Patents Examined by Keesee LaCharles P.
  • Patent number: 5182617
    Abstract: A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.
    Type: Grant
    Filed: June 29, 1990
    Date of Patent: January 26, 1993
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshito Yoneyama, Yoshiyuki Toge, Naoki Yuguchi
  • Patent number: 5030001
    Abstract: The invention relates to a method for testing and further processing eggs. According to the invention the eggs upon being supplied are first tested automatically for such major damage as open breaks and/or such dirt as blood stains. Further, each egg is scanned with a beam of light directed at the egg shell and the size of the aperture in the shell or any dirt is measured by a multiple transducer, viz. by counting the number of bright and dark pixels, respectively, and thus establishing the size of the damage or dirt, whereafter through comparison with set values it is automatically determined in what category of damage or contamination the egg in question is to be classified. The invention also relates to apparatus for carrying out this method.
    Type: Grant
    Filed: May 17, 1990
    Date of Patent: July 9, 1991
    Assignee: Staalkat B.V.
    Inventor: Johan E. vande Vis