Abstract: The disclosure describes various aspects of different for automated testing of optical assemblies. A system is described that includes an arm (e.g., a motorized arm) configured to be positioned over an optical assembly having a base plate with multiple optical elements that form one or more optical beam paths. The system also includes at least one optical tool that is configured to be removably attached to the arm and has a measurement instrument to perform a specified test on at least one of the optical beam paths. The arm is configured to adjust its position over the optical assembly to move the optical tool to the correct place to perform the specified test. The system may also include an optical tool changer configured to hold the optical tool in a tool holder when not attached to the arm and to hold additional optical tools in respective tool holders.

Abstract: Aspects of the disclosure include methods for generating angularly deflected laser beams for irradiating a sample in a flow stream. Methods according to certain embodiments include generating a first set of angularly deflected laser beams and a second set of angularly deflected laser beams, propagating the first set of angularly deflected laser beams along a different optical path from the second set of angularly deflected laser beams, combining the first set of angularly deflected laser beams with the second set of angularly deflected laser beams and directing the combined sets of laser beams onto a sample in a flow stream and detecting light from the sample. Systems having a laser, an acousto-optic device and an optical adjustment component configured to generate a first set of angularly deflected laser beams and a second set of angularly deflected laser beams are also described.

Abstract: An assembly for detecting defects on a bodywork of a motor vehicle that includes a gantry, of inverted U-shaped cross section, shaped to allow the passage of the motor vehicle in a longitudinal direction, from the rear of the gantry to the front of the gantry. The gantry includes an inner surface extending transversely between two lateral free ends and includes a light source suitable for illuminating, the bodywork, the gantry including at least one opaque strip extending transversely over the entire length of the inner surface. The assembly includes a plurality of cameras installed at a distance from the gantry to capture images of the bodywork of the motor vehicle, and a detection member for detecting defects in the bodywork.

Abstract: A particle analyzer, comprising a source of a substantially nondiffracting light beam; a flow path configured to produce in a flowcell a ribbon-like core stream having a specific cross-sectional aspect ratio; the flowcell being configured to expose a segment of the core stream to the light beam; a detector configured to receive a signal resulting from an interaction of a particle in the core stream with the light beam; a first sorting actuator connected with the flowcell, downstream of the exposed segment of core stream; a plurality of sorting channels in fluid connection with the flow path and downstream of the first actuator; the actuator having multiple actuation states, each state configured to direct at least one part of the core stream to a corresponding channel; a second sorting actuator connected with the flowcell, opposite the first actuator, and operable in coordination with the first actuator.

Abstract: Flow cytometers including light collection enhancers are provided. In embodiments, the subject flow cytometers include a flow cell, a light source, an objective lens for focusing particle-modulated light propagating within a first light collection cone and a light collection enhancer configured to collect particle-modulated light propagating along an optical path within a second light collection cone and redirect the collected light such that it is back-propagated along the same optical path and focused by the objective lens for detection. Light collection enhancers of interest include a reflective optical element (e.g., a mirror) and a condenser lens positioned between the reflective optical element and the flow cell. Methods for analyzing a sample are also provided.

Abstract: A mask inspection method including the steps of obtaining an image of a mask including a first region having a plurality of first openings, and a second region having a plurality of second openings, sectioning the image into a first partial image corresponding to the first region and a second partial image corresponding to the second region, respectively, inspecting the first region of the mask based on the first partial image, and inspecting the second region of the mask based on the second partial image.

Abstract: The invention comprises a method and apparatus for sampling a common tissue volume and/or a common skin layer skin of a person as a part of noninvasively determining an analyte property with an analyzer including: a set of detectors at least partially embedded in a probe housing, the probe housing comprising a sample side surface, the detectors including a first and second range of detection zones of differing radial distances from a first illumination zone and second illumination zone, respectively coupled to separate sources, with surface paths between the sources and detectors overlapping a common skin area during use.

Abstract: There is provided a system and method of runtime defect examination of a semiconductor specimen, comprising obtaining a first image representative of at least part of the semiconductor specimen, the first image acquired by an examination tool configured with a first focus plane; estimating whether the first image is in focus using a machine learning (ML) model, wherein the ML model is previously trained for classifying images into focused images and defocused images; upon an estimation that the first image is out of focus, performing focus calibration on the examination tool to select a second focus plane associated with an optimal focus score; and obtaining a second image acquired by the examination tool configured with the second focus plane, and estimating whether the second image is in focus using the ML model. The second image, upon being estimated as being in focus, is usable for defect examination on the specimen.

Abstract: A Raman multi-gas detection system including an enhancement unit coupled between a light source and a detector. The enhancement unit includes a nanongrid having a plurality of nanogaps. A gas is coupled to the enhancement unit and is configured to flow through the plurality of nanogaps of the nanogrid. The nanogrid comprises one or more plasmon-active materials. The light source is configured to generate plasmon-enhanced electric fields in the plurality of nanogaps of the nanogrid to induce enhanced Raman scattering of the constituent molecules in the gas within the plurality of nanogaps such that a plurality of different constituent molecules in the gas can be detected. In one embodiment, a molecule in the gas is configured to scatter the light from the light source at a rate more than 1000 times greater than in the free space in the enhancement unit.

Abstract: Systems and methods taught herein advantageously provide extended dynamic range capabilities to detect low intensity and high intensity emitted or scattered light from particles at high speeds with high sensitivity. Independently controlled first and second optical detector elements that handle light intensities in different dynamic ranges, large overall dynamic range is created. Signals from the detector elements can be combined to create a single combined signal that has excellent sensitivity over a large dynamic range. The detector systems and methods taught herein are particularly advantageous in particle processing where the population of particles can emit or scatter light over a large range of intensity values.

Abstract: Disclosed are a method and a device for marking an image position of a sub-pixel of a display screen, and a storage medium. The method includes: obtaining an original image of the sub-pixel of the display screen that has been taken, marking all the sub-pixel bright points in the original image of the sub-pixel to obtain a sub-pixel mark map; searching for points to be filled among adjacent points of the bright point of each sub-pixel in the sub-pixel mark map according to the first direction pixel pitch and the second direction pixel pitch in the original image of the sub-pixel, filling the points to be filled to obtain a filling mark map; and obtaining the target sub-pixel mark map based on the sub-pixel mark map and the filling mark map.

Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.

Abstract: The present invention provides a detection device and a detection method. The detection device uses the signal light formed by the interference of the first and the second echo lights reflected on the surface of the component to be detected to obtain the first light intensity distribution information of the signal light corresponding to the sampling position on the component to be detected by the first detection device to obtain the phase distribution of the signal light according to the intensity distribution to obtain the defect distribution data of the component to be detected. Among them, the first detection apparatus includes more than two polarization detectors, or a non-polarization detector and at least one polarization detector.

Abstract: A notch detecting method for detecting a notch defined in an outer circumferential portion of a wafer includes a placing step of placing the wafer on a rotary table, an image capturing step of acquiring an image of the outer circumferential portion of the wafer, a contour data acquiring step of acquiring contour data including coordinates of a contour of the wafer, a hypothetical circle calculating step of calculating a hypothetical circle that approximates the contour of the wafer, an irregularly shaped area determining step of determining whether an irregularly shaped area exists in the outer circumferential portion of the wafer or not, and a first notch determining step of determining whether the irregularly shaped area is the notch or not.

Abstract: A method of processing component carriers includes supplying a plurality of arrays, each comprising a plurality of component carriers, to a human operator for optical inspection, displaying a respective array on a display, and providing a user interface enabling the human operator to input a judgment concerning a quality classification of a displayed array without a mandatory manual handling of the array by the human operator.

Abstract: The disclosure provides a wafer detection method, device, apparatus, and a storage medium. The method includes: an original wafer picture to be detected is received; picture segmentation is performed on the original wafer picture to acquire a plurality of first pictures; picture zooming is performed on the original wafer picture and the first pictures to respectively acquire a second picture and a plurality of third pictures, the second picture and the third pictures meet an input size requirement of the wafer detection model to an input picture; the second picture and the third pictures are sequentially input into a wafer detection model to acquire a first detection result corresponding to the second picture and a second detection result corresponding to each third picture; and a total detection result of the original wafer picture is determined according to the first detection result and the second detection results.

Abstract: A semiconductor wafer imaging system for imaging a semiconductor wafer includes shroud panels defining a black box, a camera positioned in the black box for imaging the semiconductor wafer, and an illumination panel for directing diffuse light to the semiconductor wafer. A portion of the diffuse light is reflected off the semiconductor wafer and the camera images the semiconductor wafer by detecting the reflected diffuse light.

Abstract: The present disclosure relates to a fine particle-trapping sensor including: a plasmonic hotspot layer formed of a first metal; and a trapping layer formed of a second material. The inventors of the present disclosure have made extensive research efforts to develop a more effective and novel sensor for the real-time and high-sensitivity detection of droplets emitted from the oral cavity. As a result, the inventors have developed an alloy composite nanostructure including a Raman sensor layer, formed of a metal, and a trapping layer formed of a dielectric material, and have found that, when the ratio between the two layers is adjusted, the alloy composite nanostructure effectively traps respiratory droplets rapidly emitted from the oral cavity and detects coronavirus (SARS-CoV-2 lysate) in the respiratory droplets at a concentration of 10 pfu/ml, indicating that the composite nanostructure may be very advantageously used in the field of fine particle trapping.

Abstract: With respect to an inference method performed by at least one processor, the method includes inputting, by the at least one processor, into a learned model, non-processed object image data of a second object and data related to a second process for the second object, and inferring, by the at least one processor using the learned model, processed object image data of the second object on which the second process has been performed. The learned model has been trained so that an output obtained in response to non-processed object image data of a first object and data related to a first process for the first object being input approaches processed object image data of the first object on which the first process has been performed.

Abstract: Sample preparation systems and methods are described having pump control, valve configurations, and control logic that facilitate automatic, inline preparation dilutions of a sample according to at least two dilution operating modes. A system embodiment includes, but is not limited to a first pump configured to drive a carrier fluid; a second pump configured to drive a diluent; and a plurality of selection valves fluidically coupled with the first pump and the second pump, the plurality of selection valves being configured to direct fluid flows from the first pump and the second pump according to at least two modes of operation to provide a single-stage sample dilution according to a first operating mode and to provide a dual-stage sample dilution according to a second operating mode.