Patents by Inventor Akira Sawaguchi

Akira Sawaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240077712
    Abstract: Provided is an efficient method for attaching a tissue section. In the invention, one of problems is solved by changing attachment conditions of the tissue section depending on an organ from which the tissue section is derived. A technique of achieving good adhesiveness between a microscope slide and a section by introducing unevenness on a front surface of the microscope slide using reactive ion etching as one of the attachment conditions is provided. Further, a technique of optimizing the attachment of the section using a machine learning technique or the like is provided.
    Type: Application
    Filed: October 16, 2019
    Publication date: March 7, 2024
    Inventors: Toru FUJIMURA, Takahito HASHIMOTO, Shigehiko KATO, Eiko NAKAZAWA, Masahiko AJIMA, Akira SAWAGUCHI
  • Patent number: 11321585
    Abstract: Provided is an image classification device that facilitates efficient creation of teacher data and comprehensive evaluation on a basis of knowledge and experience of the user.
    Type: Grant
    Filed: April 14, 2017
    Date of Patent: May 3, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Yaku Maeda, Akira Ikeuchi, Shigeru Kawamata, Hiromi Mise, Akira Sawaguchi
  • Patent number: 11221280
    Abstract: The invention provides a method of preparing a biological tissue sample and a method of observing a biological tissue section sample that enable stereoscopic observation of a biological tissue easily and rapidly without destroying a biological tissue piece. The method of observing a biological tissue sample according to the invention is a method in which stereoscopic morphology of a biological tissue sample is observed, and the method includes: cutting out a sample having a thickness of 15 to 50 ?m from a sample block obtained by fixing, dehydrating, and paraffin-embedding a sample cut out from a biological tissue; transferring the sample to a surface-treated slide glass; stretching the sample on the slide glass; performing deparaffinization processing; then, staining the sample with a heavy metal-based staining agent; and observing the stained sample with a scanning electron microscope.
    Type: Grant
    Filed: October 25, 2017
    Date of Patent: January 11, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Akira Sawaguchi, Takahito Hashimoto, Eiko Nakazawa, Masahiko Ajima, Takeshi Kamimura
  • Publication number: 20200232891
    Abstract: The invention provides a method of preparing a biological tissue sample and a method of observing a biological tissue section sample that enable stereoscopic observation of a biological tissue easily and rapidly without destroying a biological tissue piece. The method of observing a biological tissue sample according to the invention is a method in which stereoscopic morphology of a biological tissue sample is observed, and the method includes: cutting out a sample having a thickness of 15 to 50 ?m from a sample block obtained by fixing, dehydrating, and paraffin-embedding a sample cut out from a biological tissue; transferring the sample to a surface-treated slide glass; stretching the sample on the slide glass; performing deparaffinization processing; then, staining the sample with a heavy metal-based staining agent; and observing the stained sample with a scanning electron microscope.
    Type: Application
    Filed: October 25, 2017
    Publication date: July 23, 2020
    Inventors: Akira SAWAGUCHI, Takahito HASHIMOTO, Eiko NAKAZAWA, Masahiko AJIMA, Takeshi KAMIMURA
  • Publication number: 20200125894
    Abstract: Provided is an image classification device that facilitates efficient creation of teacher data and comprehensive evaluation on a basis of knowledge and experience of the user.
    Type: Application
    Filed: April 14, 2017
    Publication date: April 23, 2020
    Inventors: Yaku MAEDA, Akira IKEUCHI, Shigeru KAWAMATA, Hiromi MISE, Akira SAWAGUCHI
  • Publication number: 20200056141
    Abstract: Provided is a charged particle beam apparatus capable of more objectively and highly accurately calculating a feature of a cell from an observation image of a cell and evaluating a cell. The charged particle beam apparatus includes an image acquisition unit 18 that acquires an image of a cell, a contour extraction unit 19 that extracts a contour of the image, a feature calculation unit 20 that calculates a morphological feature of the contour based on the contour and calculates the feature of an internal structure such as a cytoplasm contained in an internal area of the contour, and a determination unit 21 that determines quality and/or functionality of the cell based on the feature, and can objectively and highly accurately evaluate the quality and/or the functionality of the cell included in the captured image.
    Type: Application
    Filed: April 14, 2017
    Publication date: February 20, 2020
    Inventors: Akira IKEUCHI, Shigeru KAWAMATA, Hiromi MISE, Akira SAWAGUCHI
  • Patent number: 10495734
    Abstract: Provided is a position locating instrument for a position locating method in which position locating instruments that transmit and receive light beams are arranged in series connection. The position locating instruments reduce error factors and improve measurement accuracy by providing all or some of necessary position and attitude parameters. The position locating instrument has at least one light emission port through which light from a wavelength-changeable light source is emitted; and at least one light receiving port that receives light emitted or reflected by an adjacent position locating instrument. The light emitted from the light emission port has a fanlike pattern and has an emission angle varying, as a monotonic function of a wavelength of the light, in a direction perpendicular to a direction in which the light spreads in the fanlike pattern.
    Type: Grant
    Filed: January 6, 2016
    Date of Patent: December 3, 2019
    Assignee: NTT ADVANCED TECHNOLOGY CORPORATION
    Inventors: Shogo Yagi, Fumio Saito, Kazunori Naganuma, Eiichi Sugai, Tohru Kodaira, Akira Sawaguchi, Hideki Hagino, Takeshi Watanabe, Noriyuki Ishidu, Hiizu Takemura
  • Publication number: 20170299698
    Abstract: Provided is a position locating instrument for a position locating method in which position locating instruments that transmit and receive light beams are arranged in series connection. The position locating instruments reduce error factors and improve measurement accuracy by providing all or some of necessary position and attitude parameters. The position locating instrument has at least one light emission port through which light from a wavelength-changeable light source is emitted; and at least one light receiving port that receives light emitted or reflected by an adjacent position locating instrument. The light emitted from the light emission port has a fanlike pattern and has an emission angle varying, as a monotonic function of a wavelength of the light, in a direction perpendicular to a direction in which the light spreads in the fanlike pattern.
    Type: Application
    Filed: January 6, 2016
    Publication date: October 19, 2017
    Inventors: Shogo Yagi, Fumio Saito, Kazunori Naganuma, Eiichi Sugai, Tohru Kodaira, Akira Sawaguchi, Hideki Hagino, Takeshi Watanabe, Noriyuki Ishidu, Hiizu Takemura