Abstract: An object detection apparatus is provided for detecting both stationary objects and moving objects accurately from an image captured from a moving mobile unit. The object detection apparatus of the present invention applies Gabor filter to two or more input images captured by an imaging device such as CCD camera mounted on a mobile unit, and calculates optical flow of local areas in the input images. Then the object detection apparatus closely removes optical flow produced by motion of the mobile unit by estimating optical flow produced from background of the input images. In other words, the object detection apparatus clarifies the area where object is not present (“ground”) in the input images. By removing such “ground” part, the area where objects seems to be present (“feature”) is extracted from the input images. Finally, the object detection apparatus determines whether objects are present or not using flow information of the extracted “feature” part.

Abstract: Displaying a writing guide for a free-form document editor by detecting electronic ink, classifying the detected ink as corresponding to handwriting or a drawing, and displaying a handwriting guide or a drawing guide in response to classifying the detected ink as handwriting or a drawing, respectively. The writing guides can provide feedback regarding the classification of the detected ink and can be resized as additional ink is detected. The handwriting guide can comprise a writing area, writing guide portion, bullet guide, indent marker, character notches, gesture guide, or sacrificial guide to create meaningful structure within an outline object of an electronic document.

Abstract: An automatic accurate alignment method for a wafer cutting apparatus includes: (a) placing a wafer on a platform, and moving the platform and a camera unit to initial positions; (b) matching the electrical output of the camera unit with a key pattern to find a plurality of adjacent working patterns, and recording center point coordinates of the working patterns; (c) calculating at least one distance value associated with the center point coordinates of a corresponding adjacent pair of the working patterns; (d) determining whether any one calculated distance value complies with a key pattern dimension; and (e) upon determination that there is one calculated distance value that complies with the key pattern dimension, rotating the platform so that an imaginary line interconnecting the center point coordinates that are associated with the determined distance value is disposed parallel to a predetermined wafer cutting direction.

Abstract: A method for detecting edges in an image is disclosed along with corresponding apparatus and system for accurately extracting edges in the image. The edge detecting apparatus comprises a reading means, an image gray-level statistical means, an image classification means, a segmenting threshold generating means, an edge criterion determining means, and an image edge extracting means. The present invention realizes a reliable and accurate method for detecting edges in an image so as to extract edges in various file images.

Abstract: The invention provides image layout evaluation method to optimize the layout of an image. The invention can include a laid-out-image input device for inputting laid-out combined images, an induction-field-in-vision calculation device for calculating the induction field in vision of the laid-out combined images that are input to the image-laid-out input device and obtaining an equipotential line from the calculated induction field in vision, and a layout-evaluation device for evaluating the layout quality based on the equipotential line obtained by the induction-field-in-vision calculation. The layout-evaluations device can further include a complexity calculation device, and thereby, calculates the complexity of the equipotential line obtained by the induction-field-in-vision calculation device, evaluates the layout quality based on the complexity, and determines which layout is most suitable.

Abstract: A method of providing composition evaluation of an image includes analyzing a composed image in accordance with one or more predefined composition rules and providing a report or warning signal if one or more of those compositional rules have been contravened. The analysis includes identifying regions of compositional significance within the image and applying the compositional rules to those regions. The compositional rules may include well known photographic composition rules such as the “rule of thirds”, ensuring that there are no large expanses of foreground or background with little or no regions of significance within them, and ensuring that the edge of the composed image does not bisect any regions of significance.

Abstract: Techniques that use the design databases used in each of the expose/etch steps during construction of phase shift masks are described. A model or reference image is rendered, accounting for systematic variations, from the design databases to represent what a layer of the PSM should look like after processing. The reference image is compared to an optically acquired image of a specimen phase shift mask to find defects. The technique of the present invention can be used to inspect EAPSM, APSM and tritone masks. The technique inspects all layers in one pass and is therefore more efficient.

Abstract: A circuit for extracting a connected component feature from an input image includes an input stage, a counting stage, a bit-preparing stage, and a bit-output stage. The input stage receives a bit pattern and detects a connected component in the bit pattern. The counting stage counts the number of connected components detected in the input stage and generates a current representing that number. The bit-preparing stage generates more than one current as a basis for information including more than one bit, based on the current generated in the counting stage, so that the information uniquely represents the number of connected components. The bit-output stage converts the currents generated in the bit-preparing stage into a digital output corresponding to the information.

Abstract: An image measuring apparatus includes an approximate position measuring portion for approximately obtaining, from a pair of images of a subject for measurement in different directions, positional information of the subject for measurement in each of the images. A data setting portion, having one image of the pair of images set as a reference image and the other image as a searched image, sets up, in accordance with the positional information obtained in the approximate position measuring portion, reference data blocks in the reference image and sets up searched areas in the searched image and searched data blocks in the searched area. A correspondence determining portion obtains correspondence between the searched data block set up in the searched area and the reference data block.

Abstract: An image processing of an object to be detected in bonding system for manufacturing, for instance, semiconductor devices including a step of calculation of a difference value between a reference image inputted beforehand and a rotated image obtained by rotating the reference image for a plurality of reference points within the reference image, a step of mask pattern production based upon the difference values for the plurality of reference points, and a step of position detection for a position of an object of detection by pattern matching by way of using an image of the object of detection obtained by imaging the object of detection, the reference image and the mask pattern.