Patents by Inventor Akira MASUYA

Akira MASUYA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240053581
    Abstract: Provided is a calibration sample that can be used for three-dimensional structures and is unlikely to change over time. To this end, the calibration sample is a calibration sample for an autofocus target position in an optical microscope, and comprises a light-transmissive resin sample container that accommodates a first layer, which is disposed on a bottom side along the optical axis direction of the optical microscope and in which a target object having contrast with respect to a light-transmitting first resin is disposed inside the light-transmitting first resin, and a second layer which is disposed so as to cover the first layer and is composed of a light-transmitting second resin.
    Type: Application
    Filed: January 27, 2021
    Publication date: February 15, 2024
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventor: Akira Masuya
  • Patent number: 11892706
    Abstract: An observation device captures images at focal positions inside a sample container with an optical system that includes an objective lens; an objective lens actuator; an irradiation unit; a reflection light intensity detector; a focus controller that positions the focal point of the objective lens on a reflection surface imparting a peak in the reflected light intensity; and a counting unit. The focus control unit drives the objective lens actuator and positions the focal point on a reflection surface when a peak is detected in the reflected light intensity; and the counting unit counts the reflection surface when the focus control unit has positioned the focal point on the reflection surface. The computation unit determines whether or not the focal point is positioned at the focal position, and causes the optical system to capture images if the focal point is positioned at the focal position.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: February 6, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akira Masuya, Tadao Yabuhara, Hiroko Fujita
  • Patent number: 11618873
    Abstract: A culturing device includes a microplate including a plurality of vessels, each of the vessels having a bottom surface having light transmittance and an opening at an upper portion, a lid having light transmittance, and an intermediate plate having light transmittance sandwiched between the lid and the microplate. The intermediate plate has a plurality of convex portions on a surface thereof facing the microplate and provided with a plurality of through holes corresponding to the convex portions that are disposed so that when the intermediate plate and the microplate are overlapped, each of the plurality of convex portions is inserted into each of the plurality of vessels and each of the plurality of through holes coincides with the opening of each of the plurality of vessels. The lid comes into contact with the intermediate plate so as to close the plurality of through holes provided in the intermediate plate.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: April 4, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Chihiro Uematsu, Hiroko Fujita, Akira Masuya
  • Publication number: 20230100225
    Abstract: A microscopic image capturing method includes: emitting a light beam from a light beam light source; detecting a spot image by a camera or a photodiode; focusing the spot image by an objective lens actuator moving an objective lens in the optical axis direction of the light beam with respect to a sample container; determining by a reflective surface identification unit whether the light beam has been applied to a defect on the basis of the spot image; when it is determined that the light beam has been applied to the defect, moving by an XY stage the sample container with respect to the objective lens in a direction orthogonal to the optical axis of the light beam in accordance with a prescribed condition; and, when the light beam has not been applied to the defect, capturing a microscopic image of a sample by using an illuminator.
    Type: Application
    Filed: March 9, 2020
    Publication date: March 30, 2023
    Applicant: Hitachi High-Tech Corporation
    Inventors: Akira MASUYA, Tadao YABUHARA
  • Patent number: 11578300
    Abstract: Provided is a test apparatus in which a test for bacterial identification or antimicrobial susceptibility can be promptly determined. A division state of bacteria is monitored by performing microscopic observation of shapes and the number of the bacteria in each of wells in a culture plate for bacterial identification culture or an antimicrobial susceptibility test, and it is determined whether or not the bacteria grow in a stage shifted from an induction phase to a logarithmic phase, with reference to an image obtained through microscopic observation. In addition, determination performed based on turbidity in the related art may be combined with determination performed based on microscopic observation in which change and the like in the shapes of the bacteria are monitored. Accordingly, it is possible to realize a highly accurate test result.
    Type: Grant
    Filed: December 14, 2020
    Date of Patent: February 14, 2023
    Assignee: Hitachi High-Tech Corporation
    Inventors: Chihiro Uematsu, Muneo Maeshima, Akira Masuya
  • Patent number: 11571698
    Abstract: Provided is an antibacterial agent-containing dried plate having no cracks on an observation surface (a part of the plate corresponding to an observation visual field of a microscope). According to the present embodiment, an antibacterial agent-introduced plate obtained by introducing an antibacterial agent and performing vacuum drying has a recess at an edge of a well, and a microscopic observation portion, which has a surface substantially parallel to a well bottom surface, near the center of the well. The recess is provided between the microscopic observation portion and a side wall of the well, and is lower in height than the microscopic observation portion. Further, at least the bottom surface of the well and the microscopic observation portion are made of a material having a light-transmitting property in order for optical measurement (FIG. 1).
    Type: Grant
    Filed: November 2, 2018
    Date of Patent: February 7, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Chihiro Uematsu, Yuichi Uchiho, Akira Masuya
  • Patent number: 11506675
    Abstract: The purpose of the present invention is to embody an inspection device wherein dew condensation in a sample container, in particular, in the lid thereof can be prevented or quickly removed without giving heat shock to a sample in the sample container. For this purpose, provided is an inspection device comprising an isothermal part 110 which comprises a rack 111 and maintains a sample container 150 storing a sample in a temperature-controlled environment, said sample container 150 comprising a plate and a lid, a detection part 120 which comprises an optical device for observing and inspecting the sample stored in the sample container, and a transportation part 130 which transports the sample container from the isothermal part to the detection part and vice versa, wherein at least one of the isothermal part, detection part and transportation part is provided with a member by which the lid of the sample container is held in a state lifted from the plate.
    Type: Grant
    Filed: March 28, 2017
    Date of Patent: November 22, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akira Masuya, Hiroko Fujita
  • Publication number: 20220260479
    Abstract: Provided is a particle quantitative measurement device according to which the number of particles that can be accurately recognized in a particulate sample has a wider range. An observation device 1 comprises a computer 108 and an imaging camera 107 for acquiring a sample image representing the particulate sample. As an extraction unit, the computer 108 extracts a low-brightness pixel for which I<M?k? is satisfied for brightness I from pixels of the sample image. Here, M represents brightness for a reference image, k represents a real positive number, and ? represents a standard deviation for the brightnesses of the pixels in the reference image. The computer 108 also functions as a particle recognition unit or a particle quantitative measurement unit and quantitatively measures the particulate sample on the basis of the low-brightness pixel.
    Type: Application
    Filed: March 17, 2020
    Publication date: August 18, 2022
    Inventors: Noriko Ebine, Satoshi Takahashi, Akira Masuya
  • Publication number: 20220145233
    Abstract: Provided is a technique for preventing erroneous recognition of a fine particle region from a captured image of fine particles. A fine particle testing apparatus of the present disclosure includes: an imaging part capturing a first fine particle image of a well that holds a liquid containing fine particles; an image processor executing a process of generating a second fine particle image by extracting a contour of the first fine particle image, a process of performing a logical operation between the first fine particle image and the second fine particle image, a process of calculating a feature amount of the fine particles based on a result of the logical operation, and a process of determining growth of the fine particles in the well based on the calculated feature amount; and an output part outputting a result of the determination.
    Type: Application
    Filed: March 4, 2019
    Publication date: May 12, 2022
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Kiyotaka SUGIYAMA, Tetsushi KOIDE, Chihiro UEMATSU, Hiroko FUJITA, Akira MASUYA
  • Publication number: 20210263262
    Abstract: An observation device captures images at focal positions inside a sample container with an optical system that includes an objective lens; an objective lens actuator; an irradiation unit; a reflection light intensity detector; a focus controller that positions the focal point of the objective lens on a reflection surface imparting a peak in the reflected light intensity; and a counting unit. The focus control unit drives the objective lens actuator and positions the focal point on a reflection surface when a peak is detected in the reflected light intensity; and the counting unit counts the reflection surface when the focus control unit has positioned the focal point on the reflection surface. The computation unit determines whether or not the focal point is positioned at the focal position, and causes the optical system to capture images if the focal point is positioned at the focal position.
    Type: Application
    Filed: June 20, 2018
    Publication date: August 26, 2021
    Inventors: Akira MASUYA, Tadao YABUHARA, Hiroko FUJITA
  • Publication number: 20210208172
    Abstract: The purpose of the present invention is to enhance the throughput of an analysis device by efficiently delivering sample containers between an accommodation unit and measurement unit. This analysis device comprises a first holding part for holding a sample container to be delivered to a measurement unit and a second holding part for holding a sample container received from the measurement unit. The first holding part and second holding part are moved in an integrated manner (see FIG. 1B).
    Type: Application
    Filed: May 22, 2018
    Publication date: July 8, 2021
    Applicant: Hitachi High-Tech Corporation
    Inventors: Tadao Yabuhara, Akira Masuya, Terumi Tamura
  • Publication number: 20210189321
    Abstract: Provided is a test apparatus in which a test for bacterial identification or antimicrobial susceptibility can be promptly determined. A division state of bacteria is monitored by performing microscopic observation of shapes and the number of the bacteria in each of wells in a culture plate for bacterial identification culture or an antimicrobial susceptibility test, and it is determined whether or not the bacteria grow in a stage shifted from an induction phase to a logarithmic phase, with reference to an image obtained through microscopic observation. In addition, determination performed based on turbidity in the related art may be combined with determination performed based on microscopic observation in which change and the like in the shapes of the bacteria are monitored. Accordingly, it is possible to realize a highly accurate test result.
    Type: Application
    Filed: December 14, 2020
    Publication date: June 24, 2021
    Inventors: Chihiro Uematsu, Muneo Maeshima, Akira Masuya
  • Patent number: 10983039
    Abstract: In the present invention, information is analyzed, the positional relationship of cells/microbes in the optical axis direction is detected, and motility of cells/microbes is evaluated even in an out-of-focus view from an image obtained by a single image capture in an observation view of the cells/microbes.
    Type: Grant
    Filed: December 22, 2016
    Date of Patent: April 20, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Akira Masuya, Muneo Maeshima
  • Patent number: 10900011
    Abstract: Provided is a test apparatus in which a test for bacterial identification or antimicrobial susceptibility can be promptly determined. A division state of bacteria is monitored by performing microscopic observation of shapes and the number of the bacteria in each of wells in a culture plate for bacterial identification culture or an antimicrobial susceptibility test, and it is determined whether or not the bacteria grow in a stage shifted from an induction phase to a logarithmic phase, with reference to an image obtained through microscopic observation. In addition, determination performed based on turbidity in the related art may be combined with determination performed based on microscopic observation in which change and the like in the shapes of the bacteria are monitored. Accordingly, it is possible to realize a highly accurate test result.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: January 26, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Chihiro Uematsu, Muneo Maeshima, Akira Masuya
  • Publication number: 20200391206
    Abstract: Provided is an antibacterial agent-containing dried plate having no cracks on an observation surface (a part of the plate corresponding to an observation visual field of a microscope). According to the present embodiment, an antibacterial agent-introduced plate obtained by introducing an antibacterial agent and performing vacuum drying has a recess at an edge of a well, and a microscopic observation portion, which has a surface substantially parallel to a well bottom surface, near the center of the well. The recess is provided between the microscopic observation portion and a side wall of the well, and is lower in height than the microscopic observation portion. Further, at least the bottom surface of the well and the microscopic observation portion are made of a material having a light-transmitting property in order for optical measurement.
    Type: Application
    Filed: November 2, 2018
    Publication date: December 17, 2020
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Chihiro UEMATSU, Yuichi UCHIHO, Akira MASUYA
  • Patent number: 10624712
    Abstract: This sensitivity measuring device is provided with: a stage for placing a sample container; a temperature adjustment device that is provided with an upper heating body and a lower heating body, which are disposed above and below the sample container; and an image pickup device for picking up an image of the sample container, said image pickup device being provided with a lighting apparatus and an image pickup apparatus. Each of the upper heating body and the lower heating body has a structure wherein the temperature of a first region, a peripheral portion, is higher than the temperature of a second region including a center portion.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: April 21, 2020
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hideaki Minekawa, Muneo Maeshima, Akira Masuya
  • Publication number: 20200018774
    Abstract: The purpose of the present invention is to embody an inspection device wherein dew condensation in a sample container, in particular, in the lid thereof can be prevented or quickly removed without giving heat shock to a sample in the sample container. For this purpose, provided is an inspection device comprising an isothermal part 110 which comprises a rack 111 and maintains a sample container 150 storing a sample in a temperature-controlled environment, said sample container 150 comprising a plate and a lid, a detection part 120 which comprises an optical device for observing and inspecting the sample stored in the sample container, and a transportation part 130 which transports the sample container from the isothermal part to the detection part and vice versa, wherein at least one of the isothermal part, detection part and transportation part is provided with a member by which the lid of the sample container is held in a state lifted from the plate.
    Type: Application
    Filed: March 28, 2017
    Publication date: January 16, 2020
    Inventors: Akira MASUYA, Hiroko FUJITA
  • Publication number: 20190292505
    Abstract: A culturing device includes a microplate including a plurality of vessels, each of the vessels having a bottom surface having light transmittance and an opening at an upper portion, a lid having light transmittance, and an intermediate plate having light transmittance sandwiched between the lid and the microplate. The intermediate plate has a plurality of convex portions on a surface thereof facing the microplate and provided with a plurality of through holes corresponding to the convex portions that are disposed so that when the intermediate plate and the microplate are overlapped, each of the plurality of convex portions is inserted into each of the plurality of vessels and each of the plurality of through holes coincides with the opening of each of the plurality of vessels. The lid comes into contact with the intermediate plate so as to close the plurality of through holes provided in the intermediate plate.
    Type: Application
    Filed: December 14, 2016
    Publication date: September 26, 2019
    Inventors: Chihiro UEMATSU, Hiroko FUJITA, Akira MASUYA
  • Publication number: 20190033192
    Abstract: In the present invention, information is analyzed, the positional relationship of cells/microbes in the optical axis direction is detected, and motility of cells/microbes is evaluated even in an out-of-focus view from an image obtained by a single image capture in an observation view of the cells/microbes.
    Type: Application
    Filed: December 22, 2016
    Publication date: January 31, 2019
    Inventors: Akira MASUYA, Muneo MAESHIMA
  • Publication number: 20180079996
    Abstract: This sensitivity measuring device is provided with: a stage for placing a sample container; a temperature adjustment device that is provided with an upper heating body and a lower heating body, which are disposed above and below the sample container; and an image pickup device for picking up an image of the sample container, said image pickup device being provided with a lighting apparatus and an image pickup apparatus. Each of the upper heating body and the lower heating body has a structure wherein the temperature of a first region, a peripheral portion, is higher than the temperature of a second region including a center portion.
    Type: Application
    Filed: March 28, 2016
    Publication date: March 22, 2018
    Inventors: Hideaki MINEKAWA, Muneo MAESHIMA, Akira MASUYA