Abstract: A forced air heat exhaust type of burn-in test apparatus for packages: A first air supply duct provides air to the burn-in chamber and a second air supply duct provides air to supply tubes that direst air into the test sockets that hold the packages. The test sockets have a structure that allows air ventilation of the conductive balls. Accordingly, the apparatus can control the temperature around the packages as well as the temperature in the burn-in chamber, thus preventing conductive ball-melting.
Type:
Grant
Filed:
December 28, 2004
Date of Patent:
August 1, 2006
Assignee:
Samsung Electronics Co., Ltd.
Inventors:
Byung-Jun Min, Woo-Jin Kim, Jeong-Ho Bang, Hyun-Seop Shim, Hyun-Geun Iy, Jae-Il Lee