Abstract: Disclosed are new methods and systems for achieving calibration in a pipelined ADC system. The methods and systems may be used to provide continuous digital background calibration in a pipelined ADC. Component mismatch error from each DAC in the pipeline is tabulated to provide an integral nonlinearity profile, which is subtracted from the ADC transfer characteristic.
Type:
Grant
Filed:
October 17, 2005
Date of Patent:
September 12, 2006
Assignee:
Texas Instruments Incorporated
Inventors:
Franco Maloberti, Martin Kithinji Kinyua