Abstract: A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.

Abstract: According to one embodiment, an analysis package, including a board, an analysis chip provided on the board, the chip including a detector for detecting a particle, a flow channel of a sample liquid, and a liquid receiver of the sample liquid, a first mold layer provided on the analysis chip, the first mold layer including an opening above the liquid receiver, and a second mold layer provided on the board and the first mold layer, the second mold layer including an opening above the opening of the first mold layer, wherein the respective openings of the first and second mold layers are connected above the liquid receiver to allow the sample liquid to be introduced into the liquid receiver from outside.

Abstract: The present disclosure provides an organic light-emitting diode (OLED) display apparatus, including a plurality of subpixels, each of which includes an anode, a cathode and a light-emitting layer. The OLED display apparatus further includes at least one photovoltaic conversion module arranged in correspondence with the subpixel, and configured to receive an optical signal from the light-emitting layer of the corresponding subpixel and convert the received optical signal into an electric signal. A testing terminal is extracted from the photovoltaic conversion module and configured to acquire the electric signal converted by the photovoltaic conversion module.

Abstract: According to one embodiment, an analysis package including an analysis chip provided on a main surface of a semiconductor substrate, the chip including a flow channel, both ends of which are open at peripheral parts of the substrate, and a microaperture which is provided in a middle of the flow channel and which allows a particle to pass therethrough, a package board on which the chip is mounted, liquid receivers provided on the package board, the liquid receivers being connected to openings, and electrodes, at least parts of which are provided on parts of bottom surfaces of the liquid receivers, the electrodes being provided at positions corresponding to an upstream side and a downstream side of the microaperture.

Abstract: An input device comprises a first plurality of sensor electrodes, a second plurality of sensor electrodes, and a processing system. The processing system comprises a first integrated circuit, a second integrated circuit, and a central controller. The first integrated circuit is coupled to the first plurality of sensor electrodes and configured to receive first resulting signals therewith. The second integrated circuit is coupled to the second plurality of sensor electrodes and configured to receive second resulting signals therewith. The central controller is communicatively coupled to the first and second integrated circuits. The central controller is configured to receive the first resulting signals from the first integrated circuit and the second resulting signals from the second integrated circuit and is configured to determine positional information from the first resulting signals and the second resulting signals and to communicate the positional information to a host processor.

Abstract: A system for determining the efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having an array of pixels that include OLEDs. The system determines the relationship between changes in an electrical operating parameter of the OLEDs and the efficiency degradation of said OLEDs, for at least one stress condition; measures a change in the electrical operating parameter of the OLEDs; determines the stress condition of at least one pixel or group of pixels in the semiconductor device; and uses the determined relationship and the determined stress condition to determine the efficiency degradation of the OLEDs corresponding to the measured change in the electrical operating parameter of the OLEDs.

Abstract: An apparatus includes a voltage source, voltage measurement means and a processing means, and connects to a line to apply and monitor a voltage between the line and earth. The processing means controls the voltage source to transmit and receive communications from the line, via the voltage measurement means. The apparatus also has a first and second current measurement means. The voltage source is connectable to a wire under test to inject a predetermined test voltage on the wire. The wire extends in a first and second direction from the test location. The first current measurement means measures the leakage current from the voltage source flowing along the wire in a first direction, and the second current measurement means determines the leakage current along the wire in a second direction, and the processing means uses the current flows measured by both current measurement means to determine wire insulation properties.

Abstract: A bearing comprising a static component, a liner, a wear indicating sensor and a movable conductive component that will wear the liner, a) where the wear indicating sensor is first affixed to the static component, and said sensor is comprised of a first insulating layer in contact with the static component and a second conductive layer, configured such that the metallic layer and the static component are not in electrical contact, and b) where the liner is positioned between sensor and the moving component, where the liner comprises an insulating layer and a conductive layer, configured such that the insulating layer faces the moving metallic component, and the conductive layer faces the sensor, such that the conductive layer is in electrical contact with the conductive layer of the sensor.

Abstract: A calibration module with a substrate provides at least one high-frequency terminal integrated on the substrate which can be connected in each case with an allocated switching element integrated on the substrate to one of several allocated calibration standards or to an allocated power detector. The calibration standards and the power detector are integrated on the substrate.

Abstract: A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature.

Abstract: An apparatus for testing a quality of an electrical connection of a test part is disclosed. The apparatus includes a first fixture holding the test part to one side of the electrical connection, a second fixture holding the test part to a second side of the electrical connection, wherein the first fixture and the second fixture apply a twist to the test part, and a electrical test module configured to test an electrical resistance of the electrical connection when the twist is applied.

Abstract: A system and method for monitoring a first wire rope and a second wire rope is provided. The first and second wire ropes each include a contact portion that contacts a sheave, a first end portion, and a monitored portion that extends between the contact portion and the first end portion. The sheave electrically connects the contact portions of the first and second wire ropes. The system includes a controller that is electrically connected to each of the first and second wire ropes to form a circuit with the monitored portions of the first and second wire ropes. The controller selectively applies a signal to the monitored portions of the first and second wire ropes and determines an electrical characteristic thereof. The controller uses the determined electrical characteristic to determine a condition of the first and second wire ropes.

Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.

Abstract: A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.

Abstract: An ion generating device includes a controller, positive and negative ion generating circuits, an airflow generator, and a detecting element. The controller is preinstalled with a constant of proportionality, controls the positive and the negative ion generating circuits, and the airflow generator directs the ions to a destination. The detecting element detects the balanced voltage of the positive and negative ions at the destination, and responds with the detecting result to the controller. The controller increases or decreases the ion numbers. The variation of the ion numbers is x, and the balanced voltage at the destination is y. The controller compares the function of x and y with the constant of proportionality to determine whether they are similar. If the comparison result is similar, then the electrostatic dissipation capability of the ion generating device is normal.

Abstract: A system and method sequentially measure phases of selected comb teeth of a comb signal using a local oscillator (LO) signal whose frequency and phase are changed for each sequential measurement, and adjust the measured phases to account for the change of phase in the LO signal from measurement of one selected comb tooth to the next to ascertain reference phase differences between the selected comb teeth. The measured phases of the selected comb teeth are adjusted by applying a phase offset determined from a first phase and a second phase of a pilot tone which are measured using the LO signal, respectively, before and after the frequency and phase of the LO signal change from measurement of one comb tooth to the next. The frequency of the pilot tone is maintained to be substantially the same when measuring the first phase and the second phase of the pilot tone.

Abstract: Systems and methods for detecting a magnetic target include a plurality of magnetic field sensing elements arranged about a central point. Each one of the plurality of magnetic field sensing elements is configured to measure a magnetic field produced by a magnetic target and provide a respective output signal that represents a respective measurement of a strength of the magnetic field. A processor circuit is coupled to receive the output signal from each one of the plurality of magnetic field sensing elements and determine a barycenter of the measurements of the magnetic field based on a position of the magnetic field sensing elements.

Abstract: An electric field sensor includes sense and reference cells. The sense cell produces a resistance that varies relative to an intensity of an electric field, and the reference cell produces a resistance that is invariable relative to the intensity of the electric field. An output signal indicative of the intensity of the electric field is determined using the difference between the resistances. A system includes an electric field source that outputs a digital test program as an electric field signal. The system further includes the electric field sensor formed with IC dies on a wafer. The electric field sensor receives the electric field signal. The received electric field signal is converted to the test program, and the test program is stored in memory on the wafer. The electric field source does not physically contact the dies, but can flood an entire surface of the wafer with the electric field signal.

Abstract: A capacitive sensor may include a transmit electrode and a receive electrode capacitively coupled with the transmit electrode. A capacitance sensing circuit senses a capacitance between the transmit and receive electrodes by applying a signal to the transmit electrode and rectifying a current waveform induced at the receive electrode. A compensation circuit reduces the effect of a mutual and parasitic capacitances of the transmit and receive electrode pair by adding a compensation current to the rectified current.

Abstract: Disclosed herein is an electrostatic capacitance input device including: an input region of a substrate, in which a plurality of input position detection electrodes are provided; a plurality of wires that are electrically connected to the plurality of input position detection electrodes and extend outside the input region of the substrate; and a shield electrode that overlaps the wires on the input operation side.