Patents Examined by MD Rahman
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Patent number: 9228897Abstract: Systems, methods, and devices relating to optical imaging systems for gathering data on atmospheric trace gas emissions from a satellite. An optical system used in the satellite has a Fabry-Perot interferometer coupled to a suitable telescope. The interferometer is a wide angle Fabry-Perot interferometer which creates a fringing pattern in concentric circles with each fringe being a different wavelength on the imaging system. A filter is used with the optical system and allows multiple adjacent modes in a selected spectral range to pass through the interferometer to the imaging system. Each pixel in the imaging system collects light at multiple wavelengths within the selected spectral range. The optical system gathers multiple images of the target area allowing light from the target area to be collected at multiple different wavelengths. Different absorption data for different atmospheric trace gases can be gathered in a single satellite pass over the target area.Type: GrantFiled: May 1, 2015Date of Patent: January 5, 2016Inventors: James J Sloan, Berké Durak, David Gains, Francesco Ricci, Jason McKeever, Joshua Lamorie, Mark Sdao, Vincent Latendresse, Jonathan Lavoie, Roman Kruzelecky
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Patent number: 9228944Abstract: There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.Type: GrantFiled: April 12, 2013Date of Patent: January 5, 2016Assignee: Seiko Epson CorporationInventors: Mamoru Sugimoto, Jun Amako, Hideaki Nishida
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Patent number: 9222859Abstract: A saturator block assembly that is adapted for use with a condensation particle counter is described. The saturator block assembly is comprised of a member that is at least partially formed from a porous material that is adapted to absorb a working fluid. The saturator block assembly also includes at least one open column formed through the porous member. The open column is parallel with a length of the member and is adapted to emit the working fluid in vapor form from the porous material. The saturator block assembly is further comprised of an outer surface, and is adapted to operate at low pressure or low pressure transient applications. A volume of the porous material is configured so as to reduce the amount of air capable of being trapped in the pores of the porous material during low pressure or low pressure transient applications.Type: GrantFiled: April 12, 2012Date of Patent: December 29, 2015Assignee: TSI, INCORPORATEDInventors: Robert Caldow, Steven William Kerrigan, Jason Paul Johnson, Jacob Hackbarth Scheckman
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Patent number: 9222889Abstract: A sample analysis device capable of realizing the enhancement of a near-field light while increasing a hotspot areal density is provided. In a sample analysis device, multiple nanostructures are arranged on the surface of a base body. A dielectric body is covered with a metal film in each nanostructure. The nanostructures form multiple nanostructure lines. In each nanostructure line, the nanostructures are arranged at a first pitch SP which is smaller than the wavelength of an excitation light and the nanostructure lines are arranged in parallel with one another at a second pitch LP which is greater than the first pitch SP.Type: GrantFiled: May 2, 2013Date of Patent: December 29, 2015Assignee: Seiko Epson CorporationInventors: Mamoru Sugimoto, Jun Amako, Hideaki Nishida
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Patent number: 9217633Abstract: The invention relates to an arrangement for analyzing an at least partially reflective surface of a wafer or other objects, containing a holder for holding the object; an inspection arrangement arranged at a distance in the region in front of the surface to be analyzed; and a measurement arrangement for determining the distance and/or inclination of the surface for the inspection arrangement; characterized be a radiation source, the radiation of which is directed towards the surface to be analyzed at an angle; and a spatially resolving detector for receiving the radiation from the radiation source that is reflected from the surface to be analyzed, wherein the radiation source and the detector are arranged outside the region necessary for the inspection between the inspection arrangement and the surface to be analyzed.Type: GrantFiled: April 5, 2013Date of Patent: December 22, 2015Assignee: HSEB DRESDEN GmbHInventors: Bernd Srocka, Ralf Langhans
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Patent number: 9212898Abstract: The invention relates to a method and a device for three-dimensional measurement of an object. The device includes a laser source for generating an illumination beam, a focusing optics for focusing the illumination beam on at least one measuring point on a surface of the object to be measured, a detector for detecting an observation beam reflected by the surface of the object, a confocal observation optics which allows only the observation beam that is focused on the surface of the object to pass through to the detector. The laser source includes multiple coherent laser elements, the laser elements simultaneously emitting illumination beams that are focused on multiple measuring points on the surface of the object, so that the laser elements are arranged to reduce the speckle effect in the 3D-image data generated by the measurement.Type: GrantFiled: September 10, 2012Date of Patent: December 15, 2015Assignee: Sirona Dental Systems GMBHInventors: Matus Banyay, Frank Thiel
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Patent number: 9212912Abstract: A laser gyroscope comprising includes a first solid waveguide; a gain medium interaction region where light traveling through the first solid waveguide interacts with non-solid Doppler-broadened gain medium molecules positioned outside of the first solid waveguide; at least one medium exciter configured to excite the non-solid Doppler-broadened gain medium at the gain medium interaction region, wherein the excited non-solid Doppler-broadened gain medium induces first and second laser fields within the first solid waveguide, wherein the first laser field travels in a clockwise direction within the first solid waveguide and the second laser field travels in a counter-clockwise direction within the first solid waveguide; and a photodetector communicatively coupled to the first solid waveguide and configured to detect the portions of the first and second laser fields.Type: GrantFiled: December 18, 2014Date of Patent: December 15, 2015Assignee: Honeywell International Inc.Inventors: Mary K. Salit, Earl Thomas Benser, Kenneth Salit
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Patent number: 9207174Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: GrantFiled: February 20, 2015Date of Patent: December 8, 2015Assignee: DEFELSKO CORPORATIONInventors: Leon Vandervalk, Robert V. Stachnik, James Edward Davis
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Patent number: 9207074Abstract: A distance measurement method, includes measuring a distance to an object by means of a distance measurement circuit of a distance measurement apparatus and by scanning a light beam; designating a first mode which controls a projection angle of the light beam so that sampling positions in a given number of successive scans do not overlap, when the distance to the object is greater than or equal to a threshold value, by using the processor; and designating a second mode which controls the projection angle of the light beam so that the sampling positions overlap in each scan, when the distance to the object is less than the threshold value, by using the processor.Type: GrantFiled: December 9, 2013Date of Patent: December 8, 2015Assignee: FUJITSU LIMITEDInventors: Koichi Iida, Koichi Tezuka
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Patent number: 9201055Abstract: In a state determination method for determining the state of degradation of lubricating oil in a speed reducer and the state of breakage of the speed reducer, white light emitted by a white LED is transmitted through the lubricating oil, causing an RGB sensor to detect the color of the light transmitted through the lubricating oil by the white LED. The brightness of the color detected by the RGB sensor is calculated. A color component maximum difference that is the difference between a maximum value and a minimum value among the R value, G value, and B value of the color detected by the RGB sensor is calculated. The states on the basis of the calculated brightness and the calculated color component maximum difference are determined.Type: GrantFiled: June 21, 2013Date of Patent: December 1, 2015Assignee: NABTESCO CORPORATIONInventors: Yoshinori Ohnuma, Takuya Shirata, Yasuhito Ida
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Patent number: 9201007Abstract: A device can be used for establishing gas concentrations in an examination volume. A radiation source is configured to generate an electromagnetic beam. A beam guiding apparatus is arranged downstream of the radiation source. The beam guiding apparatus is configured to set a plurality of variations of beam guidance of the beam entering the beam guiding apparatus in an observation plane in the examination volume. A spectrometer is arranged downstream of the beam guiding apparatus. The spectrometer is configured to carry out a spectral analysis of the beam leaving the beam guiding apparatus. An evaluation unit is configured to establish in the observation plane a 2D concentration distribution for one or more gases in the examination volume on the basis of the spectral analysis for different variations of beam guidance.Type: GrantFiled: March 27, 2013Date of Patent: December 1, 2015Assignee: Infineon Technologies AGInventors: Dieter Kohlert, Gerhard Poeppel, Franz Schreier
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Patent number: 9200891Abstract: Provided is a molding wall thickness recognition apparatus, including a calculation portion that calculates a surface area of each surface that configures a molded article in each wall thickness, based on three-dimensional shape information which illustrates a shape of the molded article having different wall thicknesses, and a determining portion that determines the wall thickness of the surface area that satisfies preset conditions as a basic wall thickness, by comparing each surface area in each wall thickness calculated by the calculation portion.Type: GrantFiled: February 9, 2015Date of Patent: December 1, 2015Assignee: FUJI XEROX CO., LTD.Inventor: Masanori Yoshizuka
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Patent number: 9194690Abstract: A torque transmission assembly comprising: (i) an optical fiber coupled to an optical sensing component and capable of rotating and translating the optical sensing component and of transmitting light to and from the optical sensing component; and (b) an annular structure surrounding the optical fiber, the annular structure in conjunction with said optical fiber transmits torque from a rotating component to the optical sensing component, wherein the annular structure does not include a steel wire torque spring.Type: GrantFiled: February 18, 2014Date of Patent: November 24, 2015Assignee: Corning IncorporatedInventors: Venkata Adiseshaiah Bhagavatula, Theresa Chang, Klaus Hartkorn, John Himmelreich
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Patent number: 9188424Abstract: An interferometer includes a light source and a beam splitter, via which the beam of rays emitted by the light source is split into a measurement beam and a reference beam. The measurement beam propagates in a measuring arm extending in a first direction between the beam splitter and a measuring reflector. The measuring reflector brings about an offset perpendicular to the direction of incidence between the measurement beam falling on it and the measurement beam reflected back by it. In a reference arm extending in a second direction, the reference beam propagates between the beam splitter and a reference reflector. In addition, the interferometer has a detector system, to which the superposed and recombined measurement beam and reference beam are able to be supplied, and via which a distance-dependent interference signal with respect to the position of the measuring reflector is able to be generated.Type: GrantFiled: December 19, 2013Date of Patent: November 17, 2015Assignee: DR. JOHANNES HEIDENHAIN GMBHInventors: Wolfgang Holzapfel, Joerg Drescher, Markus Meissner, Ralph Joerger, Bernhard Musch, Erwin Spanner, Thomas Kaelberer
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Patent number: 9188486Abstract: The present invention concerns a system and method for identifying and implementing a correction to spectrometer measurements in order to compensate for errors in the measurement values due to second order diffracted light. The present invention in one configuration, measures light reflectance percentages across the same wavelength range for at least one calibration target. From these measurements the portion of the reflectance values resulting from second order diffracted light is identified and corrected for, thereby generating a compensated measurement of the reflectance values of a sample. These compensated values are then provided to a user.Type: GrantFiled: August 11, 2014Date of Patent: November 17, 2015Assignee: DATACOLOR HOLDING AGInventors: Zhiling Xu, Michael H. Brill
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Patent number: 9165418Abstract: An authentication device includes a photodetector, a processor, a memory storing a first predetermined expected value and a first predetermined enablement time, a timer, a control, and an information display. The processor includes a program for measuring one or more attributes of a first enabling target at a first time, comparing at least one measured attribute of the first enabling target with the stored first predetermined expected value, and enabling the authentication device to authenticate when operated by the control for only the first predetermined enablement time when the at least one measured attribute of the first enabling target matches the first predetermined expected value.Type: GrantFiled: March 6, 2014Date of Patent: October 20, 2015Assignee: EASTMAN KODAK COMPANYInventors: Ronald S. Cok, Joseph A. Manico
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Patent number: 9164029Abstract: A score of each of multiple pieces of reflection spectrum information included in a population is calculated using a first second principal component loading acquired by a principal component analysis, and a first group is classified based on the calculated score. Then, a score of each of multiple pieces of reflection spectrum information included in the population is calculated using a second second principal component loading acquired by a principal component analysis on a second population in which the reflection spectrum information of the first group is not included, and a second group is classified based on the calculated score. By performing a second principal component analysis using the second population, the second group can be accurately classified based on minute characteristics of each type of material included in the reflection spectrum information and the classification can be performed with a high accuracy.Type: GrantFiled: August 14, 2013Date of Patent: October 20, 2015Assignees: Sumitomo Electric Industries, Ltd., National University Corporation Nagoya UniversityInventors: Satoru Tsuchikawa, Hikaru Kobori, Sakura Higa
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Patent number: 9158652Abstract: An airborne, gas, or liquid particle sensor with one or more intelligent modules either within the instrument or attached to the instrument. These modules comprising sub-systems with local controllers or memory.Type: GrantFiled: March 15, 2014Date of Patent: October 13, 2015Assignee: Particles Plus, Inc.Inventor: David Pariseau
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Patent number: 9157847Abstract: An airborne, gas, or liquid particle sensor with a mixed-mode photo-amplifier front-end. The photo-amplifier uses pulse-height for the high-gain channel and integrates the pulse-energy for the low-gain channel to provide for a larger dynamic range for larger size particles.Type: GrantFiled: March 15, 2014Date of Patent: October 13, 2015Assignee: Particles Plus, Inc.Inventors: David Pariseau, Ivan Horban
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Patent number: 9151671Abstract: The present invention is thus directed to an automated system of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Moreover, the system utilizes configured wedge shaped windows to best minimize the reflections of light which cause periodic variation in transmission at different wave lengths (commonly described as “channel spectra”). Such a system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.Type: GrantFiled: August 26, 2013Date of Patent: October 6, 2015Assignee: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLCInventor: John Magie Coffin