Abstract: Electrostatic discharge (ESD) protection for an electronic circuit includes a timer circuit that controls multiple clamp circuits. In this way, less circuit area may be used for the timer circuit as compared to conventional ESD protection schemes. In some embodiments, the ESD protection circuit is employed in a data storage apparatus that includes a non-volatile memory array (e.g., NAND devices).

Abstract: The disclosure relates in some aspects to electrostatic discharge (ESD) protection for an electronic circuit. In some aspects, the ESD protection includes a timer circuit that controls multiple clamp circuits. In this way, less circuit area may be used for the timer circuit as compared to conventional ESD protection schemes. In some embodiments, the ESD protection circuit is employed in a data storage apparatus that includes a non-volatile memory array (e.g., NAND devices).

Abstract: A circuit may include control circuitry configured to determine a duty cycle error for a sample clock signal. Based on the duty cycle error the control circuitry may determine a corrective direction by which to alter the duty cycle to correct the duty cycle error. The control circuitry may indicate the corrective direction to selection circuitry via a selection signal. Responsive to the selection signal, the selection circuitry may select a leading phase signal and a lagging phase signal from among a plurality of relative phase signals. Output circuitry may combine the leading phase signal and a lagging phase signal to generate an output clock signal with a duty cycle corresponding the corrective direction.