Patents by Inventor Abhishek Ganapati Karkisaval

Abhishek Ganapati Karkisaval has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11740968
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: August 29, 2023
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Saket Jalan, Indu Prathapan, Abhishek Ganapati Karkisaval
  • Publication number: 20220283899
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Application
    Filed: May 25, 2022
    Publication date: September 8, 2022
    Inventors: Saket Jalan, Indu Prathapan, Abhishek Ganapati Karkisaval
  • Patent number: 11372715
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: June 28, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Saket Jalan, Indu Prathapan, Abhishek Ganapati Karkisaval
  • Publication number: 20200210287
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Application
    Filed: February 13, 2020
    Publication date: July 2, 2020
    Inventors: Saket Jalan, Indu Prathapan, Abhishek Ganapati Karkisaval
  • Publication number: 20180060163
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Application
    Filed: August 23, 2016
    Publication date: March 1, 2018
    Inventors: SAKET JALAN, INDU PRATHAPAN, ABHISHEK GANAPATI KARKISAVAL
  • Patent number: 9904595
    Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic. A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.
    Type: Grant
    Filed: August 23, 2016
    Date of Patent: February 27, 2018
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Saket Jalan, Indu Prathapan, Abhishek Ganapati Karkisaval
  • Patent number: 9602107
    Abstract: A circuit includes a state capture device to capture a logic state of a reset selection cell in response to a logic state input. A cell reset node defines a reset state of the reset selection cell. A selection device passes the captured logic state from the state capture device or the reset state from the cell reset node to an output of the reset selection cell based on a state of a control input to the selection device.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: March 21, 2017
    Assignee: Texas Instruments Incorporated
    Inventors: Saket Jalan, Abhishek Ganapati Karkisaval
  • Publication number: 20160182020
    Abstract: A circuit includes a state capture device to capture a logic state of a reset selection cell in response to a logic state input. A cell reset node defines a reset state of the reset selection cell. A selection device passes the captured logic state from the state capture device or the reset state from the cell reset node to an output of the reset selection cell based on a state of a control input to the selection device.
    Type: Application
    Filed: December 23, 2014
    Publication date: June 23, 2016
    Inventors: Saket Jalan, Abhishek Ganapati Karkisaval