Abstract: A method and software macro are disclosed for generating a first pass yield report, which may be employed in the manufacture and testing of semiconductor products. The method comprises obtaining raw data from a workstream database, executing a software macro in a computer system, and generating a first pass yield report comprising final yield data calculated via the macro. The macro may comprise computer-executable instructions for formatting the raw data, sorting the formatted data, and calculating final yield data by package type.

Abstract: A method and system for testing an integrated circuit using a plurality of parameters is disclose. The plurality of parameters are from a plurality of parameter sources. The integrated circuit includes a plurality of pins. The method and system include a signal converter, a controller coupled with the signal converter and a plurality of relays coupled with the controller. The signal converter is capable of being coupled with a computer system and is for converting between analog and digital signals. The signal converter receives values for the plurality of parameters from the computer and converts the values for the plurality of parameters to an analog signal indicating the values for the plurality of parameters. The controller is for receiving the analog signal from the signal converter and for providing at least one signal based on the analog signal. The plurality of relays is coupled with the integrated circuit and with the controller.

Abstract: A method and system for testing an integrated circuit using a plurality of parameters is disclosed. The plurality of parameters are from a plurality of parameter sources. The integrated circuit includes a plurality of pins. The method and system include a signal converter, a controller coupled with the signal converter and a plurality of relays coupled with the controller. The signal converter is capable of being coupled with a computer system and is for converting between analog and digital signals. The signal converter receives values for the plurality of parameters from the computer and converts the values for the plurality of parameters to an analog signal indicating the values for the plurality of parameters. The controller is for receiving the analog signal from the signal converter and for providing at least one signal based on the analog signal. The plurality of relays is coupled with the integrated circuit and with the controller.