Abstract: A method of inspecting a substrate, includes: creating a model indicating a relation between a pixel value in a captured image of the substrate and a feature amount of a film on the substrate, based on a measured feature amount of a film on a creating substrate and a captured image generated by imaging the creating substrate by an apparatus in a first system; imaging an object substrate by an apparatus in a second system to generate a captured image, and calculating an estimated feature amount of a film on the object substrate, based on the captured image and the model; calculating a statistical value of the estimated feature amounts of the object substrates; and calculating an offset amount for the estimated feature amount from a measured feature amount of a film formed by performing a same treatment on an offset substrate in the second system and the statistical value.

Abstract: An image processing device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations includes: detecting a feature point to be used for authentication of a target object included in an image; calculating a first blur being a blur of a predetermined processing point in the feature point; and estimating, by using the first blur, a second blur being a blur of the target object.

Abstract: There is provided a system and method of performing a measurement with respect to an epitaxy formed in a finFET, the epitaxy being separated with at least one adjacent epitaxy by at least one HK fin. The method comprises obtaining an image of the epitaxy and the at least one HK fin, and a gray level (GL) profile indicative of GL distribution of the image; detecting edges of the at least one HK fin; determining two inflection points of the GL profile within an area of interest in the image; performing a critical dimension (CD) measurement between the two inflection points; determining whether to apply correction to the CD measurement based on a GL ratio indicative of a relative position between the epitaxy and the at least one HK fin; and applying correction to the CD measurement upon the GL ratio meeting a predetermined criterion.

Abstract: One embodiment can provide a system and method for determining joinder points on to-be-joined fabric pieces. During operation, the system captures an image comprising the to-be-joined fabric pieces; identifies to-be-joined edges, respectively, on the fabric pieces; for each edge, computes a curve that substantially fits the edge; and determines the joinder points on the edge based on the computed curve. Variance of distance between two consecutive joinder points on the edge is within a predetermined value.

Abstract: A defect identification method and an image analysis system are provided. The defect identification method includes the following steps: adjusting a gray level distribution of a first image corresponding to a reference image of a defect on a wafer to generate a second image; capturing a defect of interest image in the second image; analyzing a plurality of pixels of the defect of interest image to obtain a minimum gray level value of the pixels; analyzing the pixels of the second image according to the minimum gray level value, so as to obtain a number of defect of interest pixels and a number of non-defect of interest pixels; dividing the number of defect of interest pixels by the number of non-defect of interest pixels to obtain a proportional value; and determining a defect type of the defect in the first image according to the proportional value.

Abstract: An electronic apparatus includes a selection unit configured to select any one of a plurality of parameters generated in advance, and an analysis unit configured to receive light reflected from food to be analyzed and perform an analysis of spectral data by using the parameter selected by the selection unit, the spectral data indicating spectral intensities of a plurality of spectral components, wherein the selection unit is configured to select any one of the plurality of parameters based on at least any one of a type of the food to be analyzed, a demanded accuracy of the analysis, and processing to be performed after the analysis.

Abstract: A method and device for determining a tower clearance of a wind turbine. The method includes: acquiring an image of a wind turbine in operation (S10), the image comprising the tips of blades (2) and a tower (1) of the wind turbine; determining the positions of the tips of the blades (2) of the wind turbine in the image acquired (S20); identifying the edges of the tower (1) in the image acquired (30); and calculating, on the basis of the positions of the tips of the blades (2) and the edges of the tower (1) that have been determined, the distance from the tips (2) of the blades (2) to the edges of the tower (1) to acquire a tower clearance (S40).

Abstract: The present disclosure provides an intelligent replacement device and method for a trap board in a tea garden based on image channel computation. The device includes a trap board supply module, a trap board sticker removal module and a machine vision control module fixed on a machine frame, where the machine vision control module is configured to acquire an image of a present trap board in the trap board supply module, determine whether the present trap board fails according to the image, control, in response to failure of the present trap board, the trap board supply module to replace the trap board, and control the trap board sticker removal module to remove a film of a replaced trap board. The present disclosure can replace the trap board in the tea garden automatically, timely and accurately instead of the manual operation.

Abstract: An apparatus includes at least one memory configured to store at least one image of multiple pieces of deburring media used in a vibration deburring machine. The apparatus also includes at least one processor configured to analyze the at least one image to determine a condition of each of the multiple pieces of deburring media and determine an overall condition of the deburring media. The at least one processor is also configured to generate a graphical user interface containing a notification based on at least one of: the conditions of the multiple pieces of deburring media and the overall condition of the deburring media.

Abstract: The invention concerns a method implemented by a device for displaying strokes of digital ink in a display area and for performing text line extraction to extract text lines from the strokes. In particular, the text line extraction may involve slicing the display area into strips, ordering for each strip the strokes into ordered lists which form collectively a first set of ordered lists, forming for each strip a second set of ordered lists by filtering out from the ordered lists of the first set strokes which are below a given size threshold, and performing a neural net analysis based on said first and second sets to determine for each stroke a respective text line to which it belongs.

Abstract: An example system to measure strain in an article includes a camera, a processor, and memory. The camera is to capture a plurality of images of the article. The processor and the memory are in selective communication with the camera. The processor and the memory are configured to determine strain in a region of the article based on a plurality of reference marks shown in the plurality of images.

Abstract: A method of aligning scans of a workpiece is disclosed, including coupling a set of reflective boundary targets along an edge of a workpiece having first and second opposing facial surfaces. The boundary targets are detectable by a surface scanning device when scanning the first facial surface and when scanning the second facial surface of the workpiece. The method further includes scanning the first facial surface of the workpiece, generating a first data set and scanning the second facial surface of the workpiece, generating a second data set. The first and second data sets each include spatial points corresponding to locations of the reflective boundary targets. The method further includes aligning the spatial points of the first data set with the spatial points of the second data set.

Abstract: A component mounter images suction states of components picked up by a suction nozzle, processes images of the suction states of the components to recognize the suction state of the component, and stores the images in a storage device with linking production information related to the components. An inspection machine images a mounted state of each component on a board, processes an image of mounted state of each component to recognize the mounted state of each component, and inspects whether a mounting error occurred for each component based on the recognition result. The inspection machine determines that a mounting error occurred for any of the components the image of the mounted state of the component for which a mounting error was determined to have occurred and a searched image of the suction state of the component are displayed on the display monitor in a comparative manner.

Abstract: A state determination apparatus 100 determines the state of a structure 200. The state determination apparatus 100 includes a measurement unit 10 configured to measure a deflection amount and a surface displacement amount in each of a plurality of target regions that are preset on the structure 200, a feature value calculation unit 20 configured to calculate, for the respective target regions, feature values each indicating a relationship between the deflection amount and the surface displacement amount, using the measured deflection amount and surface displacement amount, a spatial distribution calculation unit 30 configured to calculate a spatial distribution of the feature values using the feature values calculated for each of the target regions, and a degradation state determination unit 40 configured to determine a degradation state of the structure 200 based on the spatial distribution of the feature value.

Abstract: Systems and methods are provided for receiving a plurality of images corresponding to a listing in an online marketplace, generating a scene type for each image of the plurality of images, and grouping each image into a scene type group of a set of predefined scene types. Each group of images are input into a respective machine learning model specific to the scene type of the group of images to generate a visual score for each image in each group of images, and an attractiveness score is generated for the listing in the online marketplace based on the visual scores for each image in each group of images.

Abstract: There is provided a mask inspection system and a method of mask inspection. The method comprises: during a runtime scan of a mask of a semiconductor specimen, processing a plurality of aerial images of the mask acquired by the mask inspection system to calculate a statistic-based Edge Positioning Displacement (EPD) of a potential defect, wherein the statistic-based EPD is calculated using a Print Threshold (PT) characterizing the mask and is applied to each of the one or more acquired aerial images to calculate respective EPD of the potential defect therein; and filtering the potential defect as a “runtime true” defect when the calculated statistic-based EPD exceeds a predefined EPD threshold, and filtering out the potential defect as a “false” defect when the calculated statistic-based EPD is lower than the predefined EPD threshold. The method can further comprise after-runtime EPD-based filtering of the plurality of “runtime true” defects.

Abstract: A method for compensating a design image of a workpiece and a system for processing the design image of the workpiece are disclosed. The method includes the following steps. Obtaining a real image of the workpiece, with the real image having registration holes. Calculating a slope value for each of the registration holes. Determining an amount of interpolation points between each two neighboring registration holes of the registration holes according to the slope value corresponding to each of the registration holes. Obtaining positions of control points in blocks formed by the registration holes. Compensating the design image of the workpiece according to positions of the registration holes, positions of the plurality of interpolation points and the positions of the control points for generating a mapping image. Outputting the mapping image adapted to be mapped onto the workpiece. The system, together with the method, will be introduced.

Abstract: Provided is an analysis method for a crack rate of an electrode active material of an electrode, comprising the steps of: forming an electrode including an electrode active material, a binder, and a conductive material; impregnating the electrode with a resin and visualizing material regions including the electrode active material, the binder, and the conductive material which are included in the electrode, and a pore region; cutting the electrode and forming an electrode cross-section sample; photographing a cross section of the electrode cross-section sample using a scanning electron microscope and obtaining a cross-sectional image; performing primary image processing on the cross-sectional image and extracting total surface area pixels of the electrode active material; performing secondary image processing on the cross-sectional image and extracting total boundary pixels of the electrode active material; and calculating a crack rate of the electrode active material of the electrode in the cross-sectional i

Abstract: The disclosure provides a method for defect classification, including: extracting a low-level feature of a defect region from a defect image; encoding the low-level feature by using a defect dictionary to obtain a middle-level semantic feature corresponding to the low-level feature; classifying a defect in the defect region of the defect image into one of a plurality of defect categories based on the middle-level semantic feature, wherein the defect dictionary includes a defect intra-category dictionary and a defect inter-category dictionary.

Abstract: A representation of the electronic component to be mounted according to a production program is displayed so as to be superimposed on the image of the mounting area on the display device, and the production program is edited so that a mounting orientation of the electronic component matches an orientation of the pad pattern, in a case where the mounting orientation of the electronic component designated in the production program does not match the orientation of the pad pattern in the mounting area when an operator looks at the representation of the electronic component displayed so as to be superimposed on the image of the mounting area on the display device.