Abstract: Described herein is a device for autonomously monitoring a battery is provided. The device is integrated with the battery (e.g., by being electrically coupled to the battery). The device obtains measurement data by injecting electrical signals into the battery and measuring an electrical response of the battery. The device participates in an authentication protocol with a computing device to verify a unique identity of the device to the computing device. After performing the authentication protocol verifying the unique identity of the device, the device transmits battery data to the computer. Further, techniques for verifying the identity of the battery using measurement data obtained by the device are described herein. The techniques generate a battery signature using the measurement data that is then used to verify the identity of the battery. For example, the battery signature may be used to determine whether the battery is counterfeit or defective.

Abstract: A battery state detection device including a battery post terminal, a case accommodating a circuit board including a current sensing circuit that senses a current by being electrically connected to the battery post terminal, and a harness connection part provided on the case, the harness connection part being capable of having a harness connected thereto, in which the battery post terminal includes a holding part held on one of faces of the case, and an insert part provided in a region from the holding part along a face adjacent to the one of the faces of the case, the battery post terminal contacts the case via at least two faces, the two faces including the one of the faces and the face adjacent to the one of the faces, and the case includes a fitting part, the fitting part being adapted to fit around the insert part by accommodating the insert part.

Abstract: A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.

Abstract: A probe card device including a probe structure is provided. Probes respectively pass through multiple through holes on at least two guide plates that are stacked and separated from each other, and each of the probes includes a main body, a contacting portion, a head portion, and a neck portion. The contacting portion is exposed under a lowermost guide plate. The head portion is exposed above an uppermost guide plate. The neck portion is connected between the main body and the head portion, and a part of the neck portion protrudes opposite thereof to form a protrusion portion. The protrusion portion and the main body form an included angle, the protrusion portion abuts against an upper surface of the uppermost guide plate, and a spacing between any two of the probes that are adjacent to each other is less than twice the thickness of the protrusion portion.

Abstract: Provided is a probe card, comprising a guide plate and a shielding structure of single-layer or multi-layer. The guide plate comprises an upper surface, a lower surface, and at least one guide hole passing through the upper surface and the lower surface, and the guide hole is provided with an inner wall surface. At least one layer of the shielding structure is made of an electromagnetic absorption material or an electromagnetic reflection material, and the shielding structure is not connected to a ground. Each layer of the shielding structure is formed on the inner wall surface of the guide hole by means of atomic layer deposition or atomic layer etching, and a thickness of each layer is less than 1000 nm.

Abstract: An electrochemical impedance spectrogram (EIS) measurement system includes a working electrode configured to provide a triangular excitation signal to a subject, and a counter electrode configured to measure an electrical parameter in response to the triangular excitation signal. Based on the triangular excitation signal and the measured electrical parameter, an EIS of the subject is obtained. A method for measuring an EIS of a subject includes causing a triangular excitation signal to be applied to a subject and obtaining electrical parameter measurements in response to the triangular excitation signal. The EIS of the subject is obtained based on the triangular excitation signal and the electrical parameter measurements.

Abstract: An electronic device including a processor and a sensor may be provided. The processor obtains a first degree of degradation of a first core based on a first parameter value associated with a lifetime of the first core and a first operating level associated with an operation of the first core. The processor obtains a second degree of degradation of a second core based on a second parameter value associated with a lifetime of the second core and a second operating level associated with an operation of the second core. The processor schedules a task of the first core and the second core based on the first degree of degradation and the second degree of degradation. The sensor provides the first parameter value and the first operating level to the first core and the second parameter value and the second operating level to the second core.

Abstract: According to one embodiment, a magnetic sensor includes a first sensor part. The first sensor part includes a first magnetic member, a first counter magnetic member, and a first magnetic element. A direction from the first magnetic member toward the first counter magnetic member is along a first direction. The first magnetic element includes one or a plurality of first extension parts. The first extension part includes a first magnetic layer, a first counter magnetic layer, and a first nonmagnetic layer. The first magnetic layer includes a first portion, a first counter portion, and a first middle portion. A direction from the first portion toward the first counter portion is along the first direction. The first middle portion is between the first portion and the first counter portion. The first nonmagnetic layer is between the first counter magnetic layer and at least a portion of the first middle portion.

Abstract: An electro-optical circuit board can provide probe card functionality. The electro-optical circuit board includes at least one electrical conductor track and at least one optical beam path.

Abstract: The invention relates to an apparatus and method for tracking energy consumption. An energy tracking system comprises at least one switching element, at least one inductor and a control block to keep the output voltage at a pre-selected level. The switching elements are configured to apply the source of energy to the inductors. The control block compares the output voltage of the energy tracking system to a reference value and controls the switching of the switched elements in order to transfer energy for the primary voltage into a secondary voltage at the output of the energy tracking system. The electronic device further comprises an ON-time and OFF-time generator and an accumulator wherein the control block is coupled to receive a signal from the ON-time and OFF-time generator and generates switching signals for the at least one switching element in the form of ON-time pulses with a constant width ON-time.

Abstract: A smart plug designed to electrically connect a household appliance to power lines. The smart plug has an electronic controller configured to measure current and voltage of the electric power supplied to household appliance via a smart plug, determine electric quantities indicative at least of prefixed current harmonics and/or prefixed voltage harmonics, based on said measured current and voltage, determine load information which are indicative of electric loads of the household appliance being activated during an operating cycle performed by household appliance, based on determined electric quantities; determine the operating cycle performed by the household appliance based on the load information, communicate determined operating cycle to a network system.

Abstract: A ceramic according to the present invention includes, in mass %, BN: 20.0 to 55.0%, SiC: 5.0 to 40.0%, ZrO2 and/or Si3N4: 3.0 to 60.0%. The ceramic has a coefficient of thermal expansion at ?50 to 500° C. of 1.0×10?6 to 5.0×10?6/° C., is excellent in low electrostatic properties (106 to 1014 ?·cm in volume resistivity) and free-machining properties, and is thus suitable to be used for, for example, a probe guiding member for guiding probes of a probe card, and a socket for package inspection.

Abstract: The invention relates to a particle energy measuring device (14) for determining the energy of a particle beam (26) with (a) at least twenty capacitors (30.n) that (i) each comprise a first capacitor plate (32.n) and (ii) a second capacitor plate (34.n), and (iii) are arranged one behind the other with respect to a beam incidence direction (S), (b) a multiplexer (46) that has (i) a multiplexer outlet (48) and (ii) a plurality of multiplexer inputs (50.n), each multiplexer input (50.n) being designed to connect to precisely one capacitor (30.n) and (iii) that is configured to connect one of the capacitor plates (32.n, 34.n) of the respective capacitor to the multiplexer outlet (48), (c) a total charge measuring device (52) that (i) comprises a total charge measuring device input (54), which is connected to the second capacitor plates (34.n) in order to detect a total charge (Q?) of the charges on all the capacitors (30.

Abstract: A probe card device and a transmission structure are provided. The transmission structure includes a supporting layer, a plurality of metal conductors spaced apart from each other and slantingly inserted into the supporting layer, and an insulating resilient layer formed on the supporting layer. Each of the metal conductors includes a positioning segment held in the supporting layer, a connecting segment and an embedded segment respectively extending from two ends of the positioning segment, and an exposed segment extending from the embedded segment. Each of the embedded segments is embedded and fixed in the insulating resilient layer, and each of the exposed segments protrudes from the insulating resilient layer. When any one of the exposed segments is pressed by an external force, the insulating resilient layer is configured to absorb the external force through the corresponding embedded segment so as to have a deformation providing a stroke distance.

Abstract: A probe test card includes a substrate, a plurality of test needles, and a fixing layer. The substrate includes a first surface at which a trench is formed, and a second surface opposite to the first surface. The plurality of test needles is arranged in the trench. Each test needle includes a first end and a second end being opposite to the first end. The fixing layer is filled in the trench to fix the plurality of test needles in the trench, and a thickness of the fixing layer is same with a depth of the trench. The fixing layer comprises a ceramic powder. The first end of the test needle is non-removably fixed in the trench by the fixing layer and the second end of the test needle protrudes from the trench of the substrate to test a device under test (DUT).

Abstract: Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes. The probes include the retroreflector, which is defined by a retroreflector body. The retroreflector body includes a first side, an opposed second side, a tapered region that extends from the first side, and a light-receiving region that is defined on the second side. The probes also include a probe tip, which is configured to provide a test signal to a device under test (DUT) and/or to receive a resultant signal from the DUT. The retroreflector is configured to receive light, via the light-receiving region, at a light angle of incidence. The retroreflector also is configured to emit at least an emitted fraction of the light, from the retroreflector body and via the light-receiving region, at a light angle of emission that is at least substantially equal to the light angle of incidence.

Abstract: A calibration method includes (a) connecting a impedance measuring device to an impedance standard which has at least two excitation terminals for feeding an excitation signal and two measuring terminals for determining a measurement signal, and which has a fixed or adjustable impedance which corresponds to the impedance target; (b) applying a voltage signal to the excitation terminals and measuring the current flowing through the impedance standard due to the voltage signal at the measuring terminals; or supplying a current signal to the excitation terminals and measuring the dropping voltage at the measuring terminals; and (c) calibrating the impedance measuring device against the impedance standard to the impedance target. The geometrical arrangement of terminals of the impedance standard corresponds to the geometrical arrangement of the terminals of the cell of which the impedance is to be measured.

Abstract: A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements. The guide includes a conductive portion that includes and electrically connects the holes of a group of guide holes to each other and is apt to contact a corresponding group of contact elements apt to carry a same type of signal.

Abstract: A linear motion drive device including a ball screw, a linear motion table driven by the ball screw to move linearly, and an abnormality detection device configured to detect a decrease in a preload applied to the ball screw. The abnormality detection device includes a vibration sensor configured to measure vibration during operation of the ball screw, a calculation processing unit configured to acquire a vibration value of a vibration signal in a specific frequency band among vibration signals measured by the vibration sensor, and an abnormality detection unit configured to determine that a decrease in the preload has occurred in the ball screw when the vibration value is less than a previously determined threshold with respect to a reference value, the reference value being a vibration value in an initial stage of the operation of the ball screw or during a normal operation of the ball screw.

Abstract: A current-sensing system includes a conductor for carrying a first electrical current generating a first magnetic field. A device, spaced from the conductor by a clearance, includes a semiconductor integrated circuit die in a package. The semiconductor integrated circuit die includes at least one elongated bar of a first ferromagnetic material magnetized by the first magnetic field; a sensor comprising a first coil wrapped around the at least one elongated bar to sense the bar's magnetization; and an electronic driver creating a second electrical current flowing through a second coil wrapped around the at least one elongated bar generating a second magnetic field to compensate the at least one bar's magnetization. The package has a first outer surface free of device terminals. A discrete plate of a second ferromagnetic material is positioned in the clearance and is conformal with the first outer surface of the package.