Abstract: An electrically addressed non-volatile memory is maintained by measuring a voltage threshold for each selected memory cell in the electrically addressed non-volatile memory. The voltage threshold is a voltage around which a controllable voltage signal applied to a control gate of a selected memory cell produces a change in value read from the selected memory cell. A measured voltage threshold distribution of the measured voltage thresholds is generated for the selected memory cells. The voltage threshold distribution is analyzed to identify memory cells having greater probabilities of read errors, for example. In response to the analysis, an operating parameter that affects the memory cells identified as having greater probabilities of read errors is selectively changed.

Abstract: An electrically addressed non-volatile memory is maintained by measuring a voltage threshold for each selected memory cell in the electrically addressed non-volatile memory. The voltage threshold is a voltage around which a controllable voltage signal applied to a control gate of a selected memory cell produces a change in value read from the selected memory cell. A measured voltage threshold distribution of the measured voltage thresholds is generated for the selected memory cells. The voltage threshold distribution is analyzed to identify memory cells having greater probabilities of read errors, for example. In response to the analysis, an operating parameter that affects the memory cells identified as having greater probabilities of read errors is selectively changed.