Abstract: The present invention provides a voltage margin testing system incorporated in an electronic system, such as, a computer system (e.g., a server), having a plurality of components for at least some of which voltage margin testing is required. A voltage margin testing of the invention can include a controller, such as a Baseboard Management Controller (BMC), internal to the computer system and a digital voltage adjuster, e.g., a digital potentiometer, that is in communication with the controller. The voltage adjuster can effect generation of one or more test voltages, for example, by varying resistance in a feedback circuitry of a regulator whose output voltage is applied to system components, for application to the components in response to commands from the controller.

Abstract: A voltage margin testing blade is adapted for use in a bladed server having at least one internal adjustable power supply. The testing blade is further adapted to provide a control signal to the power supply indicative of any desire to modify the output voltage of the power supply. The testing blade senses the output voltage of the power supply and compares it to a desired power supply voltage. The control signal is generated in response to this comparison in order to control the actual power supply voltage at or about the desired power supply voltage.

Abstract: A method of protecting the pins of a pin connector of a backplane preferably includes installing a protective cover over the pins of the pin connector. The protective cover preferably includes at least one connector having receptacles for receiving the pins of the pin connector of the backplane and a handle extending from the at least one connector.

Abstract: A virtual presence station may be positioned at a desired physical location and operates to communicate over a communications network with a remote user and with a unit under test and/or a test controller. The virtual presence station operates to communicate data to the remote user that is a function of the physical position of the virtual presence station, and further operates responsive to data from a remote user to control the test controller and/or the unit under test. The virtual presence station may include a computer, a high-resolution digital camera, a network Web camera, a wireless telephone, a test area, a portable cart, and a portable power source.

Abstract: A method and apparatus controls fans and power supplies to provide accelerated run-in testing. By modulating fans to increase case temperatures and adjusting power supplies to provide “worst case” voltages, a computer system can be subjected to a run-in tests under taxing conditions. By alternately cooling and heating devices such as CPUs, devices can be subjected to mechanical stresses associated with power-on/power off cycles. A time based test implements the present invention based on time, and a temperature based test implements the present invention based on temperature. The present invention can be used to implement a run-in test in which the computer system is operated at an elevated temperature, thereby achieving results similar to those achieved by performing a run-in test in an environmental chamber at an elevated temperature. Alternatively, the a run-in test can be performed by repeatedly cycling the temperature between relatively high and low values.

Abstract: A frequency margin testing blade is adapted for use in a bladed server. The testing blade is further adapted to provide one or more output clock signals for use as clock inputs to one or more server blades internal to the bladed server in which the testing blade is installed and/or one or more server blades external to the bladed server in which the testing blade is installed.

Abstract: A tool for evaluating a pin connector of a backplane preferably includes at least one connector having receptacles for receiving pins of a pin connector of a backplane. The receptacles are open at both ends so that ends of the pins are visible in the receptacles when the tool is seated on the pin connector.

Abstract: The present invention provides a voltage margin testing system incorporated in an electronic system, such as, a computer system (e.g., a server), having a plurality of components for at least some of which voltage margin testing is required. A voltage margin testing of the invention can include a controller, such as a Baseboard Management Controller (BMC), internal to the computer system and a digital voltage adjuster, e.g., a digital potentiometer, that is in communication with the controller. The voltage adjuster can effect generation of one or more test voltages, for example, by varying resistance in a feedback circuitry of a regulator whose output voltage is applied to system components, for application to the components in response to commands from the controller.

Abstract: A voltage margin testing blade is adapted for use in a bladed server having at least one internal adjustable power supply. The testing blade is further adapted to provide a control signal to the power supply indicative of any desire to modify the output voltage of the power supply. The testing blade senses the output voltage of the power supply and compares it to a desired power supply voltage. The control signal is generated in response to this comparison in order to control the actual power supply voltage at or about the desired power supply voltage.

Abstract: A frequency margin testing blade is adapted for use in a bladed server. The testing blade is further adapted to provide one or more output clock signals for use as clock inputs to one or more server blades internal to the bladed server in which the testing blade is installed and/or one or more server blades external to the bladed server in which the testing blade is installed.

Abstract: A protective cover for a pin connector of a backplane includes at least one connector having receptacles for receiving the pins of a pin connector of a backplane and a planar member extending from the connector, the connector being on the planar member.

Abstract: A protective cover for a pin connector of a backplane includes at least one connector having receptacles for receiving the pins of a pin connector of a backplane and a planar member extending from the connector, the connector being on the planar member.

Abstract: A tool for evaluating a pin connector of a backplane preferably includes at least one connector having receptacles for receiving pins of a pin connector of a backplane. The receptacles are open at both ends so that ends of the pins are visible in the receptacles when the tool is seated on the pin connector.

Abstract: A protective cover for a pin connector of a backplane includes at least one connector having receptacles for receiving the pins of a pin connector of a backplane and a planar member extending from the connector, the connector being on the planar member.

Abstract: A method of protecting the pins of a pin connector of a backplane preferably includes installing a protective cover over the pins of the pin connector. The protective cover preferably includes at least one connector having receptacles for receiving the pins of the pin connector of the backplane and a handle extending from the at least one connector.

Abstract: A method and apparatus controls fans and power supplies to provide accelerated run-in testing. By modulating fans to increase case temperatures and adjusting power supplies to provide “worst case” voltages, a computer system can be subjected to a run-in tests under taxing conditions. By alternately cooling and heating devices such as CPUs, devices can be subjected to mechanical stresses associated with power-on/power off cycles. A time based test implements the present invention based on time, and a temperature based test implements the present invention based on temperature. The present invention can be used to implement a run-in test in which the computer system is operated at an elevated temperature, thereby achieving results similar to those achieved by performing a run-in test in an environmental chamber at an elevated temperature. Alternatively, the a run-in test can be performed by repeatedly cycling the temperature between relatively high and low values.