Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Wrapper and associated Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to one or more Test Wrappers via an interconnect fabric. The Test Wrappers interface with one or more IP test ports to provide test data, control, and/or stimulus signals to the IP blocks to facilitate circuit-level testing of the IP blocks. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ interface with one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Wrapper and associated Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to one or more Test Wrappers via an interconnect fabric. The Test Wrappers interface with one or more IP test ports to provide test data, control, and/or stimulus signals to the IP blocks to facilitate circuit-level testing of the IP blocks. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ interface with one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: A method, apparatus and system for accepting a plurality of user-selected properties pre-designated for detecting errors in portions of a circuit, accepting a plurality of user-selected erroneous outputs, each of which may correspond to one of the plurality of user-selected set of properties, executing a simulation of the circuit for each of the plurality of user-selected properties, detecting in the output of the simulation, one of the plurality of user-selected erroneous outputs of the circuit for the corresponding one of the plurality of user-selected properties, and performing error correction on the circuit for the corresponding one of the plurality of user-selected properties. A method, apparatus and system for automatically selecting a subset of a set of inputs which when input into a circuit simulation generate erroneous output data to a primary output of the circuit and performing error correction on the circuit therewith. Other embodiments are described and claimed.

Abstract: A method, apparatus and system for accepting a plurality of user-selected properties pre-designated for detecting errors in portions of a circuit, accepting a plurality of user-selected erroneous outputs, each of which may correspond to one of the plurality of user-selected set of properties, executing a simulation of the circuit for each of the plurality of user-selected properties, detecting in the output of the simulation, one of the plurality of user-selected erroneous outputs of the circuit for the corresponding one of the plurality of user-selected properties, and performing error correction on the circuit for the corresponding one of the plurality of user-selected properties. A method, apparatus and system for automatically selecting a subset of a set of inputs which when input into a circuit simulation generate erroneous output data to a primary output of the circuit and performing error correction on the circuit therewith. Other embodiments are described and claimed.

Abstract: An apparatus has an integrated circuit that includes a seed register, a linear feedback shift register to load a test vector into a number of scan chains, and a signature register to receive a test response from the scan chains. The seed register, the linear feedback shift register, and the signature register each have the same register length. The linear feedback shift register and the signature register have the same shift frequency that is greater than a frequency at which a seed vector is loaded into the seed register. The linear feedback shift register is adapted to be selectively provided with bits to control a degree to which its vector is dependent on previous vectors. The scan chains may be configured as a single group providing a test response to a single input signature register or a set of groups providing a test response to a multiple input signature register.

Abstract: An apparatus has an integrated circuit that includes a seed register, a linear feedback shift register to load a test vector into a number of scan chains, and a signature register to receive a test response from the scan chains. The seed register, the linear feedback shift register, and the signature register each have the same register length. The linear feedback shift register and the signature register have the same shift frequency that is greater than a frequency at which a seed vector is loaded into the seed register. The linear feedback shift register is adapted to be selectively provided with bits to control a degree to which its vector is dependent on previous vectors. The scan chains may be configured as a single group providing a test response to a single input signature register or a set of groups providing a test response to a multiple input signature register.