Abstract: Offset illumination using multiple emitters in a fluorescence imaging system is described. A system includes an emitter for emitting pulses of electromagnetic radiation and an image sensor comprising a pixel array for sensing reflected electromagnetic radiation. The emitter comprises a first emitter and a second emitter for emitting different wavelengths of electromagnetic radiation. The system is such that at least a portion of the pulses of electromagnetic radiation emitted by the emitter comprises one or more of a hyperspectral emission, a fluorescence emission, and/or a laser mapping pattern.

Abstract: A medical treatment system, such as peritoneal dialysis system, may include control and other features to enhance patient comfort and ease of use. For example, a peritoneal dialysis system may include patient line state detector for detecting whether a patient line is primed before it is to be connected to the patient. The patient line state detector can also the ability to detect whether a patient line has been properly mounted for priming. Both patient line presence/absence and fill state can be determined using an optical system, e.g., one that employs a single optical sensor.

Abstract: A wafer map is classified using the machine learning based model and a signature on the wafer map. The machine learning based model uses transfer learning. The machine learning based model can be trained using images from various sources that are extracted and augmented and their features extracted. These extracted features can be classified into defects that occur during semiconductor manufacturing.

Abstract: Disclosed herein are sample dishes for use with microscopes that are simple to mount on a microscope and facilitate easy manipulation of tissue samples disposed thereon during imaging as well as methods of their use. A sample dish comprises an optical interface and, optionally, a support member that holds the optical interface. The optical interface of a sample dish is suitably transparent and planar such that a focal plane of a microscope can reside uniformly at or within a surface of a sample during imaging. In certain embodiments, a support member comprises a dish for holding excess fluid. In certain embodiments, a sample dish comprises separation ribs. In certain embodiments, a sample dish comprises one or more manipulation members (e.g., tabs). In certain embodiments, a sample dish is used with an imaging artifact reducing fluid.

Abstract: An optical receiver including an ASIC, a light detector element, and a protective mask is disclosed. The light detector element is disposed on the ASIC and has a top surface oriented toward incident light, the top surface including a portion configured to receive the incident light and via which the incident light reaches an active area of the light detector element. The protective mask is placed over the ASIC so as to (i) cover, from the incident light, a portion of the ASIC, and (ii) provide an aperture that defines an optical path for the incident light through the protective mask to the portion of the top surface of the light detector element.

Abstract: Provided is a passenger monitoring system comprising: a ranging sensor that is provided in a vehicle and capable of outputting a distance information corresponding to a distance to a passenger in the vehicle; and a control unit that estimates a state of congestion of the vehicle based on the distance information.

Abstract: A 3D printer includes a nozzle configured to jet a drop of liquid metal therethrough. The 3D printer also includes a light source configured to illuminate the drop with a pulse of light. A duration of the pulse of light is from about 0.0001 seconds to about 0.1 seconds. The 3D printer also includes a camera configured to capture an image, video, or both of the drop. The 3D printer also includes a computing system configured to detect the drop in the image, the video, or both. The computing system is also configured to characterize the drop after the drop is detected. Characterizing the drop includes determining a size of the drop, a location of the drop, or both in the image, the video, or both.

Abstract: Apparatuses and methods for metrology on devices using fast marching level sets are disclosed herein. An example method at least includes initiating a fast marching level set seed on an image, propagating a fast marching level set curve from the fast marching level set seed to locate boundaries of a plurality of regions of interest within the image, and performing metrology on the regions of interest based in part on the boundaries.

Abstract: A sensor architecture that uses fixed wavelength light and tunes a wavelength dependent response of a sensor may be used for detecting analytes in a wide range of applications. The sensor architecture is based on optical resonators or interferometers comprising optical waveguides. A resonance wavelength and/or transmission/reflection spectrum are affected by presence of an analyte adsorbed on a surface of the waveguide, and a setting of a phase modulator. The sensors include a sensor portion where part of the waveguide is exposed to a sample for sensing, and a phase modulator part. The phase modulator part may include a heater that is controlled to tune, or sweep, or modulate the resonant wavelength and/or spectrum of the sensor.

Abstract: Embodiments discussed herein refer to LiDAR systems and methods that use a virtual window to monitor for potentially unsafe operation of a laser. If an object is detected within the virtual window, the LiDAR system can be instructed to deactivate laser transmission.

Abstract: A method for characterizing object(s) in a sample includes collecting transmitted, refracted, scattered, diffracted, and/or emitted light from the sample. The collected light formed on a sensor surface includes at least a first and second image of the object(s). For at least the first and second image, the collected light is modulated asymmetrically differently, or for at least a third and fourth image focal plane positions are different, or for at least a fifth image the collected light is modulated in at least two places differently compared to the surroundings, or for at least a sixth and seventh image of the object(s), the collected light is modulated asymmetrically differently and focal planes of the sixth and seventh image have different positions. The images are processed to characterize the objects(s).

Abstract: There are provided a system and a method of automatic tire inspection, the method comprising: obtaining at least one image capturing a wheel of a vehicle; segmenting the at least one image into image segments including a tire image segment corresponding to a tire of the wheel; straightening the tire image segment from a curved shape to a straight shape, giving rise to a straight tire segment; identifying text marked on the tire from the straight tire segment, comprising: detecting locations of a plurality of text portions on the straight tire segment, and recognizing text content for each of the text portions; and analyzing the recognized text content based on one or more predefined rules indicative of association between text content of different text portions at given relative locations, giving rise to a text analysis result indicative of condition of the tire.

Abstract: A multi-mode illumination system, including: a first illumination module; a second illumination module; and a third illumination module, as disclosed herein.

Abstract: An alignment device includes a holding device capable of holding the second workpiece, a moving device that moves the holding device toward the first workpiece, a mirror member capable of reflecting the second workpiece, the mirror member being arranged adjacent to the first workpiece, an image sensor arranged to be able to simultaneously and continuously capture the first workpiece and a mirror image of the second workpiece reflected on the mirror member, and a control device that performs feedback control of the moving device based on the calculated position of the second workpiece with respect to the first workpiece based on the first workpiece and the mirror image of the second workpiece, which are captured by the image sensor, to align the second workpiece with the first workpiece.

Abstract: Provided is a photoelectric sensor capable of being securely joined to a housing while being sufficiently resistant to dirt. A housing 12 of a photoelectric sensor 10 has an opening 121 which allows passage of at least one of light from a light projecting unit 14 and light to a light receiving unit 16, and is provided with a cover lens 50 which covers the opening 121 and is optically transmissive. The cover lens 50 is joined to an edge portion 121a of the housing 12 defining the opening 121. An outer surface 51 of the cover lens 50 is provided with antifouling coating 61. An inner surface 52 of the cover lens 50 has a joint portion 52a which is in contact with the edge portion 121a and is not provided with the antifouling coating 61.

Abstract: An information processing apparatus, an information processing method, a non-transitory computer-readable medium, an a storage device for quantitatively analyzing and storing a relationship between an environment of a measurement target and a response of the measurement target with respect to the environment. The information processing apparatus includes a storage circuitry and an operation circuitry configured to acquire a first physical value by analyzing captured image information, the first physical value being indicative of an environment of a measurement target associated with a first pixel of the plurality of pixels, acquire a second physical value by analyzing the captured image information, the second physical value being indicative of a response of the measurement target with respect to the environment, and control the storage circuitry to store the first physical value and the second physical value in correlation with each other.

Abstract: An example microscope includes a pump laser for providing a first illumination to a sample. A laser array provides a second illumination to the sample. The laser array may include a plurality of laser elements, each providing oblique illuminations to the sample. An illumination collecting source collects the first illumination and the second illumination from the sample. The illumination collecting source may capture transient 3D refractive index (RI) variations in the sample due to the first illumination and second illumination.

Abstract: An exemplary method generally includes reflecting, by a movable reflector, electromagnetic radiation from a field of view in a region of interest of an additive manufacturing machine to an optics assembly; splitting, by a beam splitter of the optics assembly, the electromagnetic radiation into a plurality of beams; directing the plurality of beams to a plurality of optical sensors such that each optical sensor of the plurality of optical sensors receives a corresponding and respective beam of the plurality of beams; generating, by the plurality of optical sensors, a plurality of outputs, each output including information related to a corresponding and respective beam; and controlling, by a controller, the movable reflector to move the field of view to maintain a predetermined relationship between the field of view and a moving build point within the region of interest.

Abstract: Disclosed are a hole expansion ratio testing device, a hole expansion ratio testing method, and an operation program. The hole expansion ratio testing device includes a chucking unit configured to chuck a plate member having a hole, a punching unit inserted into the hole and configured to expand the hole, an image acquisition unit configured to acquire an image of the hole expanded by the punching unit, and an analysis unit configured to extract an interest area corresponding to the hole from the acquired image, linearize the interest area, and provide information on a crack as a blob changes due to the linearization.

Abstract: The purpose of the present disclosure is to provide a mode field diameter test method and test device that enable acquisition of a mode field diameter for an arbitrary higher-order mode. The present disclosure is a mode field diameter test method including: a test light incidence procedure for selectively causing test light to be incident in a mode subject to measurement, on one end of an optical fiber 10 under test; a far-field pattern measurement procedure for measuring a far-field pattern of the mode subject to measurement, with respect to a divergence angle ? at the other end of the optical fiber under test, by a far-field scanning technique; and a mode field diameter calculation procedure for calculating, using an equation, a mode field diameter from information about incident mode orders in the test light incidence procedure and the far-field pattern measured in the far-field pattern measurement procedure.