Abstract: A terahertz detection assembly generally has a light generating apparatus configured to generate at least one illuminating light pattern and a substrate member positioned proximate to the light generating apparatus. The substrate member includes a semiconductive portion configured to receive at least a portion of the illuminating light pattern such that a conductive path is defined within the semiconductive portion. At least one waveguide is coupled to the semiconductive portion such that the waveguide is adjacent to the conductive path. The waveguide is configured to receive at least a portion of the illuminating light pattern such that the pattern is moving along the waveguide. The waveguide is further configured to receive a plurality of terahertz electromagnetic waves that are transmitted within the waveguide in the same direction as the motion of the illuminating light pattern to facilitate the detection and characterization of the terahertz electromagnetic waves.

Abstract: A system linearization assembly generally includes a delay device that receives an input signal from a signal source and delays the input signal by a predetermined delay function. An attenuation device receives a modified output signal from a signal modifying device, wherein the output signal is based on the input signal and includes a time varying parameter representing a plurality of frequency components including at least one component caused by non-linear intermodulation distortion. The attenuation device attenuates the output signal by a factor that is equal to at least one parameter of the modifying device. A computing device compares the attenuated output signal with the delayed input signal to obtain a resultant signal that includes the component caused by non-linear intermodulation distortion. A detection device detects at least one parameter of the resultant signal. Based on the detected parameter, a controller facilitates a modification of the component.

Abstract: A system linearization assembly generally includes a filter that is coupled to a measuring device. The filter is configured to receive a signal that includes a time varying parameter representing a plurality of frequency components including at least one component caused by non-linear intermodulation distortion, such as an odd-order intermodulation distortion component. The filter is also configured to isolate at least one harmonic of the frequency components with the same order as the component caused by non-linear intermodulation distortion. The measuring device is configured to measure at least one parameter of the isolated harmonic. The system linearization assembly also includes a controller coupled to the measuring device. The controller is configured to modify, for example by minimizing, the signal from the determined measurement to facilitate a modification, such as a reduction, of the component caused by non-linear intermodulation distortion.

Abstract: An image detection assembly includes a light source that is configured to generate at least one pulsed light beam. A modulator is configured to direct the pulsed light beam onto a device via a plurality of light patterns such that a plurality of electrical signals are generated by the device. Each electrical signal corresponds to a different light pattern. A signal processing apparatus is coupled to the device and the signal processing apparatus is configured to receive the electrical signals and to digitize each electrical signal to record a plurality of signal vectors such that each signal vector corresponds to a different electrical signal. The signal processing apparatus is also configured to generate at least one image output based, at least in part, on the recorded signal vectors and the light patterns such that the image output enables a determination of at least one transient effect on the device.

Abstract: A system linearization assembly generally includes a filter that is coupled to a measuring device. The filter is configured to receive a signal that includes a time varying parameter representing a plurality of frequency components including at least one component caused by non-linear intermodulation distortion, such as an odd-order intermodulation distortion component. The filter is also configured to isolate at least one harmonic of the frequency components with the same order as the component caused by non-linear intermodulation distortion. The measuring device is configured to measure at least one parameter of the isolated harmonic. The system linearization assembly also includes a controller coupled to the measuring device. The controller is configured to modify, for example by minimizing, the signal from the determined measurement to facilitate a modification, such as a reduction, of the component caused by non-linear intermodulation distortion.

Abstract: A system linearization assembly generally includes a delay device that receives an input signal from a signal source and delays the input signal by a predetermined delay function. An attenuation device receives a modified output signal from a signal modifying device, wherein the output signal is based on the input signal and includes a time varying parameter representing a plurality of frequency components including at least one component caused by non-linear intermodulation distortion. The attenuation device attenuates the output signal by a factor that is equal to at least one parameter of the modifying device. A computing device compares the attenuated output signal with the delayed input signal to obtain a resultant signal that includes the component caused by non-linear intermodulation distortion. A detection device detects at least one parameter of the resultant signal. Based on the detected parameter, a controller facilitates a modification of the component.

Abstract: A terahertz detection assembly generally has a light generating apparatus configured to generate at least one illuminating light pattern and a substrate member positioned proximate to the light generating apparatus. The substrate member includes a semiconductive portion configured to receive at least a portion of the illuminating light pattern such that a conductive path is defined within the semiconductive portion. At least one waveguide is coupled to the semiconductive portion such that the waveguide is adjacent to the conductive path. The waveguide is configured to receive at least a portion of the illuminating light pattern such that the pattern is moving along the waveguide. The waveguide is further configured to receive a plurality of terahertz electromagnetic waves that are transmitted within the waveguide in the same direction as the motion of the illuminating light pattern to facilitate the detection and characterization of the terahertz electromagnetic waves.

Abstract: A terahertz generating assembly generally includes a light emitting device that is configured to generate at least one pulsed light beam. A first dispersion member is positioned proximate to the light emitting device, wherein the first dispersion member is configured to facilitate a temporal dispersion of the light beam. A second dispersion member is positioned proximate to the first dispersion member and to the light emitting device, wherein the second dispersion member is configured to facilitate a spatial dispersion of the light beam. A lens is positioned proximate to each of the first and second dispersion members, wherein the lens is configured to focus the temporal and spatial dispersions to produce at least one moving spot of light. At least one waveguide is positioned proximate to the lens, wherein the waveguide is configured to apply a biased voltage to the spot of light to generate pulsed terahertz radiation.

Abstract: Certain embodiments of the invention may include systems, methods, and apparatus for generating terahertz electromagnetic radiation. According to an example embodiment of the invention, a method is provided for generating terahertz electromagnetic radiation. The method includes: coupling a terahertz resonator with an optical resonator, wherein the optical resonator comprises non-linear optical material; directing laser light through the optical resonator to generate terahertz radiation by parametric interaction of the laser light with the optical resonator and the terahertz resonator; and directing the terahertz radiation from the terahertz resonator to an output.

Abstract: Certain embodiments of the invention may include systems, methods, and apparatus for generating terahertz electromagnetic radiation. According to an example embodiment of the invention, a method is provided for generating terahertz electromagnetic radiation. The method includes: coupling a terahertz resonator with an optical resonator, wherein the optical resonator comprises non-linear optical material; directing laser light through the optical resonator to generate terahertz radiation by parametric interaction of the laser light with the optical resonator and the terahertz resonator; and directing the terahertz radiation from the terahertz resonator to an output.