Patents by Inventor Ahmed H. Zewail
Ahmed H. Zewail has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9464998Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.Type: GrantFiled: June 19, 2015Date of Patent: October 11, 2016Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
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Publication number: 20160005566Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.Type: ApplicationFiled: June 19, 2015Publication date: January 7, 2016Inventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
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Patent number: 9053903Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: GrantFiled: December 9, 2013Date of Patent: June 9, 2015Assignee: California Institute of TechnologyInventor: Ahmed H. Zewail
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Patent number: 8963085Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: GrantFiled: September 24, 2013Date of Patent: February 24, 2015Assignee: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
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Patent number: 8841613Abstract: A 4D electron tomography system includes a stage having one or more degrees of freedom, an electron source, and electron optics operable to direct electron pulses to impinge on a sample supported on the stage. A pulse of the electron pulses impinges on the sample at a first time. The system also includes a laser system and optics operable to direct optical pulses to impinge on the sample. A pulse of the optical pulses impinges on the sample at a second time. The system further includes a detector operable to receive the electron pulses passing through the sample, a controller operable to independently modify an orientation of the stage and at least one of the first time or the second time, a memory operable to store sets of images, and a processor operable to form a 4D tomographic image set from the sets of images.Type: GrantFiled: September 16, 2010Date of Patent: September 23, 2014Assignee: California Institute of TechnologyInventors: Ahmed H. Zewail, Oh-Hoon Kwon, Omar Farghaly Mohammed Abdelsaboor, Ding-Shyue Yang
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Patent number: 8766181Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.Type: GrantFiled: May 13, 2013Date of Patent: July 1, 2014Assignee: California Institute of TechnologyInventors: Ahmed H. Zewail, John Spencer Baskin
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Publication number: 20140158883Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: ApplicationFiled: December 9, 2013Publication date: June 12, 2014Applicant: California Institute of TechnologyInventor: Ahmed H. Zewail
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Publication number: 20140131574Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.Type: ApplicationFiled: May 13, 2013Publication date: May 15, 2014Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Ahmed H. Zewail, John Spencer Baskin
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Patent number: 8686359Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: GrantFiled: April 16, 2013Date of Patent: April 1, 2014Assignee: California Institute of TechnologyInventor: Ahmed H. Zewail
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Publication number: 20140084160Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: ApplicationFiled: September 24, 2013Publication date: March 27, 2014Applicant: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
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Patent number: 8569695Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: GrantFiled: April 16, 2013Date of Patent: October 29, 2013Assignee: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
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Publication number: 20130234022Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: ApplicationFiled: April 16, 2013Publication date: September 12, 2013Applicant: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
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Publication number: 20130234023Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: ApplicationFiled: April 16, 2013Publication date: September 12, 2013Applicant: California Institute of TechnologyInventor: Ahmed H. Zewail
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Patent number: 8440970Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: GrantFiled: August 2, 2012Date of Patent: May 14, 2013Assignee: California Institute of TechnologyInventor: Ahmed H. Zewail
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Patent number: 8429761Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: GrantFiled: September 16, 2010Date of Patent: April 23, 2013Assignee: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
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Publication number: 20120312986Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: ApplicationFiled: August 2, 2012Publication date: December 13, 2012Applicant: California Institute of TechnologyInventor: Ahmed H. Zewail
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Patent number: 8247769Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: GrantFiled: October 7, 2009Date of Patent: August 21, 2012Assignee: California Institute of TechnologyInventor: Ahmed H. Zewail
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Patent number: 8203120Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).Type: GrantFiled: October 7, 2009Date of Patent: June 19, 2012Assignee: California Institute of TechnologyInventor: Ahmed H. Zewail
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Publication number: 20110284744Abstract: A 4D electron tomography system includes a stage having one or more degrees of freedom, an electron source, and electron optics operable to direct electron pulses to impinge on a sample supported on the stage. A pulse of the electron pulses impinges on the sample at a first time. The system also includes a laser system and optics operable to direct optical pulses to impinge on the sample. A pulse of the optical pulses impinges on the sample at a second time. The system further includes a detector operable to receive the electron pulses passing through the sample, a controller operable to independently modify an orientation of the stage and at least one of the first time or the second time, a memory operable to store sets of images, and a processor operable to form a 4D tomgraphic image set from the sets of images.Type: ApplicationFiled: September 16, 2010Publication date: November 24, 2011Applicant: California Institute of TechnologyInventors: Ahmed H. Zewail, Oh-Hoon Kwon, Omar Farghaly Mohammed Abdelsaboor, Ding-Shyue Yang
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Publication number: 20110220792Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.Type: ApplicationFiled: September 16, 2010Publication date: September 15, 2011Applicant: California Institute of TechnologyInventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick