Patents by Inventor Adesh Sharadrao Sontakke

Adesh Sharadrao Sontakke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure
    Patent number: 8694276
    Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: April 8, 2014
    Assignee: Texas Instruments Incorporated
    Inventors: Adesh Sharadrao Sontakke, Rajesh Kumar Mittal, Rubin A. Parekhji, Upendra Narayan Tripathi
  • BUILT-IN SELF-TEST METHODS, CIRCUITS AND APPARATUS FOR CONCURRENT TEST OF RF MODULES WITH A DYNAMICALLY CONFIGURABLE TEST STRUCTURE
    Publication number: 20120191400
    Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.
    Type: Application
    Filed: March 8, 2011
    Publication date: July 26, 2012
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Adesh Sharadrao Sontakke, Rajesh Kumar Mittal, Rubin A. Parekhji, Upendra Narayan Tripathi