Patents by Inventor Achim Sonntag

Achim Sonntag has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230053614
    Abstract: A method for automatically setting an operating mode of a hybrid vehicle includes determining whether a distance to the destination is greater than a purely electrically travellable range of the hybrid vehicle, wherein the hybrid vehicle is automatically put into a hybrid mode if the distance to the destination is greater than the purely electrically travellable range of the hybrid vehicle, and the hybrid vehicle is automatically put into a purely electrical drive mode if the distance to the destination is not greater than the purely electrically travellable range of the hybrid vehicle. A corresponding control device and hybrid vehicle are also disclosed.
    Type: Application
    Filed: January 15, 2021
    Publication date: February 23, 2023
    Inventors: Sebastian BAUDISCH, Johannes DIRNECKER, Marcel EWERS, Harald HOFMEIER, Christian SCHMID, Achim SONNTAG
  • Publication number: 20220341748
    Abstract: A method for providing map data for at least two types of zones includes providing first map data for two types of zones, wherein the zones are described by regions; providing second map data for one of the types of zones, wherein the type is described by the listing of road sections; providing a map which contains all of the road sections and the positions thereof; verifying, by way of the map, whether the regions indicated in the first map data for the one of the types of zones correspond with the road sections indicated in the second map data for the one of the types of zones; in the event that they do not correspond, modifying the zones of the one of the types of zones in the first map data; and providing the first map data, corrected as applicable.
    Type: Application
    Filed: September 3, 2020
    Publication date: October 27, 2022
    Inventors: Johannes DIRNECKER, Irmengard DITZELL, Marcel EWERS, Harald HOFMEIER, Achim SONNTAG
  • Patent number: 10184784
    Abstract: The invention relates to a device serving for the combined measurement of the width and thickness of a flat object, in particular a plate, a belt, or a web. The device comprises a measurement apparatus which has at least one contactless sensor, which is for width measurement on the object and which is movable crosswise to the longitudinal direction or conveying direction of the object. According to the invention, on the opposite side of the object, there is a second sensor opposite the first sensor which, together with the first sensor, serves for thickness measurement on the object, wherein the two sensors can travel above and below the object, that is, on opposite sides of the object.
    Type: Grant
    Filed: May 3, 2016
    Date of Patent: January 22, 2019
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Achim Sonntag, Herbert Fuellmeier, Gerhard Kirschner
  • Publication number: 20170205225
    Abstract: The invention relates to a device serving for the combined measurement of the width and thickness of a flat object, in particular a plate, a belt, or a web. The device comprises a measurement apparatus which has at least one contactless sensor, which is for width measurement on the object and which is movable crosswise to the longitudinal direction or conveying direction of the object. According to the invention, on the opposite side of the object, there is a second sensor opposite the first sensor which, together with the first sensor, serves for thickness measurement on the object, wherein the two sensors can travel above and below the object, that is, on opposite sides of the object.
    Type: Application
    Filed: May 3, 2016
    Publication date: July 20, 2017
    Inventors: Achim Sonntag, Herbert Fuellmeier, Gerhard Kirschner
  • Patent number: 9335145
    Abstract: An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.
    Type: Grant
    Filed: March 27, 2012
    Date of Patent: May 10, 2016
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Achim Sonntag, Gerhard Kirschner, Herbert Fuellmeier, Franz Hochwimmer
  • Publication number: 20140101954
    Abstract: An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.
    Type: Application
    Filed: March 27, 2012
    Publication date: April 17, 2014
    Applicant: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Achim Sonntag, Gerhart Kirschner, Herbert Fuellmeier, Franz Hochwimmer