can support operational testing. Distance infrared imaging of methane is feasible. Fully characterized real time image of a methane cloud offers operational advantages in accuracy and safety as compared to current sensors.

Abstract: Apparatuses, systems, and methods for Raman spectroscopy are described. In certain implementations, a spectrometer is provided. The spectrometer may include a plurality of optical elements, comprising an entrance aperture, a collimating element, a volume phase holographic grating, a focusing element, and a detector array. The plurality of optical elements are configured to transfer the light beam from the entrance aperture to the detector array with a high transfer efficiency over a preselected spectral band.

Abstract: The present invention is enclosed in the area of machine learning, in particular machine learning for the analysis of High or Super-resolution spectroscopic data, which typically comprises analysis of highly complex samples/mixtures of substances and/or data with low resolution, for instance Laser-Induced Breakdown Spectroscopy (LIBS). It is an object of the present invention a method of computational self-learning for characterization of one or more constituents in a sample, from electromagnetic spectral information of such sample, which changes the paradigm associated with prior art methods, by using only sub-optical spectral information, i.e., obtaining the resolution of the spectral information and thereby be able to extract spectral lines—thus determining a spectral line position—from such spectral information, hence avoiding all the uncertainty associated with pixel based methods. It is also an object of the present invention a computational apparatus configured to implement such method.

Abstract: A LiDAR system includes a first optical lens, and one or more first optoelectronic packages spaced apart from the first optical lens along the optical axis of the first optical lens. Each respective first optoelectronic package includes a first plurality of optoelectronic components positioned on the respective first optoelectronic package such that a surface of each respective optoelectronic component lies substantially on the first surface of best focus. The LiDAR system further includes a second optical lens, and one or more second optoelectronic packages spaced apart from the second optical lens along the optical axis of the second optical lens. Each respective second optoelectronic package includes a second plurality of optoelectronic components positioned on the respective second optoelectronic package such that a surface of each respective optoelectronic component lies substantially on the second surface of best focus.

Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.

Abstract: Provided is a spectral imaging apparatus. The spectral imaging apparatus includes: an optical filter including a plurality of band filter units having different center wavelengths; a sensing device configured to receive light passing through the optical filter; an imaging lens array including a plurality of lens units which respectively correspond to the plurality of band filter units and each implement imaging on the sensing device; and a transparent substrate which is apart from the sensing device. At least one of the optical filter and the imaging lens array is provided on the transparent substrate.

Abstract: A method of spectroscopy, comprises: transmitting output radiation to a sample; collecting from the sample input radiation being indicative of interaction between the output radiation and the sample; modulating at least one of the output radiation and the input radiation, wherein at least one of the output radiation and the modulation is characterized by a scanned parameter; combining the input radiation, following the modulation, with a reference signal to provide a combined signal; processing the combined signal to construct a vector describing a dependence of a radiation property of the input radiation on the parameter; and at least partially identifying the sample or a change in comprises sample based on at least the vector.

Abstract: Disclosed are hyperspectral/multiple spectral imaging methods and devices. A method obtains first and second spectral image datasets of a region of interest (ROI). The first spectral image dataset is characterized by a first spectral range and the second spectral image dataset is characterized by a second spectral range. The method then performs a first spectral analysis on the first spectral image dataset and a second spectral analysis on the second spectral image dataset. Afterwards, the method determines one or more spectral signature(s) at a deeper layer of the ROI.

Abstract: A metrology target includes a first target structure set having one or more first target structures formed within at least one of a first working zone or a second working zone of a sample. The metrology target includes a second target structure set having one or more second target structures formed within at least one of the first working zone or the second working zone. The first working zone may include a center of symmetry that overlaps with a center of symmetry of the second working zone when an overlay error of one or more layers of the sample is not present. The metrology target may additionally include a third target structure set, a fourth target structure set, or a fifth target structure set.

Abstract: Disclosed herein are techniques for improving the light collection efficiency in coaxial LiDAR systems. A coaxial LiDAR system includes a photodetector, a first polarization beam splitter configured to receive a returned light beam including a first linear polarization component and a second linear polarization component and direct the different linear polarization components to different respective directions, a polarization beam combiner configured to transmit the first linear polarization component from the first polarization beam splitter to the photodetector, a non-reciprocal polarization rotator configured to transmit the second linear polarization component from the first polarization beam splitter, and a second polarization beam splitter configured to reflect the second linear polarization component from the non-reciprocal polarization rotator towards the polarization beam combiner.

Abstract: An embodiment of a system for measuring trace gas concentration is described that comprises a laser absorption spectrometer configured to detect an absorbance measure from a trace gas, as well as a temperature value and a pressure value that correspond to an environment in a gas cell; and a computer having executable code stored thereon configured to perform a method comprising: receiving the absorbance value, the temperature value, and the pressure value; defining a fitting range associated with the trace gas; applying a curve fitting model in the fitting range to the absorbance value using the temperature value and the pressure value as model parameters; and producing a concentration measure of the trace gas.

Abstract: A system for inspecting and validating processes performed on a continuous web of fabric in an automated apparel manufacturing environment. The continuous web of fabric can move in a step wise fashion across a work area where tooling can perform one or more processes on the continuous web of fabric. At least one projector is provided to display an image onto the continuous web of fabric the image including a first image related to an article to be manufactured and a second image related to a reference grid. The continuous web of fabric and the first and second images are viewed by a camera, and data related to the viewed first and second images and the continuous web of fabric can be sent to a computer implemented control center which can analyze the data to determine whether a deviation or error exists regarding the manufacturing process.

Abstract: A sensor arrangement includes a reaction subassembly having a housing and a detector subassembly. The housing is a layered component arrangement encompassing a luminophore-containing reaction laminate excitable, by irradiation with a first electromagnetic radiation of a first wavelength, to emit a second electromagnetic radiation of a second wavelength different from the first wavelength; and a temperature-detection laminate emitting an infrared radiation. The housing includes an opening for introducing a fluid, a reaction window and a temperature-sensing window. The reaction window transmits the first and second electromagnetic radiation, and the temperature-sensing window is penetrable by infrared radiation.

Abstract: A thickness estimation method may include: obtaining a test spectrum image; obtaining test spectrum data; measuring a thickness of a test layer formed on the test substrate at the plurality of positions; generating a regression analysis model using a correlation between the thickness of the test layer and the test spectrum data; obtaining a spectrum image; and estimating a thickness of a target layer over the entire area of the semiconductor substrate by applying the spectrum image to the regression analysis model. The thickness corresponding to the entire area of the semiconductor substrate that is being transferred is estimated using the thickness estimation method according to an exemplary embodiment in the present disclosure, such that whether or not processing is normally performed may be examined without requiring a separate time. In addition, an examination result may be feedbacked to processing equipment to improve production yield.