Patents Examined by Joseph J Yamamoto
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Patent number: 8942943Abstract: Embodiments of the present disclosure provide methods of controlling an ion detector to minimize false peaks when utilizing extended dynamic range techniques. In one exemplary example, methods of controlling an ion detector are provided, comprising the steps of: determining an electronic baseline signal of the ion detector; receiving one or more ion input signals at the ion detector; comparing the ion input signal to the electronic baseline signal; and multiplying the ion input signal by a selected compensation factor when the ion input signal exceeds the electronic baseline signal.Type: GrantFiled: July 15, 2011Date of Patent: January 27, 2015Assignee: Bruker Daltonics, Inc.Inventor: Shankar Telasang
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Patent number: 8880377Abstract: An apparatus, a method, and a computer program are disclosed. The apparatus comprises a processor. The processor is configured to obtain instantaneous acceleration values representing lower limb motion of a user, to form an effective acceleration value from the instantaneous acceleration values over a plurality of steps of the user, and to determine a motion parameter representing overall motion of the user by means of the effective acceleration value.Type: GrantFiled: December 22, 2008Date of Patent: November 4, 2014Assignee: Polar Electro OyInventor: Mika Niemimäki
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Patent number: 8863587Abstract: A method for determining a first flow rate of a gas phase and a second flow rate of at least one liquid phase present in a polyphasic fluid circulating in a conduit is presented. The method essentially comprises circulating the polyphasic fluid through the neck of a venturi delimited by the conduit. The method further comprises estimating the first flow rate and the second flow rate by using a measured pressure difference of the fluid through the neck and a property representative of the relative surface occupied by the gas phase relative to a total surface over a cross-section of the neck. The step of estimating the first flow rate and the second flow rate further comprises (a1) calculating an amount representative of the liquid phase present in the gas rich core relative to the total amount of liquid phase in the neck and calculating the first and second flow rate as a function of the amount representative of the liquid phase present in the core calculated during step (a1).Type: GrantFiled: September 24, 2009Date of Patent: October 21, 2014Assignee: Geoservices EquipementsInventor: Sébastíen Cadalen
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Patent number: 8868364Abstract: In one embodiment, a measuring device may comprise two oscillators. The first oscillator may generate a local reference signal in a frequency detector to detect a fundamental frequency of the alternating current (AC). The second oscillator may generate two substantially mutually orthogonal sinusoid signals having the selected frequency. The measuring device further may comprise a first group of multipliers that mixes the two sinusoid signals with a current and a voltage data signal of the AC respectively, a group of low-pass filters for removing high frequency components from the multiplication products, a second group of multipliers for mixing the filtered multiplication products respectively, and a plurality of adders each to sum together a pair of multiplication products of the second group of multipliers.Type: GrantFiled: April 29, 2011Date of Patent: October 21, 2014Assignee: Analog Devices, Inc.Inventor: Gabriel Antonesei
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Patent number: 8855969Abstract: Whether validation of at least one of a plurality of previously validated processors on a first system produced data usable for computing a validation start frequency of an unvalidated processor on a second system is determined. If validation of at least one of the plurality of previously validated processors on the first system produced data usable for validating the unvalidated processor, a validation start frequency associated with the unvalidated processor can be computed based, at least in part, on system parametric data associated with a subset of the plurality of previously validated processors that were validated on the first system. Otherwise, the validation start frequency associated with the unvalidated processor is computed based, at least in part, on tester parametric data associated with the unvalidated processor. Validation of the guard band frequency for the unvalidated processor is initiated at the validation start frequency.Type: GrantFiled: June 27, 2011Date of Patent: October 7, 2014Assignee: International Business Machines CorporationInventors: Robert W. Berry, Jr., Diyanesh B. Chinnakkonda, Prasanna Jayaraman, Tony E. Sawan
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Patent number: 8843342Abstract: A continuous scanning method employs one or more moveable sensors and one or more reference sensors deployed in the environment around a test subject. Each sensor is configured to sense an attribute of the test subject (e.g., sound energy, infrared energy, etc.) while continuously moving along a path and recording the sensed attribute, the position, and the orientation of each of the moveable sensors and each of the reference sensors. The system then constructs a set of transfer functions corresponding to points in space between the moveable sensors, wherein each of the transfer functions relates the test data of the moveable sensors to the test data of the reference sensors. In this way, a graphical representation of the attribute in the vicinity of test subject can be produced.Type: GrantFiled: December 30, 2010Date of Patent: September 23, 2014Assignee: ATA Engineering, Inc.Inventors: Havard I. Vold, Paul G. Bremner, Parthiv N. Shah
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Patent number: 8831901Abstract: Methods, systems and apparatus are provided for ranking tests of interest. A set of failure modes of interest and a set of tests of interest are determined. A differentiation factor is then computed for each of the tests of interest, and each of the tests of interest can then be ranked based on their respective differentiation factors.Type: GrantFiled: June 15, 2011Date of Patent: September 9, 2014Assignee: Honeywell International Inc.Inventors: Kelly Jean Lechtenberg, Qingqiu Ginger Shao
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Patent number: 8645081Abstract: A light absorption examining device includes a laser light source that emits the pulse laser beam, a measuring unit that retains the measuring object and irradiates the measuring object with the pulse laser beam, a light receiving unit that receives the pulse laser beam transmitted through the measuring object and outputs a light receiving signal, a pulse generator that produces a single rectangular pulse at a time when a signal level of the light receiving signal output from the light receiving unit intersects a set threshold, a laser driver that supplies the produced rectangular pulse to the laser light source to emit the pulse laser beam, and a control/processing unit that determines an accumulated delay time and examines absorption of the pulse laser beam by the measuring object using the determined accumulated delay time, the accumulated delay time representing a delay in a production timing of the rectangular pulse.Type: GrantFiled: July 21, 2009Date of Patent: February 4, 2014Assignee: Mitsui Engineering & Shipbuilding Co., Ltd.Inventor: Noriaki Kimura
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Patent number: 8626470Abstract: The present invention relates to a reversible permeability measuring device for measuring magnetic characteristics and magnetic flux change in a specimen, as one of a plurality of non-destructive methods for evaluating mechanical properties. The reversible permeability measuring device of the present invention directly measures a magnetic field change induced at the surface of the specimen through the use of a magnetic potentiometer and a flux meter, thereby accurately evaluating the deterioration of materials.Type: GrantFiled: July 1, 2009Date of Patent: January 7, 2014Assignees: Korea Research Institute of Standards and Science, Chung-Ang University Industry Academy Cooperation FoundationInventors: Kwon Sang Ryu, Soo Young Park, Jong Seo Park, In Hyun Cheong, Kee-Bong Yoon
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Patent number: 8543357Abstract: An apparatus and method for characterization of a directed beam of electromagnetic radiation is provided. An exemplary embodiment of the invention can include an apparatus and measuring technique method which uses a model for blackbody radiation that includes consideration all the degrees of freedom due to translation, vibration, and rotation of molecules or atoms that make up the absorber and a heat transfer term which averages the behavior of all the atoms of the material as a function of temperature. This apparatus and method provides an advantage of increased accuracy, substantial reductions of time required for processing, simplification of measuring processes, and reduction required equipment.Type: GrantFiled: December 31, 2010Date of Patent: September 24, 2013Assignee: The United States of America as represented by the Secretary of the NavyInventors: Peter Marandos, Grady Patterson, Kenneth Leeson