Patents by Inventor A. Dazzi Dazzi

A. Dazzi Dazzi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High frequency deflection measurement of IR absorption
    Patent number: 8418538
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: April 16, 2013
    Assignee: Anasys Instruments Inc.
    Inventors: A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov, Craig Prater
  • High frequency deflection measurement of IR absorption
    Patent number: 8402819
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
    Type: Grant
    Filed: December 5, 2008
    Date of Patent: March 26, 2013
    Assignee: Anasys Instruments, Inc.
    Inventors: A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov, Craig Prater
  • High Frequency Deflection Measurement of IR Absorption
    Publication number: 20120050718
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: November 4, 2011
    Publication date: March 1, 2012
    Inventors: A. Dazzi Dazzi, Konstantin Vodopyanov, Clotilde Policar, M. Reading, Kevin Kjoller, Craig Prater
  • High frequency deflection measurement of IR absorption
    Publication number: 20110283428
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: July 18, 2011
    Publication date: November 17, 2011
    Inventors: A. Dazzi Dazzi, Kevin Kjoller, Rui Prazeres, Michael Reading
  • High frequency deflection measurement of IR absorption
    Publication number: 20090249521
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: December 5, 2008
    Publication date: October 1, 2009
    Inventors: A. Dazzi Dazzi, Konstantin Vodopyanov, Clotilde Policar, Mike Reading, Kevin Kjoller, Craig Prater
  • High frequency deflection measurement of IR absorption
    Publication number: 20080283755
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: May 15, 2007
    Publication date: November 20, 2008
    Inventors: A. Dazzi Dazzi, Rui Prazeres, Mike Reading, Kevin Kjoller