Abstract: A method for determining gate array distribution includes steps or acts of: randomly placing a plurality of test boxes in a logic circuit layout; counting the number of fill cells in each of the plurality of test boxes; recording the count; grouping the plurality of test boxes into two groups: a first group with local clock buffers and a second group without local clock buffers; determining the fill cell percentage of each of the plurality of test boxes; and flagging the test boxes with a poor distribution of gate array cells.

Abstract: A novel method for optimizing the design of digital circuits containing clock gated memory elements. The method unclock gates memory elements by adding necessary feedback loops. Logic functions of memory element outputs in the circuit are viewed as a whole, rather than as separate functions for each input. Detection of duplicate unclock gated memory elements is then effected by identifying identical canonical representations of said unclock gated memory elements. Identified duplicate clock gated memory elements can then be eliminated from the original digital circuit. Further optimization can be accomplished by applying standard logic optimization algorithms to all unclock gated memory elements in said digital circuit. The resulting optimized circuit is clock gated and replaces the original clock gated circuit in said digital circuit.

Abstract: A system and method for predicting yield of integrated circuits includes at least one type of characterization vehicle which incorporates at least one feature which is representative of at least one type of feature to be incorporated in the final integrated circuit product. The characterization vehicle is subjected to at least one of the process operations making up the fabrication cycle to be used in fabricating the integrated circuit product in order to produce a yield model. The yield model embodies a layout as defined by the characterization vehicle and preferably includes features which facilitate the gathering of electrical test data and testing of prototype sections at operating speeds. An extraction engine extracts predetermined layout attributes from a proposed product layout. Operating on the yield model, the extraction engine produces yield predictions as a function of layout attributes and broken down by layers or steps in the fabrication process.

Abstract: An optical proximity correction (OPC) processing method may include at least one of the following steps: Detecting coordinate values of individual piece patterns constituting a graphic design system (GDS). Merging to the form of a specific pattern, composed of outermost coordinate values, on the basis of the detected coordinate values. Shrinking the merged GDS pattern and forming a GDS pattern having a desired magnifying power. Performing an optical proximity correction (OPC) process on the GDS pattern having the desired magnifying power.

Abstract: A method for generating a hardware description language (HDL) specification of a processor of network packets. Independent sets of interdependent handlers are determined from a specification of the handlers for processing the network packets. Either a first pipeline or a cluster of threads is selected for a corresponding architecture for each independent set. The corresponding architecture has one or more concurrent units for each interdependent handler in the independent set. Each concurrent unit is either a stage of the first pipeline or a thread of the cluster. Each action of each interdependent handler in each independent set is assigned to a concurrent unit for the interdependent handler. Each of these actions is also assigned to a stage of a second pipeline for the concurrent unit. The HDL specification of the processor is generated specifying the corresponding architecture for each independent set and the second pipeline for each concurrent unit.

Abstract: Roughly described, method and apparatus for laying out an integrated circuit, in which a subject interconnect has predetermined values for a plurality of variables affecting propagation delay of the subject interconnect. The value of an adjustment one of the variables is adjusted to minimize exposure of the propagation delay of the interconnect to process variations causing variations in the value of a subject fabrication variable, and a revised layout is developed in dependence upon the adjusted value for the adjustment variable. In an embodiment, the adjustment is made in dependence upon a pre-calculated “interconnect optimization database” indicating combinations of values for the plurality of variables which have been pre-determined to minimize exposure of interconnect propagation delay to process variations affecting the subject variable.

Abstract: A method of making a semiconductor device is disclosed. A target mask pattern is provided which includes features to be exposed on the mask, and features to be non-exposed on the mask. The to be exposed features are fractured by searching for geometries on the target mask pattern that meet one or more conditions, identifying mask pattern structures to be fractured, fracturing the identified pattern structures according to a fracture instruction list, creating a set of mask exposure patterns, exposing the mask to the mask exposure pattern, and developing the mask.

Abstract: A method for performing global routing on an integrated circuit design is disclosed. The integrated circuit design is initially divided into multiple G-cells. The G-cells are interconnected by a set of nets. The set of nets is then decomposed into corresponding wires. The wires are prerouted to interconnect the G-cells. BoxRouting is performed on the wires until all the wires are routed. Finally, postrouting is performed on the wires.

Abstract: An integrated circuit system and program product for predicting yield of a VLSI design. An integrated circuit system is provided including a system for identifying and grouping sub-circuits contained within an integrated circuit design by circuit type; a critical area calculation system for determining critical area values for different regions, wherein each different region is associated with a circuit type; a tallying system for calculating a plurality of tallies of critical area values based on circuit type; and a plurality of modeling subsystems for separately modeling each of the plurality of tallies based on circuit type.

Abstract: Embodiments of early enabling synchronous elastic designs, devices and methods are presented herein.

Abstract: Device, system and method of correcting an integrated circuit design. For example, a method includes receiving a list of one or more root points for an active netlist that requires logic correction, wherein the root points correlate between elements of the active netlist and elements of a re-synthesized netlist that is based on a high-level correction for the integrated circuit design; automatically identifying in the active netlist a driving logic cone for at least one of the root points; and automatically identifying in the re-synthesized netlist a driving logic cone for the respectively correlated root point, including one or more corrected logic elements that correspond to the one or more identified flawed logic elements.

Abstract: A computer-readable recording medium recording a mask data generation program, which causes a computer to generate data of a mask illuminated by illumination light and used to form a latent image on a photoresist via a projection optical system.

Abstract: In one embodiment, a method for determining crosslinking between netlists is provided. The first netlist and second netlist may have nets that have different net names but may be the same net. It is also possible that the content of individual nets in one list may need to be split or combined to accurately match the other list. Complete results will not be obtained if only 1 to 1 content matches are considered. The method determines an exploded list of one of the netlists, such as the second netlist, where the netlist is reversed such that the pins of the netlist are used as keys to an associated net name. A pin in the first netlist is then determined. The pin may be associated with a first net name in the first netlist. The pin is looked up in the exploded list using it as a key to determine a second net name for the pin. The process continues using each pin in the first netlist to determine the net name associated with the pin in the second netlist.

Abstract: An apparatus includes: a detecting unit that detects a target path from among a plurality of paths in a target circuit based on a result of a delay analysis of the target circuit, wherein the result of the delay analysis includes delay data of a first circuit component of the target path; an extracting unit that extracts delay data of a second circuit component having an identical type to that of the first circuit component; and a generating unit that generates a directive for replacing the first circuit component with the second circuit component.

Abstract: A printability simulation is performed on a mask layout over a range of lithography process conditions. A layout configuration capable of inducing functional or parametric failure in a semiconductor device is identified in the mask layout. A test structure representative of the identified layout configuration is obtained. A design of experiment is associated with the test structure. The design of experiment is defined to investigating effects of variations of one or more layout attributes in the test structure. Multiple instance of the test structure are fabricated on a wafer according to the design of experiment. Electrical performance characteristics of the fabricated test structures are measured. Based on the measured electrical performance characteristics, one or more layout attributes of the test structure capable of causing functional or parametric failure are determined.

Abstract: A method of automatically generating multithreaded datapaths from a circuit description can include identifying a plurality of process threads from a circuit description, wherein each process thread comprises at least one function, and representing each of the plurality of process threads as an order of operations graph including nodes that correspond to functions and edges that indicate dependencies between the functions. The method also can include identifying at least one conditional edge from the order of operations graphs. An updated circuit description can be generated that specifies a multiplexer for each conditional edge.

Abstract: Methods are provided for generating a hardware description language (HDL) specification of a network packet processor from a first, second, and third specification. The first specification specifies at least one handler of the network packet processor for processing input network packets and producing output network packets. Each handler processes a corresponding type of network packets and includes one or more actions for inspecting and modifying fields of the corresponding type of network packets. The second specification specifies a plurality of characteristics of a plurality of ports of the network packet processor. The characteristics include respective data widths of the ports. The ports include one or more input ports for receiving the input network packets and one or more output ports for transmitting the output network packets. The third specification specifies one or more behavioral constraints of the network packet processor.

Abstract: A method and an apparatus for automatically shaping traces by using computation comprises: setting means that sets an equiangular octagon circumscribing a clearance circle indicating a position where clearance can be secured from vias so that one side of such equiangular octagon is in parallel with a reference line; setting means that sets, with respect to the existing trace having a segment passing between the vias, an equiangular octagon circumscribing a circle that is centered on a center position of the via in the closest vicinity of such segment and that is tangent to such segment so that one side of such equiangular octagon is in parallel with the reference line; correction means that corrects the existing trace in the vicinity of the via so that the trace overlaps any side of the equiangular octagon set with respect to such via; and correction means that connects two segments obtained by the correction means by a segment in a direction of “45×n” degrees with respect to the reference line.

Abstract: Methods, systems and program products for evaluating an IC chip are disclosed. In one embodiment, the method includes running a statistical static timing analysis (SSTA) of a full IC chip design; creating at-functional-speed test (AFST) robust paths for an IC chip, the created robust paths representing a non-comprehensive list of AFST robust paths for the IC chip; and re-running the SSTA with the SSTA delay model setup based on the created robust paths. A process coverage is calculated for evaluation from the SSTA runnings; and a particular IC chip is evaluated based on the process coverage.

Abstract: A PLD is configurable to efficiently implement a wide variety of user functions. The PLD includes a programmable interconnect circuit, programmable logic circuits, one-bit registers, selector circuits, and input/output blocks. The programmable interconnect circuit is configurable to connect the signal lines of its output ports to the signal lines of its input ports. The programmable logic circuits are configurable to implement a programmable function generating one-bit signal values from a respective output port of the programmable interconnect circuit. The one-bit registers store a respective one of these one-bit signal values. The programmable selector circuits are each coupled to output ports of a plurality of the one-bit registers, with each of these one-bit registers coupled to a respective one of the programmable logic circuits.