Patents Examined by Layla Lauchman
  • Patent number: 8520204
    Abstract: A Dyson imaging spectrometer includes an entry port extending in a direction X, an exit port, a diffraction grating including a set of lines on a concave support, an optical system including a lens, the lens including a plane first face and a convex second face, the convex face of the lens and the concave face of the diffraction grating being concentric, the optical system being adapted to receive an incident light beam coming from the entry port and to direct it toward the diffraction grating, to receive a beam diffracted by the diffraction grating, and to form a spectral image of the diffracted beam in a plane of the exit port, the spectral image being adapted to be spatially resolved in an extension direction X? of the image of the entry port. The diffraction grating includes a set of non-parallel and non-equidistant lines and/or the support of diffraction grating is aspherical in order to form an image of the entry port in the exit plane of improved image quality and of very low distortion.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: August 27, 2013
    Assignee: Horiba Jobin Yvon SAS
    Inventor: Frederic Desserouer
  • Patent number: 8514384
    Abstract: Provided is an alignment method for an image reading apparatus including: a light source unit illuminating an original on an original table; a photoelectric conversion element for converting an optical image into an electric signal; and an imaging optical system for imaging, onto the photoelectric conversion element, a light beam from the illuminated original. The imaging optical system includes: a first optical element, arranged inside a first lens barrel, and having an optical surface that is rotationally symmetric about an optical axis; and a second optical element, arranged on an optical path between the first lens barrel and the photoelectric conversion element, and having an optical surface rotationally asymmetric about the optical axis. The alignment method includes aligning at least one of an attaching angle and an attaching position of the second optical element in a sub scanning direction relative to the first lens barrel.
    Type: Grant
    Filed: May 16, 2011
    Date of Patent: August 20, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takayuki Sugiyama
  • Patent number: 8508730
    Abstract: System(s), apparatus(es), and method(s) are provided for control of quality of light emitted from a group of solid-state light (SSL) sources that are part of an illumination fixture. The control is based at least in part on regulation of the spectral power distribution (SPD) of the light to match a SPD of a reference light source. A spectroscopic analyzer collects electromagnetic (EM) radiation emitted from the group of SSL sources and EM radiation substantially emitted from the reference light source. A first controller analyzes spectroscopic data related to SPDs of the group of SSL sources and the reference light source and, based on the analysis issues a configuration of the group of SSL sources. Implementation of the configuration causes the group of SSL sources to emit EM radiation with a SPD that nearly matches the SPD of the EM radiation substantially emitted from the reference light source.
    Type: Grant
    Filed: January 28, 2011
    Date of Patent: August 13, 2013
    Assignee: Atmel Corporation
    Inventors: Kevin Hempson, Dilip Sangam
  • Patent number: 8502977
    Abstract: A spectroscopic system may include: a spectroscopic scatterometer; an angular-resolved spectrometer; and a fiber bundle having a two-dimensional input surface and a one-dimensional output surface.
    Type: Grant
    Filed: June 1, 2010
    Date of Patent: August 6, 2013
    Assignee: KLA-Tencor Corporation
    Inventor: Ivan Maleev
  • Patent number: 8502972
    Abstract: A method for sensing a target object using optical mode excitations in microresonators, comprises: preparing at least one cluster including at least two microresonators; obtaining some first spectra of the cluster; adsorbing the target object on a surface of the cluster; obtaining some second spectra of the cluster; and sensing the target object by comparing a lineshape of the first spectra with a lineshape of the second spectra.
    Type: Grant
    Filed: December 25, 2008
    Date of Patent: August 6, 2013
    Assignee: Fujirebio Inc.
    Inventors: Michael Himmelhaus, Alexandre Francois
  • Patent number: 8497988
    Abstract: A spectral distribution measuring device includes an illumination unit configured to illuminate white light to a surface of an object being measured; a slit array having a plurality of slits formed in alignment at equal intervals; a linear image sensor including a light receiving face having a plurality of rectangular pixels adjacently arranged in alignment and a plurality of spectral light-irradiated areas divided in each predetermined number of neighboring pixels; a plurality of areas being measured which is set on the surface of the object being measured, and reflects the light irradiated by the illumination unit to the plurality of slits; and a diffraction unit configured to diffract and disperse reflection light which is reflected from the areas being measured and has passed through each slit, the diffraction unit being disposed such that a direction where a diffraction image expands is inclined at an angle to a direction where the light receiving face expands.
    Type: Grant
    Filed: September 10, 2010
    Date of Patent: July 30, 2013
    Assignee: Ricoh Company, Ltd.
    Inventors: Kohei Shimbo, Manabu Seo, Naohiro Kamijo
  • Patent number: 8497987
    Abstract: An optical device unit includes: an optical device that has an electrical conductor and that is capable of enhancing Raman scattering light generated by receiving light from a light source; and a guide unit that guides a gaseous sample to the optical device. The guide unit has a first fluid path for rotating the gaseous sample in an area facing the optical device.
    Type: Grant
    Filed: September 7, 2011
    Date of Patent: July 30, 2013
    Assignee: Seiko Epson Corporation
    Inventors: Yusuke Sakagami, Jun Amako
  • Patent number: 8493560
    Abstract: A sensor for determining the presence or concentration of a target entity in a medium is described, and includes (a) an optical waveguide; (b) a microresonator optically coupled with the optical waveguide such that light within the optical waveguide induces a resonant mode within the microresonator at an equator region (or a mode volume); and (c) at least one plasmonic nanoparticle adsorbed onto a surface area of the microresonator within the equator region (or the mode volume) such that light inducing a resonant mode within the microresonator also causes a plasmonic resonance in the at least one plasmonic nanoparticle. Detection methods for using such sensors are also described. Finally, methods, involving the use of carousel forces, for fabricating such sensors are also described.
    Type: Grant
    Filed: August 9, 2011
    Date of Patent: July 23, 2013
    Assignee: Polytechnic Institute of New York University
    Inventors: Siyka Shopova, Stephen Arnold, Raaj Haresh Rajmangal
  • Patent number: 8482730
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: August 24, 2012
    Date of Patent: July 9, 2013
    Assignee: Applied Biosystems, LLC
    Inventors: Austin Tomaney, Mark Oldham
  • Patent number: 8482724
    Abstract: Brightness factors associated with shade fabric may be utilized when shading a building. A brightness factor may incorporate an openness factor, a visible light reflectance, a diffusion factor, a color, or other characteristics of the shade fabric. The brightness factor may be utilized when selecting a particular shade fabric for a room, building or other location. Additionally, the brightness factor may be utilized by an automated shade control system. The shade fabric selection may affect the building envelope by facilitating the optimization of daylighting, reduction of artificial electric lighting needs, minimization of glare conditions, and reduction of thermal load.
    Type: Grant
    Filed: November 26, 2012
    Date of Patent: July 9, 2013
    Assignee: MechoShade Systems, Inc.
    Inventors: Joel Berman, Jan Berman, Muthukumar Ramalingam
  • Patent number: 8477309
    Abstract: An inspection system and a method. The method may include: illuminating the object with impinging light of a first polarization; performing a polarization based filtering of (a) multiple-reflected light signals, each multiple-reflected light signal being reflected from at least two different bevel side surfaces of the object, and (b) additional light signals, each additional light signal being reflected from a single element of the object, such as to suppress the multiple-reflected light signals, and to provide polarization based filtered light signals; and detecting the polarization based filtered light signals.
    Type: Grant
    Filed: August 4, 2011
    Date of Patent: July 2, 2013
    Assignee: Camtek Ltd.
    Inventor: Zehava Ben-Ezer
  • Patent number: 8472012
    Abstract: An apparatus measuring optical characteristics including position detection is disclosed. A processor is coupled to a display. A first optical sensor makes a first measurement, and a second optical sensor makes a second measurement. A source of illumination and the first optical sensor determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object. A position of the apparatus with respect to an object and an optical property of light received by the apparatus are determined. A transparent member with a thickness less than the minimal distance may provide illumination external to the apparatus and receive light from external to the apparatus.
    Type: Grant
    Filed: August 28, 2012
    Date of Patent: June 25, 2013
    Assignee: JJL Technologies LLC
    Inventors: Wayne D. Jung, Russell W. Jung, Alan R. Loudermilk
  • Patent number: 8467060
    Abstract: A test apparatus comprising a self illuminated light source and second moveable element having spectrophotometrically neutral gray and color patches of predetermined hues and saturations. A digital software file provides identical spectrophotometrically neutral grayscale and color data which, when reproduced on a monitor or projection system, should match the grayscale and test colors provided by the apparatus. When the apparatus is placed in front of the monitor image or projected image, the neutral grays and color patches reproduced on the monitor image or projected image are compared against the image of the apparatus.
    Type: Grant
    Filed: March 24, 2010
    Date of Patent: June 18, 2013
    Inventor: Ferrand D. E. Corley
  • Patent number: 8467038
    Abstract: A method for measuring optical properties of an optically variable marking applied on an object, the method including the steps of illuminating the optically variable marking so as to form a first light reflected by the marking at a first view angle and a second light reflected by the marking at a second view angle, the first and second lights having different spectral compositions as a result of the optically variable marking, refracting the second reflected light through a optical unit so as to redirect the second reflected light toward an optical sensor, capturing the first light and the second refracted light with the optical sensor simultaneously; and determining optical properties of the optical variable marking based on the captured first and second lights.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: June 18, 2013
    Assignee: SICPA Holding SA
    Inventors: Eric Decoux, Xavier Schwab
  • Patent number: 8462341
    Abstract: A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: June 11, 2013
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ping He, Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
  • Patent number: 8462321
    Abstract: The present disclosure is directed towards embodiments of systems and methods for discriminating (e.g., masking out) scale bands that are determined to be not of interest from a scalogram derived from a continuous wavelet transform of a signal. Techniques for determining whether a scale band is not of interest include, for example, determining whether a scale band's amplitude is being modulated by one or more other bands in the scalogram. Another technique involves determining whether a scale band is located between two other bands and has energy less than that of its neighboring bands. Another technique involves determining whether a scale band is located at about half the scale of another, more dominant (i.e., higher energy) band.
    Type: Grant
    Filed: October 15, 2012
    Date of Patent: June 11, 2013
    Assignee: Nellcor Puritan Bennet Ireland
    Inventors: Paul Stanley Addison, James Nicholas Watson, David Clifton
  • Patent number: 8462337
    Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ?0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ?, ? regarding stray light in the reference measurement, an analysis value ? of the luminescence quantum yield with the effect of stray light reduced by ?=??0+?.
    Type: Grant
    Filed: September 8, 2009
    Date of Patent: June 11, 2013
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Motoyuki Watanabe, Kazuya Iguchi, Kengo Suzuki
  • Patent number: 8456630
    Abstract: Methods and systems for enhanced SERS sensing are disclosed, including generating electromagnetic radiation from a fiber laser; coupling the radiation to a SERS sensor comprising: a fiber comprising a first end and a second end, wherein the first end is coupled to the fiber laser and the second end is deposited with one or more metal nanoparticles; an in-line fiber grating integrated into the fiber between the first and the second end; a spectrometer configured to measure a spectrum produced by the in-line fiber grating; and a micro-processor configured to control the fiber laser and the spectrometer; exciting one or more molecules adsorbed on the surface of the one or more metal nanoparticles to generate a Raman signal; coupling the signal into the fiber; separating the signal into its wavelength components with the in-line fiber grating; and measuring the wavelength components with the spectrometer. Other embodiments are described and claimed.
    Type: Grant
    Filed: May 6, 2011
    Date of Patent: June 4, 2013
    Assignee: PolarOnyx, Inc.
    Inventor: Shuang Bai
  • Patent number: 8451458
    Abstract: An imaging microoptics, which is compact and robust, includes at least one aspherical member and has a folded beam path. The imaging microoptics provides a magnification |??| of >800 by magnitude. Furthermore, a system for positioning a wafer with respect to a projection optics includes the imaging microoptics, an image sensor positionable in the image plane of the imaging microoptics, for measuring a position of an aerial image of the projection optics, and a wafer stage with an actuator and a controller for positioning the wafer in dependence of an output signal of the image sensor.
    Type: Grant
    Filed: March 19, 2012
    Date of Patent: May 28, 2013
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Hans-Juergen Rostalski, Heiko Feldmann
  • Patent number: 8451443
    Abstract: A concave reflection type diffraction optical element used for a Rowland type spectrometer, in which: the Rowland type spectrometer detects wavelengths in a range including a wavelength ?1 or more and a wavelength ?2 or less (?1<?2); the concave reflection type diffraction optical element has a diffractive efficiency D(?) at a wavelength ? which shows local maximum and maximum value at a wavelength ?a satisfying, ? 1 ? ? a < 7 ? ? 1 + 3 ? ? 2 10 ; the concave reflection type diffraction optical element includes a reference surface having an anamorphic shape; and the following condition is satisfied: R>r, where R indicates a meridional line curvature radius of the reference surface and r indicates a sagittal line curvature radius thereof.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: May 28, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventors: Tokuji Takizawa, Kazumi Kimura