Abstract: A system for generating an interactive patient dashboard displaying metrics of a type of host response. The system may include processors and memory devices with instructions that configure the processors to perform operations. The operations may include transmitting a patient ID to a management platform or one or more devices (e.g., client devices), receiving electronic records, and employing a machine learning model to generate an acuity score based on the patient data. The operations may also include identifying critical parameters in the patient data by comparing parameters in the patient data with a distribution of parameters. The system can determine a ranking of the parameters, and generating a patient dashboard graphical user interface (GUI) for display. The dashboard GUI may include a prognostic indicator, and a list displaying the parameters according to the ranking.

Abstract: A system for adapting a machine learning model for a specific population. The system includes a processor and memory devices storing instructions that configure the memory devices to perform operations. The operations may include receive a local dataset comprising local records of patients associated with the healthcare facility, perform a clustering function, and retrieving a template dataset comprising template records organized in clusters with variable centroids. The operations may also include calculating a similarity metric between the local and template records, generating a synthetic dataset by combining template and local records, segregating the synthetic dataset into a training synthetic dataset and a testing synthetic dataset, and generating and/or validating a machine learning predictive model by tuning a template model according to the training synthetic dataset and/or generating a new predictive model.

Abstract: Wafer transfer apparatus for horizontal transfer of a wafer between a cassette and an input station of a vacuum processing system includes a wafer transfer arm with a primary section linked to a secondary section so as to move a wafer in a straight line to a location and orientation station and then to the input station. The actual location of the wafer center and the angular orientation of the wafer flat are determined, and the wafer is rotated to a desired angular orientation at the location and orientation station. A solar cell is used to sense actual wafer position by sensing the wafer edge as it is rotated. The required correction and rotation are calculated from the solar cell output. As the wafer is transferred to the input station, correcting displacements are added to the movement so that the wafer is accurately positioned at the input station. A strain gauge is used to reliably sense wafer presence or absence on the transfer arm.