Abstract: A buffer logic within a memory module having the capability to carry out a test of another memory module to which it is coupled via a point-to-point bus through autonomously storing and transmitting a test pattern across that point-to-point bus to the other memory module, while further employing another buffer logic that is interposed between the two memory modules to pass on the test pattern, but intercept a signal received from the other memory module during the test and pass on an indication of the receipt of that signal to an analysis device to monitor the test.

Abstract: An apparatus for performing a boundary scan test is provided, along with method for integrating and operating the same. The apparatus includes an asynchronous flip-flop that has a data input, a data output, a system clock input, a set input, and a reset input. The apparatus also includes a test controller that has a test clock input, a first test data output, and a second test data output. The first test data output of the test controller is connected to the set input of the asynchronous flip-flop. In addition, the second test data output of the test controller is connected to the reset input of the asynchronous flip-flop. The test controller is configured to control the asynchronous flip-flop through the set input and the reset input. The apparatus for performing the boundary scan test avoids introduction of adverse delay and skew effects caused by multiplexing circuitry.

Abstract: A shift scan chain includes logic circuit blocks 11-18 and scan registers 21-28 connected at stages succeeding them. The shift chain is divided into divisional chains including the scan registers 21-24 and the scan registers 25-28. In the test operation mode of a semiconductor integrated circuit, test input data TI are supplied in synchronism with a multiplied clock signal CKD at a frequency twice of that of a clock signal CK. The test input data TI are converted by a serial/parallel conversion circuit 40 into parallel data S41 and S42, which are respectively supplied to the head scan registers 21 and 25 of the corresponding divisional chains. The length of each divisional chains becomes ½, and a test time period can be shortened.

Abstract: Application specific integrated circuits (ASICs) and methods are provided which allow for internal testing of an ASIC. One ASIC embodiment includes a processor on the ASIC. A memory is coupled to the processor. A test circuit is integrated on the ASIC and coupled to the processor to perform testing internal to the ASIC, the test circuit having an input to receive signals from the processor. The processor can read an output of the test circuit to determine a performance speed of the ASIC.

Abstract: An apparatus for providing a local scan enable signal. The local scan enable signal being used to perform an at-speed test on a portion of circuitry associated with the local scan enable signal. The local scan enable signal is generated from a global scan enable signal and clock signal. The global scan enable signal and clock signal are received from the system and used to generate a local scan enable signal to test each portion of circuitry in the die at speed.

Abstract: The configuration of a faulty line segment in a switch matrix of a programmable logic device is identified using read-back capture. Each original programmable interconnection point (“PIP”) in the line segment is tested by generating routes from a first logic port through the original line segment and PIP, through all PIPs, adjacent to the original PIP to the opposite logic port. Routes through all PIPs adjacent to the PIPs in the line segment from the first logic port to the second logic port, and from the second logic port to the first logic port, are tested to isolate the fault in the line segment.