Patents by Inventor Aaron Couture
Aaron Couture has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11927551Abstract: Systems and methods for determining a mass of a crop by using at least one X-ray scanner is provided. The method includes obtaining at least two scan images of the crop, where a first of the at least two images is obtained along a first plane relative to the crop and a second of the at least two images is obtained along a second plane relative to the crop, and where the first plane is angularly displaced relative to the second plane, registering the first image and the second image, correcting the registered first and second images, and determining the mass of the crop from the corrected first and second images.Type: GrantFiled: November 21, 2022Date of Patent: March 12, 2024Assignee: American Science and Engineering, Inc.Inventors: Aaron Couture, Basak Oztan
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Publication number: 20230152249Abstract: Systems and methods for determining a mass of a crop by using at least one X-ray scanner is provided. The method includes obtaining at least two scan images of the crop, where a first of the at least two images is obtained along a first plane relative to the crop and a second of the at least two images is obtained along a second plane relative to the crop, and where the first plane is angularly displaced relative to the second plane, registering the first image and the second image, correcting the registered first and second images, and determining the mass of the crop from the corrected first and second images.Type: ApplicationFiled: November 21, 2022Publication date: May 18, 2023Inventors: Aaron Couture, Basak Oztan
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Patent number: 11536672Abstract: Systems and methods for determining a mass of a crop by using at least one X-ray scanner is provided. The method includes obtaining at least two scan images of the crop, where a first of the at least two images is obtained along a first plane relative to the crop and a second of the at least two images is obtained along a second plane relative to the crop, and where the first plane is angularly displaced relative to the second plane, registering the first image and the second image, correcting the registered first and second images, and determining the mass of the crop from the corrected first and second images.Type: GrantFiled: December 17, 2020Date of Patent: December 27, 2022Assignee: American Science and Engineering, Inc.Inventors: Aaron Couture, Basak Oztan
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Publication number: 20210223190Abstract: Methods for characterizing living plants, wherein one or more beams of penetrating radiation such as x-rays are scanned across the plant under field conditions. Compton scatter is detected from the living plant and processed to derive characteristics of the living plant such as water content, root structure, branch structure, xylem size, fruit size, fruit shape, fruit aggregate volume, cluster size and shape, fruit maturity and an image of a part of the plant. Ground water content is measured using the same technique. Compton backscatter is used to guide a robotic gripper to grasp a portion of the plant such as for harvesting a fruit.Type: ApplicationFiled: February 22, 2021Publication date: July 22, 2021Inventors: Aaron Couture, Calvin Adams, Rafael Fonseca, Jeffrey Schubert, Richard Mastronardi
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Publication number: 20210102907Abstract: Systems and methods for determining a mass of a crop by using at least one X-ray scanner is provided. The method includes obtaining at least two scan images of the crop, where a first of the at least two images is obtained along a first plane relative to the crop and a second of the at least two images is obtained along a second plane relative to the crop, and where the first plane is angularly displaced relative to the second plane, registering the first image and the second image, correcting the registered first and second images, and determining the mass of the crop from the corrected first and second images.Type: ApplicationFiled: December 17, 2020Publication date: April 8, 2021Inventors: Aaron Couture, Basak Oztan
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Patent number: 10955367Abstract: Methods for characterizing living plants, wherein one or more beams of penetrating radiation such as x-rays are scanned across the plant under field conditions. Compton scatter is detected from the living plant and processed to derive characteristics of the living plant such as water content, root structure, branch structure, xylem size, fruit size, fruit shape, fruit aggregate volume, cluster size and shape, fruit maturity and an image of a part of the plant. Ground water content is measured using the same technique. Compton backscatter is used to guide a robotic gripper to grasp a portion of the plant such as for harvesting a fruit.Type: GrantFiled: September 7, 2016Date of Patent: March 23, 2021Assignee: American Science and Engineering, Inc.Inventors: Aaron Couture, Calvin Adams, Rafael Fonseca, Jeffrey Schubert, Richard Mastronardi
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Patent number: 10712293Abstract: Methods for characterizing living plants, wherein one or more beams of penetrating radiation such as x-rays are scanned across the plant under field conditions. Compton scatter is detected from the living plant and processed to derive characteristics of the living plant such as water content, root structure, branch structure, xylem size, fruit size, fruit shape, fruit aggregate volume, cluster size and shape, fruit maturity and an image of a part of the plant. Ground water content is measured using the same technique. Compton backscatter is used to guide a robotic gripper to grasp a portion of the plant such as for harvesting a fruit.Type: GrantFiled: October 18, 2019Date of Patent: July 14, 2020Assignee: American Science and Engineering, Inc.Inventors: Aaron Couture, Calvin Adams, Rafael Fonseca, Jeffrey Schubert, Richard Mastronardi
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Publication number: 20200049635Abstract: Methods for characterizing living plants, wherein one or more beams of penetrating radiation such as x-rays are scanned across the plant under field conditions. Compton scatter is detected from the living plant and processed to derive characteristics of the living plant such as water content, root structure, branch structure, xylem size, fruit size, fruit shape, fruit aggregate volume, cluster size and shape, fruit maturity and an image of a part of the plant. Ground water content is measured using the same technique. Compton backscatter is used to guide a robotic gripper to grasp a portion of the plant such as for harvesting a fruit.Type: ApplicationFiled: October 18, 2019Publication date: February 13, 2020Inventors: Aaron Couture, Calvin Adams, Rafael Fonseca, Jeffrey Schubert, Richard Mastronardi
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Publication number: 20200033274Abstract: Methods for characterizing living plants, wherein one or more beams of penetrating radiation such as x-rays are scanned across the plant under field conditions. Compton scatter is detected from the living plant and processed to derive characteristics of the living plant such as water content, root structure, branch structure, xylem size, fruit size, fruit shape, fruit aggregate volume, cluster size and shape, fruit maturity and an image of a part of the plant. Ground water content is measured using the same technique. Compton backscatter is used to guide a robotic gripper to grasp a portion of the plant such as for harvesting a fruit.Type: ApplicationFiled: September 7, 2016Publication date: January 30, 2020Inventors: Aaron Couture, Calvin Adams, Rafael Fonseca, Jeffrey Schubert, Richard Mastronardi
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Publication number: 20190383953Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: ApplicationFiled: January 8, 2019Publication date: December 19, 2019Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Cristian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert, Aaron Couture, Jeffrey M. Denker, Jonathan Edward Everett
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Patent number: 10209372Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: GrantFiled: April 18, 2017Date of Patent: February 19, 2019Assignee: American Science and Engineering, Inc.Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Cristian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert, Aaron Couture, Jeffrey M. Denker, Jonathan Edward Everett
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Patent number: 9689997Abstract: An imaging system includes plural modular imaging detectors and a readout electronics unit. Each modular imaging detector includes pixels configured to collect imaging data, a substrate on which the pixels are disposed, and a mechanical interconnection feature. The mechanical interconnection feature is configured to cooperate with a corresponding mechanical interconnection feature of at least one other of the modular imaging detectors to directly join the modular imaging detector to the at least one other of the modular imaging detectors. The readout electronics unit is configured to be operably coupled to the modular imaging detectors and to receive signals corresponding to the imaging data from the modular imaging detectors.Type: GrantFiled: September 4, 2014Date of Patent: June 27, 2017Assignee: General Electric CompanyInventors: Nicholas Ryan Konkle, John Michael Sabol, James Michael Gent, Aaron Couture
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Publication number: 20170003401Abstract: A flexible x-ray detector and a method and system of using the same to acquire one or more x-ray images are disclosed. The flexible x-ray detector apparatus includes a curvature-fixing holder, which has a predetermined curvature. The curvature-fixing holder has a first end and a second end, which has a perimeter defining an internal slot or recess. The flexible detector is configured to be inserted into the recess of the curvature-fixing holder and follows the predetermined curvature of the recess. The flexible x-ray detector may further include a scintillator and a flexible substrate. A method of using a flexible x-ray detector apparatus as well as a system including one or more flexible x-ray detector apparatus are also disclosed.Type: ApplicationFiled: July 2, 2015Publication date: January 5, 2017Inventors: Nicholas Konkle, John Sabol, Katelyn Nye, Andrea Schmitz, Aaron Couture, Kevin Kinsey
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Publication number: 20160070006Abstract: An imaging system includes plural modular imaging detectors and a readout electronics unit. Each modular imaging detector includes pixels configured to collect imaging data, a substrate on which the pixels are disposed, and a mechanical interconnection feature. The mechanical interconnection feature is configured to cooperate with a corresponding mechanical interconnection feature of at least one other of the modular imaging detectors to directly join the modular imaging detector to the at least one other of the modular imaging detectors. The readout electronics unit is configured to be operably coupled to the modular imaging detectors and to receive signals corresponding to the imaging data from the modular imaging detectors.Type: ApplicationFiled: September 4, 2014Publication date: March 10, 2016Inventors: Nicholas Ryan Konkle, John Michael Sabol, James Michael Gent, Aaron Couture
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Publication number: 20070138397Abstract: A photodetector for X-ray applications includes a photodiode at each pixel location that is gated to reduce leakage of charge from the photodiode. A gate layer may be disposed around the entire peripheral edge of the detector, and maintained at a common potential with a contact layer, or at a different potential. A passivation or dielectric layer separates the gate layer from the photodiode. Leakage around the edge of the diode that can result from extended exposure to radiation is reduced by the gate layer.Type: ApplicationFiled: December 15, 2005Publication date: June 21, 2007Inventors: Scott Zelakiewicz, Snezana Bogdanovich, Aaron Couture, Douglas Albagli, William Hennessy
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Publication number: 20060131669Abstract: An annular thin film transistor includes an annular source electrode disposed above the layer of the semiconductor material, a drain electrode disposed above the layer of the semiconductor material within the annular source electrode, and an active channel between the drain electrode and the annular source electrode, wherein a surface of the active channel comprises exposed semiconductor material. Further, a serpentine thin film transistor includes a serpentine source electrode disposed above the layer of the semiconductor material, a drain electrode disposed above the layer of semiconductor material and substantially within a recess formed by the serpentine source electrode, wherein the drain electrode is configured to substantially conform to the recess, and an active channel between the drain electrode and the serpentine source electrode, wherein the active channel has a substantially consistent length, and wherein a surface of the active channel comprises exposed semiconductor material.Type: ApplicationFiled: December 22, 2004Publication date: June 22, 2006Inventors: Douglas Albagli, William Hennessy, Aaron Couture, Christopher Collazo-Davila
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Publication number: 20060065844Abstract: An imaging system for dynamically optimizing an image is provided. The imaging system includes a source of radiation, and a detector assembly configured to generate an image signal based on an incidence of radiation on a scintillator assembly. At least one or more properties of the generated image signal are determined from the incidence of radiation on the detector assembly. The one or more properties of the image signal may also be determined from one or more detector operational parameters. The imaging system also includes a detector adjustment circuitry that is configured to adjust the one or more detector operational parameters based on the generated image signal.Type: ApplicationFiled: September 30, 2004Publication date: March 30, 2006Inventors: Scott Zelakiewicz, Clifford Bueno, Gregory Mohr, Paul FitzGerald, Forrest Hopkins, Aaron Couture
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Publication number: 20050092986Abstract: A method for monitoring the quality of a manufacturing process for making detector panels that have a plurality of pixels in a two-dimensional array includes, in each detector panel, manufacturing a set of baseline pixels and a set of test pixels. Each test pixel has an electrical component having a geometric dimension varied by an amount sufficient to introduce a measurable variation in a test that measures parameters of pixels that are dependent upon the varied dimension. The method further includes performing the test on the set of baseline pixels and the set of varied pixels, analyzing the results of the test, and adjusting parameters of the manufacturing process in accordance with the analysis.Type: ApplicationFiled: October 30, 2003Publication date: May 5, 2005Inventors: Aaron Couture, Douglas Albagli, George Possin