Patents by Inventor Akira Kobana

Akira Kobana has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Flaw size measurement equipment using eddy currents
    Patent number: 4739261
    Abstract: Equipment to measure flaws in an object using an eddy current. According to this equipment, attention is given to a relation between the amplitude of signal detected when the eddy current probe is scanning and the position of the eddy current probe, and the size of flaw is measured based upon the fact that scan distance of probe in which flaw detection signals of greater than a predetermined threshold value are obtained, is subject to change depending upon the depth of penetration of eddy current.
    Type: Grant
    Filed: October 15, 1985
    Date of Patent: April 19, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Sakae Sugiyama, Akira Kobana, Makoto Senoh