Patents Examined by Violeta A Prieto
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Patent number: 11933718Abstract: An optical system uses a sample medium disposed within an optical cavity, receives an input beam that may be non-coherent or coherent, and produces an optical energy from the input beam, by creating birefringent-induced beam components each cavity traversal, forming a mixed quantum state beam for the input beam. The mixed quantum state beam exits the cavity, and the energy distribution of the exiting beam is analyzed over a range of tuned input beam frequencies to uniquely identify circularly birefringent the materials within the sample medium, e.g., amino acids, proteins, or other circular birefringent molecules, biological or otherwise.Type: GrantFiled: November 18, 2019Date of Patent: March 19, 2024Inventor: Carol Y. Scarlett
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Patent number: 11920933Abstract: Techniques for reducing the bias error present in optical gyroscopes is disclosed. Such techniques include at least one path length adjustment member placed in an optical gyroscope resonator, which are configured to modulate the optical path length of the resonator so that bias errors attributable to the optical path length are shifted outside of the bandwidth of the optical gyroscope. In some embodiments, the at least one path length adjustment member includes a plurality of microheaters coupled to the resonator, in which case optical path length modulation is achieved by heating the resonator via the microheaters. Alternatively, a plurality of piezo-electric regions can be placed in the resonator, which enables optical path length modulation through electric field gradients applied to the piezo-electric regions.Type: GrantFiled: February 9, 2021Date of Patent: March 5, 2024Assignee: Honeywell International Inc.Inventors: Jianfeng Wu, Matthew Wade Puckett, Karl D. Nelson
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Patent number: 11885737Abstract: A method and system are presented for use in measuring on patterned samples, aimed at determining asymmetry in the pattern. A set of at least first and second measurements on a patterned region of a sample is performed, where each of the measurements comprises: directing illuminating light onto the patterned region along an illumination channel and collecting light reflected from the illuminated region propagating along a collection channel to be detected, such that detected light from the same patterned region has different polarization states which are different from polarization of the illuminating light, and generating a measured data piece indicative of the light detected in the measurement. Thus, at least first and second measured data pieces are generated for the at least first and second measurements on the same patterned region. The at least first and second measured data pieces are analyzed and output data is generated being indicative of a condition of asymmetry in the patterned region.Type: GrantFiled: December 28, 2020Date of Patent: January 30, 2024Assignee: Nova Ltd.Inventors: Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim Yachini, Matthew Sendelbach, Cornel Bozdog
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Patent number: 11874213Abstract: Aspects of the present disclosure include methods for adjusting sensitivity of a photodiode in a light detection system. Methods according to certain embodiments include detecting light with a light detection system having a photodiode and an amplifier, determining responsivity of the photodiode over a plurality of wavelengths of light and adjusting one or more parameters of the amplifier in response to the responsivity of the photodiode over the plurality of wavelengths of light. Systems (e.g., particle analyzers) having a light source and a light detection system that includes a photodiode and an amplifier for practicing the subject methods are also described. Non-transitory computer readable storage medium are also provided.Type: GrantFiled: March 15, 2021Date of Patent: January 16, 2024Assignee: BECTON, DICKINSON AND COMPANYInventors: Timothy W. Petersen, Pierce O. Norton, Henry Lankila, Eric D. Diebold
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Patent number: 11867629Abstract: A sensing system for monitoring a composition of a downhole fluid in a well, where the sensing system includes: a light source, an optical waveguide, an evanescent field sensing element that is indirect contact with a downhole fluid, and a detector. The light source is operable for emitting a beam and includes a frequency comb generator configured to modify at least a portion of the beam into a sensing comb beam. The evanescent field sensing element provides attenuated internal reflection of the sensing comb beam at the interface between the evanescent field sensing element and the downhole fluid, and the portion of the sensing comb beam interacts with the fluid to form at least a portion of an interacted beam. The detector obtains a spectral distribution of the interacted beam.Type: GrantFiled: March 30, 2021Date of Patent: January 9, 2024Assignee: SAUDI ARABIAN OIL COMPANYInventors: Adrian Cesar Cavazos Sepulveda, Damian Pablo San Roman Alerigi
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Patent number: 11860092Abstract: A covered chamberless particulate detector includes a chamberless detector configured to produce a signal when particulate sensing events occurs, one or more optical emitters configured to emit one or more emitting cones of light, one or more optical sensors defining one or more receiving cones and configured to detect occurrence of particulate sensing events, and a protective cover defining an inside region and an outside region. Each of the one or more emitting cones of light is configured to overlap with each of the one or more receiving cones, thereby creating one or more sensing volumes which may be in the inside region, the outside region, or both regions. The protective cover can be transparent, partially transparent, or opaque, and can include apertures. The optical emitters and detectors can use one or more wavelengths, allowing discrimination of various airborne particulates.Type: GrantFiled: September 8, 2021Date of Patent: January 2, 2024Assignee: Kidde Technologies, Inc.Inventors: David L. Lincoln, Michael J. Birnkrant, Kenneth Bell, Peter R. Harris, Jennifer M. Alexander
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Patent number: 11852590Abstract: A metrology system may include an imaging sub-system including one or more lenses and a detector to image a sample, where the sample includes metrology target elements on two or more sample layers. The metrology system may further include a controller to determine layer-specific imaging configurations of the imaging sub-system to image the metrology target elements on the two or more sample layers within a selected image quality tolerance, where each layer-specific imaging configuration includes a selected configuration of one or more components of the imaging sub-system. The controller may further receive, from the imaging sub-system, one or more images of the metrology target elements on the two or more sample layers generated using the layer-specific imaging configurations. The controller may further provide a metrology measurement based on the one or more images of the metrology target elements on the two or more sample layers.Type: GrantFiled: August 27, 2019Date of Patent: December 26, 2023Assignee: KLA CorporationInventors: Amnon Manassen, Daria Negri, Andrew V. Hill, Ohad Bachar, Vladimir Levinski, Yuri Paskover
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Patent number: 11828982Abstract: An optical array waveguide grating-type multiplexer and demultiplexer according to an embodiment of the present invention comprise: a first substrate, a plurality of first waveguides disposed on the first substrate to be superposed in the vertical direction, which is the thickness direction of the first substrate; a 1-1st cladding layer disposed between the first substrate and a 1-1st waveguide, which is nearest to the first substrate among the plurality of first waveguides; a 1-2nd cladding layer disposed between the plurality of first waveguides; and a 1-3rd cladding layer disposed on a 1-2nd waveguide, which is furthest from the first substrate among the plurality of first waveguides.Type: GrantFiled: March 2, 2021Date of Patent: November 28, 2023Assignee: LG INNOTEK CO., LTD.Inventors: Lee Im Kang, Chang Hyuck Lee
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Patent number: 11821838Abstract: Apparatus, systems, and methods associated with remote phase and amplitude spectroscopy in frequency, time, and position with correlated frequency combs are applicable in a variety of applications. Multiple beams can be generated from a single laser source, where, in the frequency domain, the multiple beams are frequency combs with equal repetition rates and shifted in frequency from each other. One or more of the multiple beams can be directed to interact with a sample with another one of the multiple beams used as a reference beam. The interaction can include transmission of one of the multiple beams as a signal beam through the sample, reflection of one of the multiple beams as a signal beam from the sample, or backscattering from the sample. Results from the interaction can be analyzed.Type: GrantFiled: June 1, 2021Date of Patent: November 21, 2023Inventors: Jean-Claude Diels, Ladan Arissian
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Patent number: 11823522Abstract: The present invention relates to a method, a sensor, a sensor unit and a bank-note processing machine for checking the completeness and/or authenticity of value documents. A value document comprises at least one machine-readable feature substance in at the least two locations. According to the method, the value document is excited at least locally at measuring locations. Furthermore, a feature intensity with respect to the machine-readable feature substance is captured location-resolved at several different locations of the value document. The location-based feature intensities are classified location-based with the help of a threshold value. Furthermore, location-based limits of a location distribution to be expected of the machine-readable feature substance are determined. Finally, a location-based distribution of the classified feature intensities is assessed.Type: GrantFiled: December 21, 2016Date of Patent: November 21, 2023Assignee: GIESECKE+DEVRIENT CURRENCY TECHNOLOGY GMBHInventors: Wolfgang Rauscher, Erich Kerst, Thomas Happ
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Patent number: 11815447Abstract: Disclosed are a femtosecond laser-based ultrasonic measuring apparatus for a 3D printing process, and a 3D printing system including the apparatus. The apparatus includes a femtosecond laser source for generating a femtosecond laser beam irradiated to inspect a state of a printing object formed by melting a base material by a printing laser beam irradiated from the laser source for 3D printing, a beam splitter for separating the femtosecond laser beam generated by the femtosecond laser source into a pump laser beam and a probe laser beam, an electric/acoustic optical modulator for modulating the pump laser beam, a time delay unit for delaying the probe laser beam, a photo detector for detecting the probe laser beam reflected by the printing object, and a lock-in amplifier for detect an amplitude and a phase of the output signal from the photo detector. The femtosecond laser source is disposed coaxially with a laser source for 3D printing.Type: GrantFiled: December 8, 2020Date of Patent: November 14, 2023Assignee: Korea Advanced Institute of Science and TechnologyInventors: Hoon Sohn, Peipei Liu
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Patent number: 11808929Abstract: A quantitative phase image generating method for a microscope, includes: irradiating an object with illumination light; disposing a focal point of an objective lens at each of a plurality of positions that are mutually separated by gaps ?z along an optical axis of the objective lens, and detecting light from the object; generating sets of light intensity distribution data corresponding to each of the plurality of positions based upon the detected light; and generating a quantitative phase image based upon the light intensity distribution data; wherein the gap ?z is set based upon setting information of the microscope.Type: GrantFiled: May 14, 2020Date of Patent: November 7, 2023Assignee: NIKON CORPORATIONInventors: Shota Tsuchida, Satoshi Ikeda
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Patent number: 11802796Abstract: Novel monolithic reflective spatial heterodyne spectrometers (SHS) interferometer systems are presented. Monolithic systems in accordance with the invention have a single supporting structure wherein input optics, output optics, a flat mirror, a roof mirror, and a symmetric grating are affixed. Embodiments of the invention contain only fixed parts, and the optics do not move in relation to the supporting structure. Embodiments of the present invention enables smaller, lighter, and more robust reflective SHS systems as compared to conventional interferometry. Additionally, embodiments of the present invention require less time and skill for construction and maintenance, and is a better economic option. Additional embodiments can include multiple interferometer systems in a single supporting structure.Type: GrantFiled: December 7, 2021Date of Patent: October 31, 2023Assignee: California Institute of TechnologyInventor: Seyedeh Sona Hosseini
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Patent number: 11747268Abstract: A method and system for authenticating an item includes irradiating the item, the item including a polymer substrate including a polymer material and a doping material and configured to emit a radiation spectrum having a spectral signature in response to the irradiating, the doping material capable of absorbing or scattering radiation at a specific wavelength to generate the spectral signature, detecting the spectral signature, and determining a code associated with the spectral signature.Type: GrantFiled: March 1, 2018Date of Patent: September 5, 2023Assignee: Spectra Systems CorporationInventor: Nabil Lawandy
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Patent number: 11747257Abstract: An apparatus for particle characterisation, comprising: a sample cell for holding a sample; a light source configured to illuminate the sample with an illuminating beam and a plurality of light detectors, each light detector configured to receive scattered light resulting from the interaction between the illuminating beam and the sample along a respective detector path, wherein each respective detector path is at substantially the same angle to the illuminating beam.Type: GrantFiled: June 23, 2021Date of Patent: September 5, 2023Assignee: Malvern Panalytical LimitedInventor: Jason Corbett
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Patent number: 11747277Abstract: An optical component for an interferometric imaging device, which comprises: an object arm, including a first planar waveguide and a first diffraction grating formed in the first planar waveguide and capable of extracting light from the object arm; a reference arm, comprising a second planar waveguide and a second diffraction grating formed in the second planar waveguide and capable of extracting light from the reference arm; wherein the optical component is configured such that, in use with an optically reflective surface extending parallel to the plane of the optical component between the object arm and the reference arm, at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm.Type: GrantFiled: December 20, 2021Date of Patent: September 5, 2023Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Cyrielle Monpeurt, Marine Beurrier-Bousquet, Mathieu Dupoy, Gabriel Jobert
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Patent number: 11733493Abstract: The present invention provides a camera optical lens, including, from an object side to an image side, a first lens having a positive refractive power, a second lens having a negative refractive power, a third lens having a positive refractive power, a fourth lens having a positive refractive power, and a fifth lens having a negative refractive power. The camera optical lens satisfies: ?2.00?f2/f??1.25; —1.50?f4/f5??0.80; 1.50?d6/d8?3.00; ?1.50?(R1+R2)/(R1?R2)??1.00; and 6.00?R9/R10?15.00. The camera optical lens has excellent optical performance while meeting the design requirements of a large aperture, a wide angle, and ultra-thinness.Type: GrantFiled: December 28, 2020Date of Patent: August 22, 2023Assignee: AAC Optics (Changzhou) Co., Ltd.Inventor: Yanan Wang
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Patent number: 11719638Abstract: The method of analyzing one or more samples arranged in sample receptacles of a platform that is configured to receive a plurality of separate samples includes the steps of measuring electromagnetic radiation transmitted or emitted by each sample, repeating the measurement a plurality of times at predetermined intervals, on the basis of each measurement, forming a result matrix comprising a plurality of cells, each cell of the result matrix corresponding to a sample receptacle of the plat-form, wherein a measurement value of each sample is used as an input for determining the visual properties of the respective cell in the result matrix, and displaying the results as consecutive matrixes in respect of time.Type: GrantFiled: June 27, 2018Date of Patent: August 8, 2023Assignee: Life Technologies Holdings PTE LTDInventors: Katja Eklin, Adyary Fallarero, Tommi Suvanto, Marika J. Raitio
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Patent number: 11717154Abstract: The present disclosure relates to an apparatus and method that can be used to remotely acquire high resolution depth resolved images from a sample. The apparatus employs an adapter to an imaging device, where the adapter uses a minimum of components to produce interferometry patterns on the input facet of the imaging device. The imaging device can be a bundle endoscope terminated on a camera sensor or on several camera sensors or simply a camera sensor. In conjunction with a swept source or a broadband source, at least one camera sensor may be employed to provide optical coherence tomography (OCT) images of the sample. When the imaging device uses a bundle of optical fibers, the apparatus and method can provide OCT images tolerant to bending of the bundle.Type: GrantFiled: July 25, 2019Date of Patent: August 8, 2023Assignee: University of KentInventors: Adrian Podoleanu, Manuel Marques, Michael Hughes
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Patent number: 11714049Abstract: The present invention includes a prism having a light incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a trapping body secured to the metal film. Excitation light is irradiated from an excitation light irradiation part onto an analysis chip installed in a chip holder, and excitation light reflected by the analysis chip is detected. The information outputted by the excitation light irradiation part is acquired.Type: GrantFiled: February 16, 2022Date of Patent: August 1, 2023Assignee: OTSUKA PHARMACEUTICAL CO., LTD.Inventors: Nobuhiro Yamauchi, Yuichi Kyogoku