Abstract: An electrical resistance measurement apparatus includes a light irradiation unit that irradiates a conductive thin film with terahertz light, a reflection light detection unit that detects reflection light from the conductive thin film, and a computer containing a storage that stores correlation between the reflectance of the terahertz light from the conductive thin film and electrical resistance of the conductive thin film. The computer further containing a processor that determines, reflectance of the terahertz light from the conductive thin film based on a result of detection performed by the reflection light detection unit, and determines the electrical resistance of the conductive thin film based on the correlation and a result of the determination of the reflectance.

Abstract: A mobility measuring apparatus includes a storage unit that respectively stores a relationship between the mobility ? of carriers in a semiconductor and a decay constant ? of the carriers and a relationship between a reflectivity R of the semiconductor to a terahertz light and the decay constant ? of the carriers, a light radiating unit that radiates a terahertz light to the semiconductor as a sample, a detecting unit that detects a reflected light of the sample to the radiated terahertz light, a reflectivity calculating unit that calculates the reflectivity Rexp of the sample by determining a ratio of an intensity of the reflected light relative to an intensity of the radiated terahertz light, an obtaining unit that obtains the decay constant ?exp of the sample corresponding to the reflectivity Rexp of the sample by making reference to the stored relationship between the reflectivity R and the decay constant ? of the carriers, and a mobility calculating unit that calculates the mobility ?exp of the sample fr

Abstract: An electrical resistance measurement apparatus includes a light irradiation unit that irradiates a conductive thin film with terahertz light, a reflection light detection unit that detects reflection light from the conductive thin film, and a computer containing a storage that stores correlation between the reflectance of the terahertz light from the conductive thin film and electrical resistance of the conductive thin film. The computer further containing a processor that determines, reflectance of the terahertz light from the conductive thin film based on a result of detection performed by the reflection light detection unit, and determines the electrical resistance of the conductive thin film based on the correlation and a result of the determination of the reflectance.

Abstract: A nondestructive carrier concentration measuring device (100) includes: a storage unit (101) that stores a correlation between the reflectance of an inorganic compound semiconductor against terahertz light and a carrier concentration; a light radiation unit (103) that irradiates the terahertz light (105) to the inorganic compound semiconductor as a sample; a detection unit (109) that detects reflected light (108) of the inorganic compound semiconductor against the irradiated terahertz light (105); a reflectance calculation unit (111) that compares the irradiated terahertz light (105) with the reflected light (108) and calculates an actual measurement value of the reflectance of the inorganic compound semiconductor; and a read unit (113) that refers to the stored correlation and reads the carrier concentration of the sample corresponding to the actual measurement value of the reflectance.

Abstract: A mobility measuring apparatus includes a storage unit that respectively stores a relationship between the mobility ? of carriers in a semiconductor and a decay constant ? of the carriers and a relationship between a reflectivity R of the semiconductor to a terahertz light and the decay constant ? of the carriers, a light radiating unit that radiates a terahertz light to the semiconductor as a sample, a detecting unit that detects a reflected light of the sample to the radiated terahertz light, a reflectivity calculating unit that calculates the reflectivity Rexp of the sample by determining a ratio of an intensity of the reflected light relative to an intensity of the radiated terahertz light, an obtaining unit that obtains the decay constant ?exp of the sample corresponding to the reflectivity Rexp of the sample by making reference to the stored relationship between the reflectivity R and the decay constant ? of the carriers, and a mobility calculating unit that calculates the mobility ?exp of the sample fr

Abstract: A nondestructive carrier concentration measuring device (100) includes: a storage unit (101) that stores a correlation between the reflectance of an inorganic compound semiconductor against terahertz light and a carrier concentration; a light radiation unit (103) that irradiates the terahertz light (105) to the inorganic compound semiconductor as a sample; a detection unit (109) that detects reflected light (108) of the inorganic compound semiconductor against the irradiated terahertz light (105); a reflectance calculation unit (111) that compares the irradiated terahertz light (105) with the reflected light (108) and calculates an actual measurement value of the reflectance of the inorganic compound semiconductor; and a read unit (113) that refers to the stored correlation and reads the carrier concentration of the sample corresponding to the actual measurement value of the reflectance.

Abstract: To enable a retail store that sells cosmetics to grasp the situations of its own customers who are cosmetics users precisely. An information management system includes a center side system, a plurality of store side systems and a plurality of member terminals both connected with the center side system, wherein the store side system has a function for collecting member information and a function for sending the collected information to the center side system, and the center side system has a function for storing the received information, and a function for extracting necessary information based on the request from the store side system or the member terminal.

Abstract: A compact and inexpensive laser apparatus capable of obtaining laser beams of multiple wavelengths from a single solid crystal at the same time and excelling in reliability and efficiency is to be provided. A laser apparatus 1 uses a solid crystal consisting of a Raman effect substance as a laser medium 10, and is equipped with a laser oscillator 12 for exciting the laser medium 10 to generate laser beams, a reflector 16, a laser output mirror 18, for resonating the laser beam generated from the laser medium 10 and a harmonic element 22 for enabling by angle adjustment a single wavelength to be extracted out of multiple oscillation wavelengths.