Patents Examined by Srinivas Sathiraju
  • Patent number: 11756773
    Abstract: A plasma processing apparatus includes a balun having a first input terminal, a second input terminal, a first output terminal, and a second output terminal, a vacuum container, a first electrode electrically connected to the first output terminal, a second electrode electrically connected to the second output terminal, and a connection unit configured to electrically connect the vacuum container and ground, the connection unit including an inductor.
    Type: Grant
    Filed: October 28, 2021
    Date of Patent: September 12, 2023
    Assignee: CANON ANELVA CORPORATION
    Inventors: Kazunari Sekiya, Masaharu Tanabe, Tadashi Inoue, Hiroshi Sasamoto, Tatsunori Sato, Nobuaki Tsuchiya
  • Patent number: 11758640
    Abstract: Methods and systems are provided for plasma confinement utilizing various electrode and valve configurations. In one example, a device includes a first electrode positioned to define an outer boundary of an acceleration volume, a second electrode arranged coaxially with respect to the first electrode and positioned to define an inner boundary of the acceleration volume, at least one power supply to drive an electric current along a Z-pinch plasma column between the first second electrodes, and a set of valves to provide gas to the acceleration volume to fuel the Z-pinch plasma column, wherein an electron flow of the electric current is in a first direction from the second electrode to the first electrode. In additional or alternative examples, a shaping part is conductively connected to the second electrode to, in a presence of the gas, cause a gas breakdown of the gas to generate a sheared flow velocity profile.
    Type: Grant
    Filed: June 15, 2022
    Date of Patent: September 12, 2023
    Assignee: ZAP ENERGY, INC.
    Inventors: Uri Shumlak, Brian A. Nelson, Eric T. Meier
  • Patent number: 11749502
    Abstract: A pulse modulation system of a radio frequency (RF) power supply includes a modulation output circuit and a frequency adjustment circuit. The modulation output circuit is configured to modulate an output signal of the RF power supply and output a pulse modulation RF signal. Each pulse cycle of the pulse modulation RF signal includes a pulse-on phase and a pulse-off phase. An overshoot sub-phase is set in an initial preset time of the pulse-on phase. The frequency adjustment circuit is electrically connected to the modulation output circuit. The frequency adjustment circuit is configured to adjust an RF frequency of the pulse modulation RF signal of the overshoot sub-phase to cause a reflected power of the overshoot sub-phase to satisfy a preset reflected power or a reflected coefficient to satisfy a preset reflected coefficient.
    Type: Grant
    Filed: November 11, 2020
    Date of Patent: September 5, 2023
    Assignee: BEIJING NAURA MICROELECTRONICS EQUIPMENT CO., LTD.
    Inventors: Gang Wei, Jing Wei, Jing Yang
  • Patent number: 11746594
    Abstract: The method comprises determining that the clear day exists in response to the apparent diameter of the solar disc being similar to the expected diameter of the solar disc on the clear day and determining that an overcast condition exists in the camera image in response to the apparent diameter of the solar disc being distorted. The method may further include receiving a camera image of a sky section from a camera at a first location; segmenting the camera image into a first portion around a known position of a solar disc and a second portion of the remainder of the sky section containing an horizon; determining that the solar disc is obstructed by the horizon; and establishing that the first location is experiencing shadow conditions based on the determining.
    Type: Grant
    Filed: November 10, 2021
    Date of Patent: September 5, 2023
    Assignee: MECHOSHADE SYSTEMS, LLC
    Inventors: Stephen P. Hebeisen, Alex Greenspan
  • Patent number: 11742183
    Abstract: A plasma processing apparatus includes: a processing container; an electrode that places a substrate thereon within the processing container; a plasma generation source that supplies plasma into the processing container; a bias power supply that supplies bias power to the electrode; a part exposed to the plasma in the processing container; a DC power supply that supplies a DC voltage to the part; a controller that executes a process including a first control procedure in which a first state in which the DC voltage has a first voltage value and a second state in which the DC voltage has a second voltage value higher than the first voltage value are periodically repeated, and the first voltage value is applied in a partial period in each cycle of a potential of the electrode, and the second voltage value is applied such that the first state and the second state are continuous.
    Type: Grant
    Filed: November 19, 2021
    Date of Patent: August 29, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Ryuji Hisatomi, Chishio Koshimizu, Michishige Saito
  • Patent number: 11744001
    Abstract: Methods and systems are provided for plasma confinement utilizing various electrode and valve configurations. In one example, a device includes a first electrode positioned to define an outer boundary of an acceleration volume, a second electrode arranged coaxially with respect to the first electrode and positioned to define an inner boundary of the acceleration volume, at least one power supply to drive an electric current along a Z-pinch plasma column between the first second electrodes, and a set of valves to provide gas to the acceleration volume to fuel the Z-pinch plasma column, wherein an electron flow of the electric current is in a first direction from the second electrode to the first electrode. In additional or alternative examples, a shaping part is conductively connected to the second electrode to, in a presence of the gas, cause a gas breakdown of the gas to generate a sheared flow velocity profile.
    Type: Grant
    Filed: June 15, 2022
    Date of Patent: August 29, 2023
    Assignee: ZAP ENERGY, INC.
    Inventors: Eric T. Meier, Brian A. Nelson, Uri Shumlak
  • Patent number: 11742182
    Abstract: A control method of a plasma processing apparatus including a first electrode that places a workpiece thereon includes supplying a bias power to the first electrode, and supplying a source power having a frequency higher than that of the bias power into a plasma processing space. The source power has a first state and a second state. The control method further includes a first control process of alternately applying the first state and the second state of the source power in synchronization with a signal synchronized with a cycle of a radio frequency of the bias power, or a phase within one cycle of a reference electrical state that represents any one of a voltage, current, and electromagnetic field measured in a power feeding system of the bias power.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: August 29, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Chishio Koshimizu, Taichi Hirano, Toru Hayasaka, Shinji Kubota, Koji Maruyama, Takashi Dokan
  • Patent number: 11742181
    Abstract: A control method of a plasma processing apparatus including a first electrode that places a workpiece thereon includes supplying a bias power to the first electrode, and supplying a source power having a frequency higher than that of the bias power into a plasma processing space. The source power has a first state and a second state. The control method further includes a first control process of alternately applying the first state and the second state of the source power in synchronization with a signal synchronized with a cycle of a radio frequency of the bias power, or a phase within one cycle of a reference electrical state that represents any one of a voltage, current, and electromagnetic field measured in a power feeding system of the bias power.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: August 29, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Chishio Koshimizu, Taichi Hirano, Toru Hayasaka, Shinji Kubota, Koji Maruyama, Takashi Dokan
  • Patent number: 11737202
    Abstract: Embodiments of the disclosed technology provide an apparatus for controlling a standing wave linear accelerator. An example standing wave linear accelerator includes an accelerating tube, a motor, and a microwave power source connected between the accelerating tube and the motor. An example apparatus includes a main processor configured to receive an envelope signal of a reflected wave signal output by the accelerating tube, determine whether an amplitude of the envelope signal is greater than an envelope threshold, and if it is determined that the amplitude of the envelope signal is less than the envelope threshold, determine whether to change a rotation direction of the motor by comparing the amplitude of the envelope signal with an envelope reference signal stored in a memory. The memory is connected to the main processor and is configured to store the envelope threshold and the envelope reference signal.
    Type: Grant
    Filed: December 23, 2020
    Date of Patent: August 22, 2023
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Yaohong Liu, Jinsheng Liu, Wei Jia, Wei Yin, Feng Gao, Xiying Liu, Haokun Wang
  • Patent number: 11705308
    Abstract: There is provision of a plasma processing apparatus including a processing vessel, a first member provided in the processing vessel, and a second member provided outside the first member. In at least one of the first member and the second member, a gas flow passage is formed, and the gas flow passage is configured to cause a gas to flow into a gap between the first member and the second member.
    Type: Grant
    Filed: November 2, 2020
    Date of Patent: July 18, 2023
    Assignee: Tokyo Electron Limited
    Inventors: Shintaro Ikeda, Hidetoshi Hanaoka, Naoki Tamaru
  • Patent number: 11699575
    Abstract: An electron cyclotron resonance (ECR) thruster includes a magnetic field source configured to generate a magnetic field, a thruster body that defines a chamber, the thruster body being disposed relative to the magnetic field source such that the magnetic field is present in the chamber and such that a magnetic nozzle is established, an antenna configured to propagate radio frequency (RF) power within the chamber, and a waveform generator coupled to the antenna to generate an RF waveform for the RF power. The waveform generator is configured such that the RF waveform includes multiple frequencies.
    Type: Grant
    Filed: September 16, 2020
    Date of Patent: July 11, 2023
    Assignee: The Regents of the University of Michigan
    Inventors: Benjamin Alexander Jorns, Benjamin Natan Wachs
  • Patent number: 11698191
    Abstract: An ignition method of a plasma chamber includes steps of: (a) starting softly an ignition voltage to a first voltage, (b) decreasing the magnitude of the ignition voltage to a second voltage after a first ignition time, (c) increasing the magnitude of the ignition voltage to the first voltage after a second ignition time, and (d) repeating the step (b) and the step (c) until the ignition is successful.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: July 11, 2023
    Assignee: DELTA ELECTRONICS, INC.
    Inventors: Kun-Han Yang, Chin-Chang Kuo, Wei-Hsun Lai
  • Patent number: 11696387
    Abstract: A plasma generating device includes: a supply module for supplying gas; a handset for generating plasma from the supplied gas; and a control module attachable to or detachable from the supply module, wherein the plasma generating device switches to a button control mode or a dial control mode depending on the manner in which the handset is connected to the control module and the supply module.
    Type: Grant
    Filed: October 15, 2021
    Date of Patent: July 4, 2023
    Assignee: FEMTO SCIENCE INC
    Inventors: Moo Hwan Kim, Yeon Sook Chang
  • Patent number: 11696388
    Abstract: A system for generating and delivering a low temperature, wide, partially ionized tunable plasma stream is described. The system employs a fast rising, repetitive high voltage pulse generator, flowing gas, and a plasma head to produce the described atmospheric pressure plasma stream and its associated active species. The plasma head may have an exit slit with a relatively wide dimension to produce a relative wide plasma stream. Electrodes may be located proximate the exit slit, for example one in an interior of the plasma head via with gas flows toward the exit slit, and the other exterior to the plasma head and offset from the exit slit. The plasma may include baffle material to enhance a uniformity of flow through and across the exit slit. Plasma heads with having exit slit with different widths may be provided as a kit.
    Type: Grant
    Filed: April 29, 2020
    Date of Patent: July 4, 2023
    Assignee: TRANSIENT PLASMA SYSTEMS, INC.
    Inventors: Ryan J. Umstattd, Jason M. Sanders, Mark Thomas, Patrick Ford, Daniel Singleton
  • Patent number: 11690161
    Abstract: A hollow cathode apparatus includes an outer tubular dielectric barrier circumferentially surrounding an outer tubular surface of the cathode tube, the outer tubular dielectric barrier being composed of a barrier material which is electrically non-conductive. Also disclosed is a system comprising the hollow cathode apparatus, an anode which is spaced from the output end of the tubular cathode, and electrical circuitry connected between the cathode tube and the anode for connection to a source of electrical power for providing an electrical potential between the cathode and anode to cause an electric current to pass from the emitter into the input gas to form a plasma which is then output through the output end of the cathode tube to form a plasma plume.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: June 27, 2023
    Assignee: University of Southampton
    Inventors: Alexander Joey Nikolaos Daykin-Iliopoulos, Stephen Bernard Gabriel, Igor Golosnoy
  • Patent number: 11676800
    Abstract: A substrate processing apparatus includes a substrate stage on which a substrate is disposed, a first radio-frequency power supply configured to supply first radio-frequency power having a first frequency to the substrate stage, an impedance converter configured to convert an impedance on a load side seen from the first radio-frequency power supply into a set impedance, a second radio-frequency power supply configured to supply second radio-frequency power having a second frequency lower than the first frequency to the substrate stage, and a controller configured to control the set impedance of the impedance converter, and the controller sets the set impedance according to a substrate processing.
    Type: Grant
    Filed: April 27, 2021
    Date of Patent: June 13, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Ikko Tanaka, Lifu Li, Hiroshi Tsujimoto, Atsushi Terasawa
  • Patent number: 11670484
    Abstract: Various RF plasma systems are disclosed that do not require a matching network. In some embodiments, the RF plasma system includes an energy storage capacitor; a switching circuit coupled with the energy storage capacitor, the switching circuit producing a plurality of pulses with a pulse amplitude and a pulse frequency, the pulse amplitude being greater than 100 volts; a resonant circuit coupled with the switching circuit. In some embodiments, the resonant circuit includes: a transformer having a primary side and a secondary side; and at least one of a capacitor, an inductor, and a resistor. In some embodiments, the resonant circuit having a resonant frequency substantially equal to the pulse frequency, and the resonant circuit increases the pulse amplitude to a voltage greater than 2 kV.
    Type: Grant
    Filed: April 15, 2021
    Date of Patent: June 6, 2023
    Assignee: Eagle Harbor Technologies, Inc.
    Inventors: James Prager, Timothy Ziemba
  • Patent number: 11670489
    Abstract: Embodiments disclosed herein include a source for a processing tool. In an embodiment, the source comprises a dielectric plate having a first surface and a second surface opposite from the first surface, and a cavity into the first surface of the dielectric plate. In an embodiment, the cavity comprises a third surface that is between the first surface and the second surface. In an embodiment, the source further comprises a dielectric resonator extending away from the third surface.
    Type: Grant
    Filed: June 17, 2021
    Date of Patent: June 6, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Joseph F. AuBuchon, James Carducci, Larry D. Elizaga, Richard C. Fovell, Philip Allan Kraus, Thai Cheng Chua
  • Patent number: 11670488
    Abstract: A method of detecting plasma asymmetry in a radio frequency plasma processing system, the method including providing a radio frequency power to a reaction chamber having an approximate chamber symmetry axis and receiving from a plurality of broadband electromagnetic sensors a radio frequency signal. The method also including processing the radio frequency signals using Fourier analysis and determining based on the Fourier analysis of the radio frequency signals that a plasma asymmetry has occurred within the reaction chamber.
    Type: Grant
    Filed: January 8, 2021
    Date of Patent: June 6, 2023
    Assignee: COMET TECHNOLOGIES USA, INC.
    Inventors: Stephen E. Savas, Alexandre De Chambrier
  • Patent number: 11665809
    Abstract: A high-frequency power circuit includes a first antenna circuit and a second antenna circuit that are connected in parallel to a matching box connected to a high-frequency power supply. The first antenna circuit include a first antenna, a first distribution capacitor, and a first variable capacitor. The second antenna circuit includes a second antenna, a second distribution capacitor, and a second variable capacitor. A controller sets a capacitance of the first variable capacitor based on a detection result of a phase difference between current and voltage in a series-connected portion of the first antenna and the first variable capacitor during plasma production to reduce this phase difference and sets a capacitance of the second variable capacitor based on a detection result of a phase difference between current and voltage in a series-connected portion of the second antenna and the second variable capacitor during plasma production to reduce this phase difference.
    Type: Grant
    Filed: August 24, 2021
    Date of Patent: May 30, 2023
    Assignee: ULVAC, INC.
    Inventors: Kenta Doi, Toshiyuki Nakamura