Patents by Inventor Adam S. Chaimowitz

Adam S. Chaimowitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10180353
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Grant
    Filed: June 30, 2017
    Date of Patent: January 15, 2019
    Assignee: SpectraSensors, Inc.
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Patent number: 10156513
    Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
    Type: Grant
    Filed: July 23, 2015
    Date of Patent: December 18, 2018
    Assignee: SpectraSensors, Inc.
    Inventors: Peter Scott, Alfred Feitisch, Peter Dorn, Adam S. Chaimowitz, Hsu-Hung Huang, Mathias Schrempel, Lutz Keller
  • Publication number: 20180120159
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Application
    Filed: June 30, 2017
    Publication date: May 3, 2018
    Inventors: XIANG LIU, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Patent number: 9696204
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Grant
    Filed: August 3, 2015
    Date of Patent: July 4, 2017
    Assignee: SPECTRASENSORS, INC.
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Publication number: 20170038257
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 9, 2017
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Publication number: 20160153890
    Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
    Type: Application
    Filed: July 23, 2015
    Publication date: June 2, 2016
    Inventors: Peter Scott, Alfred Feitisch, Peter Dorn, Adam S. Chaimowitz, Hsu-Hung Huang, Mathias Schrempel, Lutz Keller
  • Patent number: 9109951
    Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
    Type: Grant
    Filed: November 6, 2013
    Date of Patent: August 18, 2015
    Assignee: SpectraSensors, Inc.
    Inventors: Peter Scott, Alfred Feitisch, Peter Dorn, Adam S. Chaimowitz, Hsu-Hung Huang, Mathias Schrempel, Lutz Keller
  • Publication number: 20150124257
    Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
    Type: Application
    Filed: November 6, 2013
    Publication date: May 7, 2015
    Applicant: SpectraSensors, Inc.
    Inventors: Peter Scott, Alfred Feitisch, Peter Dorn, Adam S. Chaimowitz, Hsu-Hung Huang, Mathias Schrempel, Lutz Keller