Patents by Inventor Aaron M. Dudley

Aaron M. Dudley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11209467
    Abstract: A method for quantifying power quality events in an electrical system including a plurality of intelligent electronic devices (IEDs) includes processing electrical measurement data from or derived from energy-related signals captured by at least one first IED of the plurality of IEDs to identify a power quality event at a first point of installation of the at least one first IED in the electrical system. An impact of the power quality event at a second point of installation in the electrical system is determined based on an evaluation of electrical measurement data from or derived from energy-related signals captured by at least one second IED of the plurality of IEDs at the second point of installation proximate to a determined time of occurrence of the power quality event at the first point of installation.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: December 28, 2021
    Assignee: Schneider Electric USA, Inc.
    Inventors: Jon A. Bickel, Aaron M. Dudley, Theresa K. Wall
  • Publication number: 20200011909
    Abstract: A method for quantifying power quality events in an electrical system including a plurality of intelligent electronic devices (IEDs) includes processing electrical measurement data from or derived from energy-related signals captured by at least one first IED of the plurality of IEDs to identify a power quality event at a first point of installation of the at least one first IED in the electrical system. An impact of the power quality event at a second point of installation in the electrical system is determined based on an evaluation of electrical measurement data from or derived from energy-related signals captured by at least one second IED of the plurality of IEDs at the second point of installation proximate to a determined time of occurrence of the power quality event at the first point of installation.
    Type: Application
    Filed: December 27, 2018
    Publication date: January 9, 2020
    Inventors: Jon A. Bickel, Aaron M. Dudley, Theresa K. Wall