Abstract: Multi-port memory circuits are often required within modern digital integrated circuits to store data. Multi-port memory circuits allow multiple memory users to access the same memory cell simultaneously. Multi-port memory circuits are generally custom-designed in order to obtain the best performance or synthesized with logic synthesis tools for quick design. However, these two options for creating multi-port memory give integrated circuit designers a stark choice: invest a large amount of time and money to custom design an efficient multi-port memory system or allow logic synthesis tools to inefficiently create multi-port memory. An intermediate solution is disclosed that allows an efficient multi-port memory array to be created largely using standard circuit cell components and register transfer level hardware design language code.

Abstract: Multi-port memory circuits are often required within modern digital integrated circuits to store data. Multi-port memory circuits allow multiple memory users to access the same memory cell simultaneously. Multi-port memory circuits are generally custom-designed in order to obtain the best performance or synthesized with logic synthesis tools for quick design. However, these two options for creating multi-port memory give integrated circuit designers a stark choice: invest a large amount of time and money to custom design an efficient multi-port memory system or allow logic synthesis tools to inefficiently create multi-port memory. An intermediate solution is disclosed that allows an efficient multi-port memory array to be created largely using standard circuit cell components and register transfer level hardware design language code.

Abstract: Multi-port memory circuits are often required within modern digital integrated circuits to store data. Multi-port memory circuits allow multiple memory users to access the same memory cell simultaneously. Multi-port memory circuits are generally custom-designed in order to obtain the best performance or synthesized with logic synthesis tools for quick design. However, these two options for creating multi-port memory give integrated circuit designers a stark choice: invest a large amount of time and money to custom design an efficient multi-port memory system or allow logic synthesis tools to inefficiently create multi-port memory. An intermediate solution is disclosed that allows an efficient multi-port memory array to be created largely using standard circuit cell components and register transfer level hardware design language code.

Abstract: Static random access memory (SRAM) circuits are used in most digital integrated circuits to store data. To handle multiple memory users, an efficient dual port six transistor (6T) SRAM memory cell is proposed. The dual port 6T SRAM cell uses independent word lines and bit lines such that the true side and the false side of the SRAM cell may be accessed independently. Single-ended reads allow the two independent word lines and bit lines to handle two reads in a single cycle using spatial domain multiplexing. Writes can be handled faster that read operations such that two writes can be handled in a single cycle using time division multiplexing. To further improve the operation of the dual port 6T SRAM cell a number of algorithmic techniques are used to improve the operation of the memory system.

Abstract: Static random access memory (SRAM) circuits are used in most digital integrated circuits to store data. To handle multiple memory users, an efficient dual port six transistor (6T) SRAM memory cell is proposed. The dual port 6T SRAM cell uses independent word lines and bit lines such that the true side and the false side of the SRAM cell may be accessed independently. Single-ended reads allow the two independent word lines and bit lines to handle two reads in a single cycle using spatial domain multiplexing. Writes can be handled faster that read operations such that two writes can be handled in a single cycle using time division multiplexing. To further improve the operation of the dual port 6T SRAM cell a number of algorithmic techniques are used to improve the operation of the memory system.

Abstract: Static random access memory (SRAM) circuits are used in most digital integrated circuits to store digital data bits. SRAM memory circuits are generally read by decoding an address, reading from an addressed memory cell using a set of bit lines, outputting data from the read memory cell, and precharging the bit lines for a subsequent memory cycle. To handle memory operations faster, a bit line multiplexing system is proposed. Two sets of bit lines are coupled to each memory cell and each set of bit lines are used for memory operations in alternating memory cycles. During a first memory cycle, a first set of bit lines accesses the memory array while precharging a second set of bit lines. Then during a second memory cycle following the first memory cycle, the first set of bit lines are precharged while the second set of bit lines accesses the memory array to read data.

Abstract: Multi-port memory circuits are often required within modern digital integrated circuits to store data. Multi-port memory circuits allow multiple memory users to access the same memory cell simultaneously. Multi-port memory circuits are generally custom-designed in order to obtain the best performance or synthesized with logic synthesis tools for quick design. However, these two options for creating multi-port memory give integrated circuit designers a stark choice: invest a large amount of time and money to custom design an efficient multi-port memory system or allow logic synthesis tools to inefficiently create multi-port memory. An intermediate solution is disclosed that allows an efficient multi-port memory array to be created largely using standard circuit cell components and register transfer level hardware design language code.

Abstract: A multiple bank memory array includes a combined memory array, an X-decoder, a first word-line driver, a second word-line driver, a reference column, a Y-multiplexer and pre-charging circuit, a sense amplifier and input/output circuit, and control and pre-coding logic. Signals are received and applied to the combined memory array and the other components via the control and pre-decode logic and the input/output circuit. The control and pre-decode logic receives control signals to control and address the combined memory array, and uses a single bit for two dimensional decoding. This architecture for multiple bank memory cell arrays a novel technique for word-line banking using tilable strap cells in a first embodiment that provides a combined array, does not require routing and eliminates redundant reference columns.

Abstract: A system and method is provided for bit line sharing in a memory device. Adjacent memory cells are configured to share a bit line and are accessed with separate word lines as an odd and even plane. Bit line sharing reduces the number of Y-multiplexors and I/O circuitry required by about two-fold, and provides power savings by reducing the number of bit lines pre-charged.

Abstract: A self-timed write control memory device minimizes the memory cycle time for the cells of the array. The self-timed write control memory device preferably comprises an X-decoder, a word-line driver, a memory cell array, control logic, pre-charge circuits, sense amplifiers, a reference decoder, and a reference word-line driver. The memory device preferably further includes a first reference cell, a second reference cell or logic, a first reference column, a second reference column and a reference sense amplifier. The first reference cell is preferably used for detection of read cycle completion and the second reference cell or logic is used for detection of write cycle completion. The output of the first reference cell and second reference cell are preferably coupled to inputs of a unique reference sense amplifier.

Abstract: A multiple bank memory array includes a combined memory array, an X-decoder, a first word-line driver, a second word-line driver, a reference column, a Y-muitiplexer and pre-chargingz circuit, a sense amplifier and input/output circuit, and control and pre-coding logic. Signals are received and applied to the combined memory array and the other components via the control and pre-decode logic and the input/output circuit. The control and pre-decode logic receives control signals to control and address the combined memory array, and uses a single bit for two dimensional decoding. This architecture for multiple bank memory cell arrays a novel technique for word-line banking using tillable strap cells in a first embodiment that provides a combined array, does not require routing and eliminates redundant reference columns.

Abstract: The simultaneous read or simultaneous write memory array of the present invention includes a core array of memory units, control logic, a first port I/O, a first port shift register, first port word line generation logic, a second port I/O, a second port shift register, and a second port word line generation logic. The memory unit includes a pair of cells formed from two inverters as well as read and write transistors. The pair of memory cells preferably use the same bit lines for being read or written. Still more particularly, the novel design of the memory units combines the read and write bit lines into a single bit line such that there is a first, single bit line for reading from a first cell in the memory unit and writing to a second cell in the memory unit; and there is a second, single bit line for reading from the second cell in the memory unit and writing to the first cell in the memory unit.

Abstract: A multiple bank memory array includes a combined memory array, an X-decoder, a first word-line driver, a second word-line driver, a reference column, a Y-multiplexer and pre-charging circuit, a sense amplifier and input/output circuit, and control and pre-coding logic. Signals are received and applied to the combined memory array and the other components via the control and pre-decode logic and the input/output circuit. The control and pre-decode logic receives control signals to control and address the combined memory array, and uses a single bit for two dimensional decoding. This architecture for multiple bank memory cell arrays a novel technique for word-line banking using tilable strap cells in a first embodiment that provides a combined array, does not require routing and eliminates redundant reference columns.

Abstract: A multiple bank memory array includes a combined memory array, an X-decoder, a first word-line driver, a second word-line driver, a reference column, a Y-multiplexer and pre-charging circuit, a sense amplifier and input/output circuit, and control and precoding logic. Signals are received and applied to the combined memory array and the other components via the control and pre-decode logic and the input/output circuit. The control and pre-decode logic receives control signals to control and address the combined memory array, and uses a single bit for two dimensional decoding. This architecture for multiple bank memory cell arrays a novel technique for word-line banking in one embodiment that provides a combined array, does not require routing and eliminates redundant reference columns.

Abstract: A method provides an on-chip repair technique to fix defective row or I/O memory lines in an ASIC memory array with redundancy row or I/O memory lines. The method employs progressive urgency and dynamic repair schemes to optimize the allotted time for repairing defective row and I/O memory lines. Progressive urgency scheme increases the need to repair relative to the available redundancy row or I/O memory lines over the entire repairing time. Dynamic repair executes a mandatory-row or a mandatory-I/O repair as defective row or I/O memory lines are detected. In addition, a recurrence error reroutes the address location of a redundancy memory line to another address location of another redundancy memory line in the event that such redundancy memory line itself is defective, and thus requires further repair.

Abstract: A new design methodology which utilizes a module-based architecture is used to implement customized VLSI designs. In accordance with this invention, the module-based architecture comprises a number of Matrix Transistor Logic (MTL) modules. Each MTL module has a control input buffer section, an output stage section, and a matrix array section. The matrix array section implements logic functions using Pass Transistor Logic technology. Three variables, each of which place a different constraint on the MTL modules, are used in an automated design procedure to implement the MTL modules.

Abstract: A built-in self-repair system includes an on-chip clock generator for triggering the repairing process to repair defective memory lines or blocks in a memory array of an ASIC chip. The on-chip clock generator enables the self-repair process to start at the power up of a computer system without a need for an external test-triggering signal. The system includes a built-in self-test circuit that tests for a defective row memory line or a defective I/O memory block. The system further includes a fault-latching-and repair-execution circuit that repairs a row memory line or an I/O memory block. Repairing an IO memory block effectively repairs faults that occur between any two adjacent column shorts within an IO memory block. The preferred repairing scheme adopts a 15N diagnosis to achieve high fault correction so that a large percentage of defective memory cells can be replaced by redundant row memory lines or redundant I/O memory blocks.

Abstract: A logic circuit and a technique for repairing faulty memory cells internally by employing on-chip testing and repairing circuits in an ASIC system. The test circuit detects column line faults, row faults, and data retention faults in a memory array. The repair circuit redirects the original address locations of the faulty memory lines to the mapped address locations of the redundant column or row lines. This repair scheme includes redundant column lines attached to each of the I/O arrays in the memory array and redundant row lines to replace detected memory faults. These testing and repairing procedures are performed within the chip without the aid of any external equipment.