Patents Examined by Stanley J. Pruchnic, Jr.
  • Patent number: 6827488
    Abstract: A temperature measuring apparatus includes a releasable probe chamber for housing a thermometry probe in which the chamber is isolated from the remainder of the thermometry apparatus. Preferably, the probe chamber is releasably attached to the apparatus and causes engagement or disengagement of at least one control switch of the apparatus depending on whether a probe is being removed or inserted into the probe chamber.
    Type: Grant
    Filed: March 4, 2003
    Date of Patent: December 7, 2004
    Assignee: Welch Allyn, Inc.
    Inventors: Alan S. Knieriem, David E. Quinn, Thaddeus J. Wawro, John Lane
  • Patent number: 6827484
    Abstract: A cloud point monitoring device which includes thermal conductive surface, cooler, temperature sensor, detection volume, detection wall unit, fiber optic cables for transmitting light, lighter emitter, light detector, and a data acquisition and control unit. The cloud point monitoring device provides an instrument to accurately measure the cloud point of diesel fuel indicate the approximate level of crystallization in diesel fuel that has been chilled beyond its cloud point and indicate the approximate energy content of diesel fuel. The cloud point monitoring device design allows it to be made small enough to be mounted in a fuel system of a vehicle.
    Type: Grant
    Filed: July 9, 2002
    Date of Patent: December 7, 2004
    Inventors: Charles Y. Tsang, Gordon S. Y. Chiu
  • Patent number: 6824306
    Abstract: A test apparatus and method of its use for evaluating various performance aspects of a test specimen is disclosed. A chamber within a housing contains a cold mass tank with a contact surface in contact with a first surface of a test specimen. The first surface of the test specimen is spaced from the second surface of the test specimen by a thickness. The second surface of the test specimen is maintained at a desired warm temperature. The first surface is maintained at a constant temperature by a liquid disposed within the cold mass tank. A boil-off flow rate of the gas is monitored and provided to a processor along with the temperature of the first and second surfaces of the test specimen. The processor calculates thermal insulation values of the test specimen including comparative values for heat flux and apparent thermal conductivity (k-value). The test specimen may be placed in any vacuum pressure level ranging from about 0.01 millitorr to 1,000,000 millitorr with different residual gases as desired.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: November 30, 2004
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: James E. Fesmire, Stanislaw D. Augustynowicz
  • Patent number: 6821015
    Abstract: A sensor designed for measurement of conducted heat flux passing through a solid object consists of a thin film thermopile deposited on a planar substrate whose thermal properties match those of the solid object. The thermopile is protected by a thin rectangular plate made of the same material as the substrate. The sensor is imbedded in the solid object and measures the vector of heat flux along the thermopile axis with minimal distortion of the heat flow pattern. Applications include measurement of heat flux in casting molds, boiler tubes, well surveying instruments and laser weapons testing.
    Type: Grant
    Filed: January 25, 2002
    Date of Patent: November 23, 2004
    Inventors: Robert Hammer, Lawrence W. Langley
  • Patent number: 6820633
    Abstract: The present invention is to provide a thermally-sensitive safety device for gas tubing including a main body provided with an inlet, an outlet and a gas passage communicated with said inlet and said outlet, and a thermally-sensitive control valve mounted in the gas passage. The control valve has a ball, which is normally biased by a spring to stop against a thermally-sensitive member, and a bushing with through hole in alignment with the ball. The thermally-sensitive member melts while ambient temperature is higher than the melting point thereof, whereby said ball is biased by said spring to contact against and seal the through hole of the bushing such that the gas passage is blocked off.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: November 23, 2004
    Inventor: Chih-Hung Liu
  • Patent number: 6817754
    Abstract: A fuel freezing point monitoring device to monitor the freezing point of onboard fuel, especially aircraft fuel. The fuel freezing point monitoring device is capable of monitoring the phase transition or fluidity of the fuel to determine the freezing point of the fuel. The fuel freezing point monitoring device eliminates the freezing point assumption of onboard fuel by actually measuring the freezing point of the fuel. The pilot will have knowledge of the approximate freezing point of the composite onboard fuel and will no longer need to assume a conservative fuel freezing point value. Together with the en-route fuel temperature information provided by existing aircraft sensors, the pilot will have the information to ensure a safe flight and to operate the aircraft efficiently.
    Type: Grant
    Filed: April 16, 2002
    Date of Patent: November 16, 2004
    Inventors: Charles Tsang, Gordon S. Y. Chiu
  • Patent number: 6817755
    Abstract: The invention concerns a device (10) for measuring exchanges of amounts of heat in non-stationary operational conditions, including an elongated housing (11) having one measuring end (12) closed and one connecting end (13) and a central cavity (14). The central cavity (14) contains a measuring cell (15) and electrical connection members (13). The housing (11) is extended by a hollow finger (17) which contains partly at least the measuring cell (15) which consists of a sensitive heat flux measuring element (18) sandwiched between a first heat conducting component (19) and a second heat conducting component (20). The first heat conducting component (19) is in contact with at the least one surface of the said housing (11), and in the second heat conducting component (20) is insulated from the housing and constitutes a constant heat capacity.
    Type: Grant
    Filed: August 22, 2003
    Date of Patent: November 16, 2004
    Assignee: Thermoflux S.A.
    Inventor: Jean-Claude Padoy
  • Patent number: 6817760
    Abstract: A current probe transformer temperature monitoring method determines an initial transformer temperature of the current probe as a function of the winding resistance of the transformer. A relative temperature of the Hall Effect device is also determined as a function of resistance change of the Hall Effect device. The initial transformer temperature and the relative Hall Effect device temperature are combined to produce a continuous transformer temperature indicative of the temperature of the transformer. The current signal to the multi-turn winding is removed when the continuous transformer temperature exceeds a threshold temperature value and a visual indication may be provided.
    Type: Grant
    Filed: September 22, 2003
    Date of Patent: November 16, 2004
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Jonathan S. Dandy, Michael D. Stevens, Albert S. Crane, Jr.
  • Patent number: 6814485
    Abstract: A method and apparatus for monitoring a temperature on an integrated circuit that includes a thin gate oxide transistor. A temperature monitoring system that includes a thick gate oxide transistor is provided. The temperature monitoring system includes a temperature independent voltage generator, a temperature dependent voltage generator that includes a thick gate oxide transistor, and a quantifier operatively connected to the temperature independent voltage generator and temperature dependent voltage generator.
    Type: Grant
    Filed: January 23, 2003
    Date of Patent: November 9, 2004
    Assignee: Sun Microsystems, Inc.
    Inventors: Claude R. Gauthier, Gin S. Yee
  • Patent number: 6799888
    Abstract: A test wafer for use in wafer temperature prediction is prepared. The test wafer includes: first semiconductor layer formed in a crystalline state; second semiconductor layer formed in an amorphous state on the first semiconductor layer; and light absorption film formed over the second semiconductor layer. Next, the test wafer is loaded into a lamp heating system and then irradiating the test wafer with a light emitted from the lamp, thereby heating the second semiconductor layer through the light absorption film. Thereafter, a recovery rate, at which a part of the second semiconductor layer recovers from the amorphous state to the crystalline state at the interface with the first semiconductor layer, is calculated. Then, a temperature of the test wafer that has been irradiated with the light is measured according to a relationship between the recovery rate and a temperature corresponding to the recovery rate.
    Type: Grant
    Filed: June 23, 2003
    Date of Patent: October 5, 2004
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Satoshi Shibata, Yuko Nambu
  • Patent number: 6799889
    Abstract: Circuits and methods for generating a temperature dependent signal are described involving: generating a thermal voltage referenced positive temperature coefficient signal using a pair of transistors operating at different current densities; generating a transistor voltage referenced negative temperature coefficient signal using a transistor voltage of one of said pair of transistors; and subtracting one of said positive and negative temperature coefficient signals from the other of said signals to generate said temperature dependent signal, whereby the temperature dependence of said temperature dependent signal is greater than either of said subtracted signals.
    Type: Grant
    Filed: October 7, 2002
    Date of Patent: October 5, 2004
    Assignee: Wolfson Microelectronics, Ltd.
    Inventor: John L. Pennock
  • Patent number: 6798706
    Abstract: A temperature sensor is integrated together with an integrated circuit on a chip, the sensor delivering a temperature-dependent measuring signal or at least emitting a signal when the chip temperature falls below a specific prescribed value. For such an eventuality, the chip includes a special circuit device thereon, by which a current flow is generated through a provided structure of electrical conductors that keeps the temperature of the integrated circuit above a prescribed minimum temperature.
    Type: Grant
    Filed: January 28, 2003
    Date of Patent: September 28, 2004
    Assignee: Infineon Technologies AG
    Inventors: Roland Barth, Alexander Benedix, Reinhard Düregger, Stephan Grosse
  • Patent number: 6796711
    Abstract: A contact measurement probe for measuring a temperature of a substrate in a process environment includes a probe head having a contact surface made of a ceramic material or a polymeric material for contacting the substrate. The contact measurement probe eliminates electrical biasing effects in process environments that include an ion source, thereby providing greater accuracy and reproducibility in temperature measurement.
    Type: Grant
    Filed: March 29, 2002
    Date of Patent: September 28, 2004
    Assignee: Axcelis Technologies, Inc.
    Inventors: Michael Bruce Colson, Aseem Kumar Srivastava
  • Patent number: 6796709
    Abstract: An infrared camera is configured to measure a temperature distribution on a surface of at least one rotating turbine bucket. With the measured surface temperature distribution, a condition index is determined which reflects either an overall condition of a bucket or a specific location on the bucket. The condition index can be used to predict the remaining useful life of a turbine bucket, which can be used to optimize maintenance intervals and thereby reduce maintenance costs.
    Type: Grant
    Filed: November 21, 2002
    Date of Patent: September 28, 2004
    Assignee: General Electric Company
    Inventor: Sukhwan Choi
  • Patent number: 6786636
    Abstract: A mechanism for removing probe covers from an ear thermometer includes a fastening portion, a connecting portion and a pushing portion. The fastening portion is mounted to the thermometer at a portion near the measuring probe. The connecting portion has one end connected to the fastening portion and the other end connected to the pushing portion. The pushing portion is located at rear end of the probe cover so that as the connecting portion or the pushing portion being pressed by user, the probe cover is removed from the probe.
    Type: Grant
    Filed: July 15, 2003
    Date of Patent: September 7, 2004
    Assignee: Norm Pacific Automation Corp.
    Inventors: Hung-Tsan Huang, Min-Teng Chu, Howard Lin
  • Patent number: 6781505
    Abstract: A temperature sensor includes a sensor tube and a sensor rod received in the sensor tube and having a thermal expansion coefficient which differs from a thermal expansion coefficient of the sensor tube. The sensor rod has one end, which is supported by a free end of the sensor tube, and another end, which forms an actuating element of a switching contact assembly. An insulating member at least partly surrounds the switching contact assembly and has an opening for passage of the sensor tube with accommodated sensor rod. Mounted to the insulating member in the area of the opening is a support plate which is connected at least indirectly to the sensor tube by a welding process such that an opening-surrounding wall portion of the insulating member is held in place.
    Type: Grant
    Filed: February 21, 2003
    Date of Patent: August 24, 2004
    Assignee: Electrovac, Fabrikation elektrotechnischer Spezialartikel Gesellschaft m.b.H.
    Inventor: Hans-Peter Morbitzer
  • Patent number: 6773158
    Abstract: In a method apparatus for measuring the temperature of a semiconductor substrate during processing thereof in a processing chamber, a resonant circuit formed on the substrate surface is energized by an electromagnetic field radiation device, and disturbances in the electromagnetic field are detected to determine the resonant frequency of the resonant circuit. The temperature of the substrate is determined as a function of the resonant frequency. The substrate is moved into and out of processing chamber by a transfer arm, and the radiation device is disposed on the transfer arm or mounted on the processing chamber. Multiple resonant circuits may be provided, which are energized by movement of the transfer arm, without transferring the substrate.
    Type: Grant
    Filed: August 14, 2002
    Date of Patent: August 10, 2004
    Assignee: Tokyo Electron Limited
    Inventor: Chishio Koshimizu
  • Patent number: 6770882
    Abstract: This invention is a micromachined sensor pixel structure that can be fabricated either as a discrete sensor or in array form with application to thermal sensing of radiation receive from various wavelength emitters. The transmissivity of a thermally-isolated microplatform is a sensitive function of temperature. This transmissivity is modulated by incident radiation from sources including infrared sources. The transmissivity of a micromachined structure is interrogated by means of an optical carrier. Readout is obtained by means of conventional silicon optical sensors or imagers. A multiplicity of micromachined pixels can be tailored for specific wavelengths permitting the array to operate as a multispectral imager with windows ranging from ultraviolet to millimeter wavelengths.
    Type: Grant
    Filed: January 14, 2002
    Date of Patent: August 3, 2004
    Assignee: Multispectral Imaging, Inc.
    Inventors: William Carr, Dadi Setiadi
  • Patent number: 6769804
    Abstract: A magnet is provided to a vibrating plate within a detection pipe unit and an electromagnet is placed opposite to the magnet with a slight gap therebetween. A drive circuit applies, to a coil at every predetermined measurement cycle, an alternating current at a frequency which is swept over a predetermined range centered at a resonance frequency of the vibrating plate. When the alternating current is applied, a phase comparison circuit detects a change in phase that is caused according to whether or not an object contacts the vibrating plate. A microcomputer determines presence/absence of the object based on the detected change in phase, measures the temperature based on the detected change in phase in a former half cycle of the predetermined measurement cycle and changes the swept frequency based on the result of measurement of the temperature in a latter half cycle of the predetermined cycle.
    Type: Grant
    Filed: June 16, 2003
    Date of Patent: August 3, 2004
    Assignee: Nohken Inc.
    Inventor: Hiroshi Kawakatsu
  • Patent number: 6767129
    Abstract: A microwave power sensor and a method for manufacturing the same. The microwave power sensor includes a semiconductor substrate with a nitride or oxide film formed thereon. A membrane which is a portion of the nitride or oxide film is floated by removing a portion of the semiconductor substrate. First and second thermocouple groups are formed to be symmetrically spaced apart from each other on the membrane. An RF input end is formed on the nitride or oxide film. A heating resistor is formed on the membrane to be connected with the RF input end. First and second ground plates are formed on the nitride or oxide film at both sides of the RF input end. A third ground plate is formed on the nitride or oxide film to be connected with the heating resistor and electrically connected with the first and second ground plates. The first and second output terminals are formed on the semiconductor substrate to be connected with the first and second thermocouple groups, respectively.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: July 27, 2004
    Assignee: Korea Electronics Technology Institute
    Inventors: Dae Sung Lee, Kyung Il Lee, Hak In Hwang