Patents Examined by Paresh Patel
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Patent number: 11092464Abstract: A system for determining an amplitude of a sinusoidal output waveform from a sensor includes a controller configured to provide a sample signal having a sample frequency that is four times a frequency of a sinusoidal excitation waveform provided to the sensor. The sensor has inductively-coupled primary and secondary windings that produce the sinusoidal output waveform from the secondary winding when the excitation waveform is provided to the primary winding. An analog-to-digital converter measures a first and second voltage of the sensor waveform separated in time by the period of the sample frequency, and the system calculates the amplitude based on the measurements of the first and second voltages.Type: GrantFiled: January 14, 2019Date of Patent: August 17, 2021Assignee: HAMILTON SUNDSTRAND CORPORATIONInventors: Gary L. Hess, Michael A. Wilson
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Patent number: 11092638Abstract: An impulse tester according to the present invention includes a first terminal, a second terminal, a voltage generation circuit, and an oscillation suppression circuit. The oscillation suppression circuit includes a discharge switch and a capacitor. The discharge switch has a first electrode and a second electrode. The first electrode is connected to the first terminal. The second electrode is disposed at a spacing from the first electrode. The discharge switch becomes conductive when a voltage difference between the first electrode and the second electrode is greater than a discharge voltage corresponding to the spacing between the first electrode and the second electrode. The capacitor is connected between the second electrode and the second terminal.Type: GrantFiled: June 30, 2017Date of Patent: August 17, 2021Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Akitoshi Ito, Kazuaki Aono
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Patent number: 11078091Abstract: A system and method are disclosed for automatically operating a high voltage resonance circuit. An embodiment of the system includes one or more coils each coil can be an alternating current (AC) coil or a direct current (DC) coil. An embodiment of the system further includes a microprocessor that issues commands to control amplitude and frequency of pulses of the one or more coils to reach and maintain a resonant condition for water treatment. The microprocessor determines whether a coil is an AC coil or a DC coil by detecting whether a capacitor is connected in series with the coil. An embodiment of the system further includes one or more sensors that measure the quality of water and provide feedback to the microprocessor.Type: GrantFiled: January 28, 2019Date of Patent: August 3, 2021Assignee: General Water Systems LLCInventor: Andrew L. Smith
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Patent number: 11067599Abstract: An embodiment of the present disclosure discloses a probe device including: a base, including a main body, a cavity formed in the main body, and a through hole defined in the main body and communicating with the cavity; a probe, including a main part, a probe head defined at one end of the main part, and a mounting portion defined at the other end of the main part, the mounting portion being inserted into the cavity via the through hole; and a conductive member, disposed in the cavity and defined on the mounting portion, allowing the mounting portion to be caught in the cavity. The conductive member is in contact with the probe device to release the charge of the probe accumulated during operation of the probe, when the probe device is not in operation.Type: GrantFiled: December 20, 2017Date of Patent: July 20, 2021Assignee: HKC CORPORATION LIMITEDInventor: Jianfeng Shan
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High accuracy electrical test interconnection device and method for electrical circuit board testing
Patent number: 11067601Abstract: A high accuracy electrical test interconnect method employs a tester interface transfer block to enable the transfer of electrical contact from less accurate tester resource probes to target probes which are contained in the tester interface transfer block and can be positioned with high accuracy using the three dimensional printing to enable reliable contact with smaller test pads. The target probes can directly contact the tester resource probes or a transfer plate can be interposed between the target probes and the tester resource probes to allow positional adjustment of the target probes relative to the tester resource probes. This invention also includes the use of specialized shape target probes that can contact circuit board objects, such as vertical conductive surfaces and irregular shape test pads that have not been accessible with traditional methods.Type: GrantFiled: March 7, 2014Date of Patent: July 20, 2021Inventor: Donald DeMille -
Patent number: 11067602Abstract: To maintain the horizontalness of a probe card even, if the number of measured DUTs is increased. An electrical connecting apparatus according to the present, disclosure comprises a support member having a lower surface region in which a level part is formed and a wiring board provided adjacent to the lower surface of the support member, and to be connected to a testing device side. The electrical connecting apparatus comprises: a connection unit having multiple connection terminals; a probe substrate electrically connecting multiple probes to the connection terminals; multiple anchors arranged on the upper surface of the probe substrate; and multiple supports functioning as supports between corresponding ones of the anchors and the support member via the wiring board and the connection unit.Type: GrantFiled: November 8, 2019Date of Patent: July 20, 2021Assignee: KABUSHIKI KAISHA NIHON MICRONICSInventors: Toshiyuki Kudo, Takayuki Narumi, Yoshinori Kikuchi, Takao Yasuta
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Patent number: 11060887Abstract: A magnetic detection sensor for being installed at an end of a cable with a pair of signal wires to detect a magnetic field from magnetic poles. The sensor includes a magnetic sensor including a detection section and a pair of lead frames, the detection section including a magnetic detection element for detecting the magnetic field from the magnetic poles, and the lead frames extending from the detection section and configured to output a detection signal of the detection section, a housing portion that houses the magnetic sensor, and a capacitor that is provided separately from the magnetic sensor and is housed in the housing portion. First joining portions respectively joining the pair of lead frames to the pair of signal wires and second joining portions respectively joining the pair of lead frames to a pair of lead wires of the capacitor are located inside the housing portion.Type: GrantFiled: May 10, 2019Date of Patent: July 13, 2021Assignee: HITACHI METALS, LTD.Inventors: Kazuhiko Tomita, Takashi Onimoto, Masaaki Imahori
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Patent number: 11054490Abstract: A magnetic field detection device includes a base, a first yoke, and a magneto-resistive effect element. The first yoke is provided on the base, and includes first and second principal surfaces each extending along a first plane, and a first end surface coupling the first and second principal surfaces. The magneto-resistive effect element is provided on the base, and includes a magnetization free layer disposed at a position overlapped with the first yoke in a first direction along the first plane. The first end surface includes an inverted tapered surface inclined relative to the first plane and extending closer to a center point of the magnetization free layer as being away from the base in a second direction orthogonal to the first plane. A distance from the center point to a first edge is shorter than a distance from the center point to a second edge.Type: GrantFiled: March 13, 2018Date of Patent: July 6, 2021Assignee: TDK CORPORATIONInventors: Yoshiaki Tanaka, Tetsuya Hiraki, Kazuya Watanabe, Suguru Watanabe
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Patent number: 11047882Abstract: Provided are a non-contact voltage measurement device and diagnosis system capable of acquiring the voltage of an electric wire without disconnecting the wire. The non-contact voltage measurement device (100) includes: a cylindrical fixing part (110) for holding an electric wire (10) by clipping the same from both sides; a first electrode (121) and a second electrode (122) provided on the inner peripheral surface of the electric-wire-holding side of the fixing part (110) so as to be separated by a distance (D2); a first measurement capacitor (C3) and a voltage division capacitor (C2) connected to the first electrode (121); a second measurement capacitor (C3?) connected to the second electrode (122); a terminal (131) for measuring the voltage (V1) applied to the first measurement capacitor (C3); and a terminal (132) for measuring the voltage (V2) applied to the second measurement capacitor (C3?).Type: GrantFiled: November 15, 2016Date of Patent: June 29, 2021Assignee: HITACHI, LTD.Inventors: Tetsuji Kato, Minori Nagata, Kohji Maki
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Patent number: 11035881Abstract: A probe for measurements on a device under test with low source impedance is described. The probe has a resistor coupled in series between a probe tip and a probe cable connected to a measuring apparatus. The resistor having an impedance equal to a characteristic impedance of the probe cable or equal to the difference between the characteristic impedance of the probe cable and an output resistance of the device under test. Further, a measuring system and a test setup are described.Type: GrantFiled: April 21, 2017Date of Patent: June 15, 2021Assignee: Rohde & Schwarz GmbH & Co. KGInventor: Martin Peschke
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Patent number: 11035808Abstract: A non-invasive NMR based apparatus for measuring a food attribute (moisture, sugar content) in food products comprises a magnetic chamber, an RF pulsing device attached to the magnetic chamber, a sensor receiver, and a data processing unit in communication with the sensor receiver. The pulsing device exposes the food ingredients/snacks to an RF field and produces an NMR response signal that is detected by the sensor receiver. The data processing unit quantitatively measures a food attribute of the food product based on the NMR response signal.Type: GrantFiled: October 31, 2018Date of Patent: June 15, 2021Assignee: Frito-Lay North America, Inc.Inventors: Rick W. Bajema, Jason Ballengee, Kevin Minard
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Patent number: 11029331Abstract: A semiconductor device includes a circuit board, a semiconductor package, and a contact interface. The semiconductor package is mounted on the circuit board. The semiconductor package includes a plurality of conductive bumps with a first pitch. The contact interface is electrically connected to the circuit board. The contact interface includes a plurality of first contact pads with a second pitch substantially the same as the first pitch. The first contact pads are separated from the conductive bumps.Type: GrantFiled: February 16, 2017Date of Patent: June 8, 2021Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Mill-Jer Wang, Chi-Che Wu, Hung-Chih Lin, Hao Chen
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Patent number: 11029336Abstract: A probe card for a testing apparatus of electronic devices comprises a testing head, which houses a plurality of contact elements extending along a longitudinal axis (H-H) between a first end portion and a second end portion, a support plate, onto which the first end portion is adapted to abut, and a flexible membrane which comprises a first face and a second and opposite face.Type: GrantFiled: August 12, 2019Date of Patent: June 8, 2021Assignee: TECHNOPROBE S.P.A.Inventors: Riccardo Vettori, Stefano Felici
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Patent number: 11029337Abstract: A testing head comprises at least one guide provided with a plurality of guide holes, and a plurality of contact elements housed in the plurality of guide holes. Suitably, the at least one guide comprises a plurality of conductive layers, each conductive layer: including holes of a corresponding plurality of group of the plurality of guide holes and electrically connecting a corresponding group of contact elements housed in the guide holes of the group, contact elements of a group being adapted to carry a same type of signal. The at least one guide is a multilayer comprising a plurality of non-conductive layers, and the conductive layers are arranged on respective faces of a layer of the plurality of non-conductive layers.Type: GrantFiled: August 23, 2019Date of Patent: June 8, 2021Assignee: TECHNOPROBE S.P.A.Inventors: Roberto Crippa, Raffaele Vallauri
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Patent number: 11022712Abstract: A multi-frequency platform for metal detection is disclosed. The transmission frequencies may be selected by the user or in an autonomous fashion. Further, the weighting of the frequencies may also be selected, either by the user or in an autonomous fashion. The ability to select transmission frequencies and weighting of the frequencies provides expanded detection capability, both in terms of the types of targets being sought and the types of ground conditions being experienced.Type: GrantFiled: June 21, 2018Date of Patent: June 1, 2021Assignee: First Texas Products, LLCInventor: Carl W. Moreland
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Patent number: 11022627Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.Type: GrantFiled: January 17, 2018Date of Patent: June 1, 2021Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Patent number: 11019730Abstract: An electrical contact assembly includes an electrically nonconductive base, a first electrical contact supported by the base and a second electrical contact supported by the base such that the first contact and the second contact are separated by a space. The first electrical contact is configured to engage a first external conductive circuit element and the a second electrical contact is configured to engage a second external conductive circuit element. The first contact and the second contact are configured such that a portion of the first contact and a portion of the second contact converge as the base moves in a first direction relative to the first and second external conductive circuit elements and diverge as the base moves in a second direction relative to the first and second external conductive circuit elements.Type: GrantFiled: May 8, 2019Date of Patent: May 25, 2021Assignee: Honeywell Federal Manufacturing & Technologies, LLCInventor: Stephen McGarry Hatch
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Patent number: 11009524Abstract: A rectangular probe includes two broad side surfaces and two narrow side surfaces each parallel to a longitudinal direction of the rectangular probe. The rectangular probe includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, a first contacting segment and a second contacting segment respectively extending from the first and second connecting segments, and a stroke structure arranged on the middle segment, the first contacting segment, or the second contacting segment. A longitudinal thru-hole of the stroke structure is formed by penetrating through the two broad side surfaces. Two transverse grooves of the stroke structure are respectively recessed in the two broad side surfaces. The two transverse grooves are configured to move in two directions away from each other so as to reduce a length of the rectangular probe.Type: GrantFiled: January 2, 2020Date of Patent: May 18, 2021Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.Inventors: Wen-Tsung Lee, Kai-Chieh Hsieh
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Patent number: 11009525Abstract: An illustrative system disclosed herein includes a conductive probe that is adapted to hold a quantity of mercury, wherein the conductive probe includes a conductive body with an outlet and a mercury control system adapted to supply mercury to the conductive probe. In this example, the system also includes an image sensor that is adapted to obtain an image of a mercury droplet positioned on a surface of a material and a measurement system that is adapted to receive the image of the mercury droplet and calculate a contact area between the mercury droplet and the surface of the material based upon the image of the mercury droplet.Type: GrantFiled: May 14, 2020Date of Patent: May 18, 2021Assignee: GLOBALFOUNDRIES U.S. INC.Inventors: Jay Mody, Hemant Dixit
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Patent number: 11012068Abstract: The capacitive sensor apparatus includes: a sensor element disposed on the first surface of the mounting member; and a floating conductor that is disposed on the second surface of the mounting member and is electrically conductive, the floating conductor being electrically disconnected from the sensor element. The sensor element includes: a first electrode; and a second electrode in a shape of a ring surrounding an outer periphery of the first electrode and being electrically disconnected from the first electrode. The floating conductor overlaps at least the first electrode in a projection view seen from the first surface.Type: GrantFiled: February 11, 2019Date of Patent: May 18, 2021Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventor: Takateru Sawada