Patents Examined by Scott Richey
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Patent number: 8094319Abstract: An image diagnostic apparatus includes a probe capable of light transmission and reception, wherein a reflection light is obtained from the probe by scanning the probe rotatingly, and a tomographic image is formed and outputted based on the obtained reflection light. A light-shield is provided to shield the light transmitted to the probe, a connection detector detects whether or not the probe is connected, and a controller controls the light-shield based on a detected result by the connection detector.Type: GrantFiled: September 10, 2008Date of Patent: January 10, 2012Assignee: Terumo Kabushiki KaishaInventor: Yuuji Onimura
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Patent number: 8086019Abstract: An image of respective figures is cut out by selecting a figure from tire CAD drawings, and an arranging position of the figure is set in accordance with a distance in a radial direction form a tire center and a deformed angle in a circumferential direction of the tire from a designated location, so that a height of respective regions of the cut-out image is set. Then, the cut-out image is transformed into an image having a gray scale in accordance with the height by using the height information of respective regions, and, at an arranging position of the figure, the image having a gray scale is sampled by a predetermined interval in a radial direction from a tire center and is sampled by a predetermined angle interval in a circumferential direction of the tire, so that master data are created by the image and a distance between intersecting points becomes equal.Type: GrantFiled: June 19, 2006Date of Patent: December 27, 2011Assignee: Bridgestone CorporationInventors: Norihiro Honda, Tomoyuki Kaneko
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Patent number: 8077325Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.Type: GrantFiled: December 9, 2009Date of Patent: December 13, 2011Assignee: Duke UniversityInventors: Michael Choma, Joseph A. Izatt, Audrey Ellerbee, Marinko Sarunic
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Patent number: 8068230Abstract: A real-time FROG system provides ultra fast pulse measurement and characterization. The system includes direct, integrated feedback that measures how well the system is retrieving pulses and tracking changes in the pulse train. This feedback is provided in real time and may be in the form of the FROG trace error, the display of the measured and retrieved FROG trace, accuracy of background subtraction or other quality measurement. The system includes preprocessing options that can be used to adjust the dynamic range of the measured signal or to perform different types of filtering. The preprocessing of the FROG trace precedes phase retrieval processing and improves the quality of pulse retrieval.Type: GrantFiled: August 29, 2008Date of Patent: November 29, 2011Assignee: Mesa Photonics, LLCInventor: Daniel J. Kane
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Patent number: 8068231Abstract: An optical sensor includes an optical coupler configured to receive a first optical signal and to split the first optical signal into a second optical signal and a third optical signal. The optical sensor further includes a Bragg fiber in optical communication with the optical coupler. The second optical signal and the third optical signal counterpropagate through the Bragg fiber and return to the third port and the second port, respectively.Type: GrantFiled: May 6, 2010Date of Patent: November 29, 2011Assignee: The Board of Trustees of the Leland Stanford Junior UniversityInventor: Michel J. F. Digonnet
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Patent number: 8054467Abstract: An apparatus and method to determine a property of a substrate by measuring, in the pupil plane of a high numerical aperture lens, an angle-resolved spectrum as a result of radiation being reflected off the substrate. The property may be angle and wavelength dependent and may include the intensity of TM- and TE-polarized radiation and their relative phase difference.Type: GrantFiled: August 20, 2010Date of Patent: November 8, 2011Assignee: ASML Netherlands B.V.Inventors: Arie Jeffrey Maria Den Boef, Arno Jan Bleeker, Youri Johannes Laurentius Maria Van Dommelen, Mircea Dusa, Antoine Gaston Marie Kiers, Paul Frank Luehrmann, Henricus Petrus Maria Pellemans, Maurits Van Der Schaar, Cedric Desire Grouwstra, Markus Gerardus Martinus Van Kraaij
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Patent number: 8049900Abstract: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer. The Uniform Frequency Sample Clocking comprises at least one Pathway, which includes characterizing the swept light source, creating a digital representation of the waveform based from the characterization data, and generating a clock signal using a waveform generator to output the clock signal to a digitizer external clock.Type: GrantFiled: July 14, 2008Date of Patent: November 1, 2011Assignee: Volcano CorporationInventors: Nathaniel J. Kemp, Roman Kuranov, Austin Broderick McElroy, Thomas E. Milner
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Patent number: 8049873Abstract: A surgical microscopy system is provided wherein an optical coherence tomography facility is integrated into a microscopy system. A beam of measuring light formed by collimating optics of an OCT system is deflected by a beam scanner, traverses imaging optics, and is reflected by a reflector such that the beam of measuring light traverses an objective lens of microscopy optics and is directed to an object region of the microscopy optics. A position of the beam of measuring light being incident on the reflector is substantially independent on a direction into which the beam of measuring light is deflected by the beam scanner. When traveling through the beam scanner, the beam of measuring light is comprised of a bundle of substantially parallel light rays.Type: GrantFiled: March 18, 2009Date of Patent: November 1, 2011Assignee: Carl Zeiss Meditec AGInventors: Christoph Hauger, Markus Seesselberg, Keith O'Hara, Yue Qiu, Xing Wei, Jochen M. Horn, Peter Reimer
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Patent number: 8040524Abstract: The optical tomography imaging system includes a light source, a branching section which branches a light beam into a measuring light beam and a reference beam, an optical probe having an optical fiber, a measurement section which irradiates a measurement target with the measuring beam and picks up a reflected beam, and a sheath which encloses the optical fiber and the measurement section, a multiplexing section which combines the reflected beam with the reference beam to create an interference beam, an interference beam detecting section which detects the interference beam as interference signals, and a contact detecting section which detects a contact area in which the optical probe and the measurement target are in contact with each other. The contact detecting section calculates from the detected interference signals a distance between the optical probe and the measurement target, and uses the calculated distance to detect the contact area.Type: GrantFiled: September 19, 2008Date of Patent: October 18, 2011Assignee: FUJIFILM CorporationInventor: Satoshi Ozawa
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Patent number: 8023721Abstract: A panel inspection device and inspection method is provided. At least an image capturing element is disposed above or below a spacing between a first conveyer and a second conveyer. During a panel is conveyed from the first conveyer to the second conveyer, the image capturing element captures the image of the panel as the panel passes through the spacing.Type: GrantFiled: April 17, 2009Date of Patent: September 20, 2011Assignee: Chunghwa Picture Tubes, Ltd.Inventors: Hsien-Chang Kao, Ching-Chun Chien, Chih-Chiang Lee, Kuo-Chang Teng