Abstract: A method for operating a memory system includes receiving thermal data indicating a temperature at addresses in a memory array, and a write request associate with data. An address of the write request is decoded. It is determined whether a temperature at the address of the write request is above a threshold temperature. The data is sent to a short latency write queue responsive to determining that the temperature is not above the threshold temperature.

Abstract: A memory device may be provided. The memory device may include an active control section configured to output a row active signal in response to a refresh signal when an active signal is activated. The memory device may include a refresh management section configured to control the refresh signal to skip a refresh operation for an unused row address in response to a refresh command signal and a refresh skip signal, and output an active row address for controlling the refresh operation. The memory device may include a memory section configured to perform a refresh operation for only an area of a cell array corresponding to a used row address in response to the row active signal and the active row address.

Abstract: A nonvolatile memory device includes a first resistive memory cell connected to a first word line, a second resistive memory cell connected to a second word line that is different from the first word line, a clamping unit connected between a sensing node and a reference current supplying unit connected to the second resistive memory cell to supply a reference current, and a sense amplifier connected to the sensing node to sense a level change of the sensing node, wherein when the first word line is enabled, the second word line is disabled.

Abstract: According to an embodiment, a semiconductor device includes a substrate, a connector, a volatile semiconductor memory element, multiple nonvolatile semiconductor memory elements, and a controller. A wiring pattern includes a signal line that is formed between the connector and the controller and that connects the connector to the controller. On the opposite side of the controller to the signal line, the multiple nonvolatile semiconductor memory elements are aligned along the longitudinal direction of the substrate.

Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to preserve states of memory elements in association with data operations using variable access signal magnitudes for other memory elements, such as implemented in third dimensional memory technology. In some embodiments, a memory device can include a cross-point array with resistive memory elements. An access signal generator can modify a magnitude of a signal to generate a modified magnitude for the signal to access a resistive memory element associated with a word line and a subset of bit lines. A tracking signal generator is configured to track the modified magnitude of the signal and to apply a tracking signal to other resistive memory elements associated with other subsets of bit lines, the tracking signal having a magnitude at a differential amount from the modified magnitude of the signal.

Abstract: A circuit for implementing a write operation of a memory is described. The circuit comprises a data line buffer coupled to a data line and an inverted data line for writing data; a plurality of memory elements, each memory element having a first node coupled to the data line and a second node coupled to the inverted data line; and a write assist circuit having a first node coupled to data line and a second node coupled to the inverted data line, wherein the write assist circuit comprises a pair of pull-down transistors comprising first pull-down transistor coupled to the first node of an amplifier portion and a second pull-down transistor coupled to a second node of the amplifier portion, and a pair of pull-up transistors comprising a first pull-up transistor coupled to the first node of the amplifier portion and a second pull-up transistor coupled to the second node of the amplifier portion. A method of implementing a write operation of a memory of a memory is also described.

Abstract: There is provided, for example, a write assist circuit for controlling the voltage level of a memory cell power supply line coupled to an SRAM memory cell to be written in the write operation. The write assist circuit reduces the voltage level of the memory cell power supply line to a predetermined voltage level, in response to a write assist enable signal that is enabled in the write operation. At the same time, the write assist circuit controls the reduction speed of the voltage level of the memory cell power supply line, according to the pulse width of a write assist pulse signal. The pulse width of the write assist pulse signal is defined in such a way that the greater the number of rows (or the longer the length of the memory cell power supply line), the greater the pulse width.

Abstract: Embodiments disclosed herein may relate to adjusting an aspect of a programming pulse for one or more memory cells, such as based at least in part on one or more detected programmed resistance values for the one or more memory cells.

Abstract: A storage device according to an embodiment includes: first and second magnetic elements each including: a reference layer connected to a third terminal; a first magnetic layer including first through third magnetic regions; a nonmagnetic layer; a second magnetic layer connected to a first terminal and the first magnetic region; and a third magnetic layer connected to a second terminal and the third magnetic region; a first inverter including a p-channel first transistor, an n-channel second transistor, a first input terminal connected to the second terminal of the second magnetic element, and a first output terminal connected to the first terminal of the first magnetic element; and a second inverter including a p-channel third transistor, an n-channel fourth transistor, a second input terminal connected to the second terminal of the first magnetic element, and a second output terminal connected to the first terminal of the second magnetic element.

Abstract: Disclosed is a content addressable memory (CAM). The content addressable memory array includes a memory array and a data match module. The memory array includes multiple memory rows. Each memory row is configured to store a first data word and a second data word. The data match module includes a first match circuitry configured to compare a first match word to the first data word of a memory row, and to generate a first match output based on the comparison between the first match word and the first data word of the memory row. The data match module further includes a second match circuitry configured to compare a second match word to the second data word of the memory row, and to generate a second match output based on the comparison between the second match word and the second data word of the memory row.

Abstract: A semiconductor memory apparatus includes a first mat, a second mat, a column driver, and a connection circuit. The first mat may include a first mat column line. The second mat may include a second mat column line. The column driver may drive the first mat column line in response to a mat selection signal and a column decoding signal. The connection circuit may electrically couple or separate the second mat column line to or from the first mat column line in response to the mat select signal.

Abstract: Techniques and mechanisms to provide write access to a memory device. In an embodiment, a memory controller sends commands to a memory device which comprises multiple memory banks. The memory controller further sends a signal specifying that the commands include back-to-back write commands each to access the same memory bank. In response to the signal, the memory device buffers first data of a first write command, wherein the first data is buffered at least until the memory device receives second data of a second write command. Error correction information is calculated for a combination of the first data and second data, and the combination is written to the memory bank. In another embodiment, buffering of the first data and combining of the first data with the second data is performed, based on the signal from the memory controller, in lieu of read-modify-write processing of the first data.

Abstract: A channel controlling device includes: a multiplexing circuit coupled to a plurality of channels for selecting a specific channel from the channels to output a channel data according to a selecting signal, wherein the channels correspond to a plurality of predetermined digital numbers; a sorting circuit arranged to queue the predetermined digital numbers to form a plurality of queued digital numbers according to a data output order of the channels; and an arbitration circuit, arranged to determine the selecting signal according to the plurality of queued digital numbers.

Abstract: The present disclosure relates to apparatus, systems, and methods that address the migration of least significant in memory cells due to inter-cell interference (ICI). The disclosed embodiments include a control unit that is configured to characterize the vulnerability of memory cells to ICI, and appropriately encode data stored in the vulnerable memory cells to address ICI. This encoding scheme, referred to as “stuck-at” encoding scheme, can be separate from the generic error correcting code encoding. The stuck-at encoding scheme can decrease the bit error rate of flash memory devices.

Abstract: A data reception chip coupled to an external memory including a first input-output pin configured to output first data and including a comparison module and a voltage generation module is provided. The comparison module is coupled to the first input-output pin to receive the first data and to compare the first data with a first reference voltage to identify the value of the first data. The voltage generation module is configured to generate the first reference voltage. The voltage generation module includes a first resistor and a second resistor. The second resistor is connected to the first resistor in series. The first and second resistors divide a first operation voltage to generate the first reference voltage.

Abstract: A word line divider which has a simplified circuit structure and can operate stably is provided. A storage device which has a simplified circuit structure and can operate stably is provided. A transistor whose leakage current is extremely low is connected in series with a portion between a word line and a sub word line so that the word line divider is constituted. The transistor can include an oxide semiconductor for a semiconductor layer in which a channel is formed. Such a word line divider whose circuit structure is simplified is used in the storage device.

Abstract: A method performed at a data storage device includes adjusting a first read voltage and a second read voltage to form sets of read voltages. First representations of data are read from a logical page in the non-volatile memory according to the sets of read voltages. The first representations of the data correspond to multiple values of the first read voltage and the second read voltage. The first representations of the data are stored in a memory and second representations of the data are generated based on the first representations. A value of the first read voltage is selected based on syndrome weights corresponding to the second representations.

Abstract: A non-volatile memory device and a method of programming a non-volatile memory device including a plurality of memory cells that are stacked in a vertical direction over a substrate and connected to n word lines, wherein n is an integer greater than or equal to 3. The method includes programming memory cells of second to n?1-th word lines, from among first to n-th word lines that are sequentially disposed in the vertical direction over the substrate, to a multi-level state, wherein a multi-level program operation is sequentially performed from the second to n?1-th word lines in an order in which the word lines are disposed; and programming memory cells of the first word line to a single level state after the programming memory cells of the second to n?1-th word lines to a multi-level state.

Abstract: The disclosed technology relates to a memory device configured to perform multiple access operations in response to a single command received through a memory controller and a method of performing the multiple access operations. In one aspect, the memory device includes a memory array comprising a plurality of memory cells and a memory controller. The memory controller is configured to receive a single command which specifies a plurality of memory access operations to be performed on the memory array. The memory controller is further configured to cause the specified plurality of memory access operations to be performed on the memory array.

Abstract: Embodiments include apparatuses, methods, and systems related to an assist circuit that may be coupled to one or more components of a memory system to selectively lower a supply voltage that is delivered to the component. For example, the assist circuit may be coupled to a plurality of bitcells (e.g., register file bitcells). The assist circuit may selectively lower the supply voltage delivered to the bitcells during at least a portion of a write operation and/or during an inactive state of the bitcells. Additionally, or alternatively, the assist circuit may be coupled to a read circuit to selectively lower the supply voltage delivered to the read circuit during an inactive state of the read circuit. The assist circuit may include a control transistor coupled in parallel with one or more diodes between a main supply rail and a supply node of the bitcells and/or read circuit.