Patents by Inventor Aiqin JIANG

Aiqin JIANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11927587
    Abstract: A thrombelastography device, a heating apparatus, a blood coagulation analysis system, and a rotational angle measurement method are disclosed. The thrombelastography device consists of a plurality of thrombelastography device splits (2) that are horizontally arranged in parallel. The thrombelastography device split (2) comprises a worktable (4), a rack (5), a test bar (6), a tester (8), and a processor (9). The thrombelastography device overcomes the defect in the prior art that the measurement result of a thrombelastography device is inaccurate. The amount of reflected light is used as a reference for thrombelastographic evaluation, and thus the result is more accurate.
    Type: Grant
    Filed: May 19, 2022
    Date of Patent: March 12, 2024
    Assignee: Haemonetics Corporation
    Inventors: Jian Xiao, Aiqin Chen, Bangzhong Yu, Feng Jiang
  • Publication number: 20230221652
    Abstract: A method for determining a process window of a patterning process based on a failure rate. The method includes obtaining a plurality of features printed on a substrate, grouping, based on a metric, the features into a plurality of groups, and generating, based on measurement data associated with a group of features, a base failure rate model for the group of features, wherein the base failure rate model identifies the process window related to the failure rate of the group of features. The method can further include generating, using the base failure rate model, a feature-specific failure rate model for a specific feature, wherein the feature-specific failure rate model identifies a feature-specific process window such that an estimated failure rate of the specific feature is below a specified threshold.
    Type: Application
    Filed: June 17, 2021
    Publication date: July 13, 2023
    Inventors: Aiqin JIANG, Suharshanan RAGHUNATHAN, Jill Elizabeth FREEMAN, Fuming WANG, Fei YAN
  • Publication number: 20230076218
    Abstract: Methods related to improving a simulation processes and solutions (e.g., retargeted patterns) associated with manufacturing of a chip. A method includes obtaining a plurality of dose-focus settings, and a reference distribution based on measured values of a characteristic of a printed pattern associated with each setting of the plurality of dose-focus settings. The method further includes, based on an adjustment model and the plurality of dose-focus settings, determining a probability density function (PDF) of the characteristic such that an error between the PDF and the reference distribution is reduced. The PDF can be a function of the adjustment model and variance associated with dose, the adjustment model being configured to change a proportion of non-linear dose sensitivity contribution to the PDF. A process window can be adjusted based on the determined PDF of the characteristic.
    Type: Application
    Filed: February 18, 2021
    Publication date: March 9, 2023
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE, Hermanus Adrianus DILLEN, Stefan HUNSCHE, Luis Alberto Colina Sant COLINA, Aiqin JIANG, Fuming WANG, Sudharshanan RAGHUNATHAN
  • Patent number: 10635004
    Abstract: A method including obtaining a fit of data for overlay of a metrology target for a patterning process as a function of a stack difference parameter of the metrology target; and using, by a hardware computer, a slope of the fit (i) to differentiate a metrology target measurement recipe from another metrology target measurement recipe, or (ii) calculate a corrected value of overlay, or (iii) to indicate that an overlay measurement value obtained using the metrology target should be used, or not be used, to configure or modify an aspect of the patterning process, or (iv) any combination selected from (i)-(iii).
    Type: Grant
    Filed: November 9, 2017
    Date of Patent: April 28, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Aiqin Jiang, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Hans Van Der Laan, Bart Visser, Martin Jacobus Johan Jak
  • Publication number: 20180129139
    Abstract: A method including obtaining a fit of data for overlay of a metrology target for a patterning process as a function of a stack difference parameter of the metrology target; and using, by a hardware computer, a slope of the fit (i) to differentiate a metrology target measurement recipe from another metrology target measurement recipe, or (ii) calculate a corrected value of overlay, or (iii) to indicate that an overlay measurement value obtained using the metrology target should be used, or not be used, to configure or modify an aspect of the patterning process, or (iv) any combination selected from (i)-(iii).
    Type: Application
    Filed: November 9, 2017
    Publication date: May 10, 2018
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Aiqin JIANG, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Hans Van Der Laan, Bart Visser, Martin Jacobus Johan Jak
  • Patent number: 9940427
    Abstract: A computer-implemented method for improving a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic projection apparatus comprising an illumination source and projection optics, the method including computing a multi-variable cost function of a plurality of design variables that are characteristics of the lithographic process, at least some of the design variables being characteristics of the illumination source and the design layout, the computing of the multi-variable cost function accounting for lens heating effects; and reconfiguring the characteristics of the lithographic process by adjusting the design variables until a predefined termination condition is satisfied.
    Type: Grant
    Filed: January 29, 2013
    Date of Patent: April 10, 2018
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Michael Matthew M. Crouse, Youri Johannes Laurentius Maria Van Dommelen, Peng Liu, Hua-Yu Liu, Aiqin Jiang, Wenjin Huang
  • Patent number: 9809233
    Abstract: An embodiment of the present invention relates to a method of manufacturing a vehicle body. The method includes coupling a frame assembly to a platform, wherein the platform is in a cambered and unloaded condition, and wherein the frame assembly has a degree of play at coupling points with the platform and securing the coupling points to eliminate the degree of play and thereby to provide substantially zero residual stress in the vehicle body in the cambered condition.
    Type: Grant
    Filed: January 19, 2012
    Date of Patent: November 7, 2017
    Assignee: General Electric Company
    Inventors: Harold Kendall, Daniel Ganzer, Zuoguang Liu, Aiqin Jiang
  • Patent number: D747278
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: January 12, 2016
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Aiqin Jiang, Satish Dattatray Kharshikar, Sachin Vrajalal Kanetkar
  • Patent number: D757655
    Type: Grant
    Filed: August 28, 2015
    Date of Patent: May 31, 2016
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Henry Todd Young, Jason Daniel Kuttenkuler, Jeffrey John Wolff, Aiqin Jiang, Sean Patrick Cillessen
  • Patent number: D760656
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: July 5, 2016
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Henry Todd Young, Jason Daniel Kuttenkuler, Jeffrey John Wolff, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D760661
    Type: Grant
    Filed: October 13, 2015
    Date of Patent: July 5, 2016
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Jason Daniel Kuttenkuler, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D760664
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: July 5, 2016
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Henry Todd Young, Jason Daniel Kuttenkuler, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D767498
    Type: Grant
    Filed: October 13, 2015
    Date of Patent: September 27, 2016
    Assignee: General Electric Company
    Inventors: Aiqin Jiang, Theodore Clark Brown, Jason Daniel Kuttenkuler, Henry Todd Young, Gui He, Sean Patrick Cillessen, Mark Allen Murphy, Zhao Zhang
  • Patent number: D782981
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: April 4, 2017
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Jason Daniel Kuttenkuler, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D784264
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: April 18, 2017
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Henry Todd Young, Jason Daniel Kuttenkuler, Jeffrey John Wolff, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D784932
    Type: Grant
    Filed: November 21, 2014
    Date of Patent: April 25, 2017
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Jeffrey John Wolff, Aiqin Jiang
  • Patent number: D786807
    Type: Grant
    Filed: December 11, 2015
    Date of Patent: May 16, 2017
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Aiqin Jiang, Satish Dattatray Kharshikar, Sachin Vrajalal Kanetkar
  • Patent number: D795198
    Type: Grant
    Filed: December 2, 2016
    Date of Patent: August 22, 2017
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Jason Daniel Kuttenkuler, Sean Patrick Cillessen, Aiqin Jiang
  • Patent number: D798822
    Type: Grant
    Filed: July 6, 2016
    Date of Patent: October 3, 2017
    Assignee: General Electric Company
    Inventors: Aiqin Jiang, Theodore Clark Brown, Jason Daniel Kuttenkuler, Henry Todd Young, Gui He, Sean Patrick Cillessen, Mark Allen Murphy, Zhao Zhang
  • Patent number: D816620
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: May 1, 2018
    Assignee: General Electric Company
    Inventors: Mark Allen Murphy, Jeffrey John Wolff, Aiqin Jiang