Abstract: A magnetic nanoparticle imaging system has driving coils driven at multiple frequencies, the driving coils positioned to provide magnetic fields and field gradients to an imaging zone, and a static bias field magnet positioned to provide a static magnetic field and/or field gradient to the imaging zone. Magnetic sensors are positioned to sense magnetic fields from the imaging zone, and a signal processor processes signals from the sensors to find at least signal magnitude and phase at harmonics and/or intermodulation products of the multiple frequencies. In embodiments, the signal processing apparatus also determines signal magnitudes and phase of at least second and third harmonics of the first frequency, and maps location of nanoparticles in the imaging zone based upon the magnitudes of harmonics and magnitudes of the intermodulation products.

Abstract: A car circuit tester that detects circuit is revealed. The car circuit tester is applied to circuit system and devices of cars for selective measurement of voltage and temperature. The car circuit tester includes a main machine, a sensing part, a processor and a screen. The processor is connected to screen circuit and circuit of the sensing part. The sensing part is in direct contact with an object to be detected and used for inputting voltage signals or temperature signals to the processor. After receiving the signals, the processor outputs parameters to the screen. The parameters are shown on or played through the screen.

Abstract: Systems and methods are described herein for creating a high isolation integrated current sensor whereby a portion of a current to be sensed by a magnetic field sensing circuit is split within the current sensor. The current sensor includes a primary conductor configured to carry a first portion of a primary current and a semiconductor substrate having a first surface and a second opposing surface. The first surface supports a magnetic field sensing circuit. The current sensor includes a first insulation layer disposed over the first surface, a conductive layer disposed over the first insulation layer and at least two interconnects coupled between the primary conductor and the conductive layer. A second portion of the primary current can flow through the conductive layer and the magnetic field sensing circuit is configured to sense the second portion of primary current.

Abstract: A ground fault monitoring system includes a ground fault interface device including a power interface and a data interface. The ground fault interface device is structured to output power via the power interface and to receive data via the data interface. The ground fault monitoring system also includes a plurality of ground fault devices structured to detect a ground fault on an associated circuit, to output data of the detected ground fault to the ground fault interface device, and to receive power to operate the ground fault devices via power lines. The plurality of ground fault devices are electrically connected in a series connection with the ground fault interface device by data lines and power lines. Each of the ground fault devices is configured to pass through received data and power.

Abstract: A method evaluates a defect region of a semiconductor substrate based on C-V characteristics of a MOS structure formed on the semiconductor substrate, including determining a relationship between defect region and flat band voltage or fixed charge density by using a semiconductor substrate having a known defect region, under a heat treatment condition and a C-V characteristic evaluating condition identical to conditions for evaluating a defect region of a semiconductor substrate to be evaluated, determining a flat band voltage or a fixed charge density of the semiconductor substrate to be evaluated from C-V characteristics of a MOS structure formed on the semiconductor substrate to be evaluated, and identifying the defect region of the semiconductor substrate to be evaluated based on the relationship between defect region and flat band voltage or fixed charge density previously determined, whereby the defect region of the semiconductor substrate is evaluated.

Abstract: A contactless electromagnetic sensor device for determining displacements of a rotor (120) is disclosed. Two sensing coils (612, 614) interact with surfaces of the rotor. A bridge circuit is formed by the sensing coils and by two secondary windings (212, 213) of an input transformer (210). The primary winding of the input transformer receives an excitation signal. An output signal is obtained at an output tap formed by a common node between the sensing coils (612, 614) and a common node between the secondary windings of the input transformer. In this manner excitation and detection are separated. If cables are used for connecting the bridge circuit to signal processing circuitry, the input and output impedances of the bridge circuit can be matched to the characteristic impedance of the cables. An output transformer can be connected to the output tap. The roles of the input and output transformers can be interchanged.

Abstract: A method of measuring semiconductor output characteristics is provided that includes connecting a pulse generator to the gate structure of a semiconductor device, and applying a plurality of voltage pulses at least some of which having a different pulse width to the gate structure of the semiconductor device. The average current is measured from the drain structure of the device for a duration of each pulse of the plurality of pulses. From the measured values for the average current, a self-heating curve of the average current divided by the pulse width is plotted as a function of the pulse width. The self-heating curve is then extrapolated to a pulse width substantially equal to zero to provide a value of drain current measurements without self-heating effects.

Abstract: A method and apparatus for magnetic sensing is described. The apparatus includes a strain-sensing fiber coupled to a conducting strip. The strain-sensing fiber may be, for example, a distributed feedback fiber with Bragg gratings. A current may be induced to flow on the conducting strip by electrically coupling a photodiode to the conducting strip and then activating a laser optically coupled to the photodiode. In the presence of a magnetic field, a Lorentz force will be exerted on the conducting strip, causing a displacement of the conducting strip that will induce strain on the strain-sensing fiber. The strain on the strain-sensing fiber may be measured by laser-pumping the strain-sensing fiber and measuring the reflected waves. The measured strain may be used to calculate the magnitude of the magnetic field. Multiple strain-sensing fibers may be optically coupled in series and deployed into a borehole for distributed magnetic field measurements.

Abstract: In a method and apparatus for recording MR signals with an image-recording sequence with which preparation gradients for preparing the MR signals are switched before the signal readout and readout gradients, in order to predominantly record the MR signal components with a desired signal coherence pathway in the readout segment, the signal components with an undesired signal coherence pathway are suppressed by dephasing gradients. The dephasing gradients are determined independently of the time intervals in which the preparation gradients are switched, and only in dependence on the effective size of the gradient moments of the preparation gradients.

Abstract: Embodiments set forth in this disclosure providing techniques for determining formation parameters, such as horizontal resistivity (Rh), vertical resistivity (Rv), and dip, in high angle and horizontal wells using non-directional resistivity measurements. For example, a method is provided that may include using an electromagnetic logging tool to acquire non-directional resistivity measurements in a wellbore of a high angle or horizontal well. The method may also include defining a processing window that corresponds to a measurement point of the electromagnetic logging tool along a well trajectory that intersects a at least one bed boundary between two layers of a subsurface formation. The method may also include defining a formation structure and defining an initial set of formation parameters for each layer in the formation structure. Furthermore, the method may include inverting the formation parameters for each layer.

Abstract: A sensor device for a motor vehicle including a control and evaluation circuit and at least one sensor electrode coupled therewith, wherein the sensor electrode is designed as a conductor loop, which is coupled to the control and evaluation circuit at two contacts. The control and evaluation circuit has a measurement circuit, which monitors the sensor electrode for capacitance changes. The control and evaluation circuit includes a testing circuit that can be activated intermittently, which tests the integrity of the sensor electrode and its coupling to the control and evaluation circuit. The testing circuit has a triggering mechanism that can be activated in order to intermittently couple a test capacitor to the sensor electrode, such that the measurement circuit also detects the capacitance of the test capacitor in addition to the capacitance of the sensor electrode.

Abstract: An apparatus for performing a scan test of IC chip includes a shift-frequency searching unit that executes first scan test for first scan pattern whole or part of which constituting first scan section and second scan test for second scan pattern whole or part of which constituting second scan section, and searches usable shift frequency for the second scan section. The first scan pattern is scan pattern inputted to scan path right before the second scan pattern. The shift-frequency searching unit shifts the first scan section to the scan path with first shift frequency in the first scan test, shifts the second scan section to the scan path with second shift frequency in the second scan test, and determines, when both results of the first scan test and the second scan test indicate pass, the second shift frequency as the usable shift frequency for the second scan section.

Abstract: A testing apparatus for testing a display apparatus includes a base substrate, a plurality of fixing tools on the base substrate to affix the display apparatus to the base substrate, the plurality of fixing tools being movable in a z-axis direction independently of each other, the z-axis direction extending along a normal direction to the base substrate, and a controller that controls the fixing tools to bend the display apparatus in two or more test patterns different from each other.

Abstract: A magnetic sensor includes a substrate, magnetoresistive effect elements arranged on a surface of the substrate, a first wiring line arranged on a surface of the substrate, an insulation layer configured to cover the magnetoresistive effect elements and the first wiring line, a soft magnetic body arranged on the insulation layer, and a second wiring line arranged on the insulation layer, wherein the magnetoresistive effect elements each extend in a first direction and are arranged while being separated from each other in a second direction orthogonal to the first direction in a case of viewing in plan the substrate, the soft magnetic body includes a first direction extension portion that extends in the first direction, and when viewed in plan, the first direction extension portion is arranged between the magnetoresistive effect elements, and the second wiring line is connected to the first wiring line.

Abstract: An RF peak-detector circuit can operate over a wide range and can compensate or correct an output voltage error term that depends on the thermal voltage and the input signal voltage. At or near a minimum value of the input signal voltage range, such compensation can include a scaled base-emitter ratioing of bipolar junction transistors used to generate the output voltage, each of which can be biased by a primary current. At or near a maximum value of the input signal voltage range, this can include using an auxiliary bias current circuit that can shift auxiliary bias current between these bipolar junction transistors. The auxiliary bias current circuit can include scaled bipolar junction transistors in a cross-coupled configuration and an equivalent resistance circuit between emitters of the cross-coupled BJTs. This can provide a robust approach for improving the accuracy of an RF peak-detector circuit over a wide range.

Abstract: A sensor device for suppressing a magnetic stray field, having a semiconductor body, a first pixel cell and a second pixel cell integrated into a surface of the semiconductor body together with a circuit arrangement. Each pixel cell has a first magnetic field sensor and a second magnetic field sensor to detect a magnetic field in the x-direction and a magnetic field in the y-direction. The first pixel cell is spaced apart from the second pixel cell along a connecting line, and the substrate and the semiconductor body are disposed in the same IC package. A magnet is provided that has a planar main extension surface in the direction of an x-y plane and has a magnetization with four magnetic poles in the direction of the x-y plane. The IC package is spaced apart from the main extension surface of the magnet in the z-direction and at least partially within a ring magnet.

Abstract: The present invention relates to a device for determining the characteristic impedance spectrum of a token such as a monetary coin, said device comprising: —a point impedance transducer having an inducing element for inducing an ultrasonic movement in the token and a sensing element for detecting the resistance of the token to that induced movement; —a closed system for housing said point impedance transducer; and processing means connected to the point impedance transducer for determining the characteristic impedance spectrum of said token. In particular, the present invention relates to testing whether a token or coin is genuine or a forgery, of sorting coins including from differing monetary systems and/or their denominations, and also providing a “fingerprint” for forged coins.

Abstract: A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display driver, the adhesive layer binding the glass panel with the display driver, the adhesive layer comprising conductive portions across the adhesive layer between the glass panel and the display driver, wherein the input node, the output node, the two test pads, and the conductive portions are electrically connected to form an electrical testing loop, the electrical testing loop configured to measure a voltage drop across the conductive portions.

Abstract: Devices and corresponding methods are provided to operate a hot cathode ionization pressure gauge (HCIG). A transistor circuit can be configured to pass the electron emission current with low input impedance and to control cathode bias voltage. Emission current and cathode bias voltage can be controlled independently of each other, without a servo settling time. HCIGs can be calibrated with respect to leakage current.

Abstract: The dry running detection system for a pump includes an ultrasonic transducer (8) designed for arrangement inside a pump housing (24) and electrically connected to a frequency generator (2) producing an electrical signal having a predefined frequency. An analyzing unit (10) of the system analyzes the electrical signal applied to the ultrasonic transducer (8) and is designed to detect whether the ultrasonic transducer (8) is in contact with a liquid or not on basis of the signal level of the electrical signal.