Patents by Inventor Akira Sekiya
Akira Sekiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240094370Abstract: According to one embodiment, a radar device comprises a panel including clusters and a controller. The controller is configured to cause a first cluster of the clusters to transmit an electromagnetic wave to a target, cause the first cluster and at least one second cluster adjacent to the first cluster to receive a reflected wave from the target, and cause the first cluster and the at least one second cluster to output a reception signal. At least one cluster other than the first cluster and other than the at least one second cluster does not output the reception signal.Type: ApplicationFiled: February 17, 2023Publication date: March 21, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Takashi SEKI, Akira MORIYA, Kazuhiro TSUJIMURA, Ryota SEKIYA, Hiroki MORI
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Publication number: 20240085548Abstract: According to one embodiment, an inspection system includes an estimation device and a detection device. The estimation device is configured to estimate an inspection range having a possibility that a predetermined object is present. The detection device is configured to generate detection information as to whether or not the predetermined object is present in the inspection range.Type: ApplicationFiled: March 7, 2023Publication date: March 14, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Daiki YODA, Hiroki MORI, Tomoya TANDAI, Akira MORIYA, Ryota SEKIYA
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Patent number: 8513458Abstract: The present invention provides a method for inexpensively, efficiently, safely, and continuously producing COF2, without using highly toxic raw materials such as phosgene or difficult-to-get raw materials, with no risk of explosion or the like. Tetrafluoroethylene gas and oxygen gas are introduced into a reactor, and they are then heated in a gas phase in the absence of nitrogen gas for reaction, so as to produce carbonyl fluoride. The reactor is preferably a tubular reaction tube. As such tetrafluoroethylene gas, unpurified or purified tetrafluoroethylene gas obtained by heating HCFC-22 gas for thermal decomposition can be used. According to the present invention, COF2 that is useful as cleaning gas for CVD devices (chemical vapor deposition method) can be inexpensively, efficiently, and safely produced.Type: GrantFiled: September 26, 2006Date of Patent: August 20, 2013Assignee: Nat'l Institute of Advanced Industrial Science and TechnologyInventors: Heng-dao Quan, Masanori Tamura, Akira Sekiya
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Publication number: 20130158304Abstract: An object is to provide a method for producing 1,1,1,4,4,4-hexafluoro-2-butene with high efficiency, which is suitable for a flow reaction, and cis-1,1,1,4,4,4-hexafluoro-2-butene can be efficiently obtained when isomerization of hexafluoro-1,3-butadiene is conducted using a catalyst and the resultant mixture is successively subjected to catalytic hydrogenation to produce cis-1,1,1,4,4,4-hexafluoro-2-butene, wherein the whole process is performed by a flow catalytic reaction.Type: ApplicationFiled: June 13, 2011Publication date: June 20, 2013Inventors: Heng-dao Quan, Masanori Tamura, Junji Mizukado, Akira Sekiya
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Patent number: 8277560Abstract: A CVD apparatus cleaning method that efficiently removes by-product such as SiO2 or Si3N4 adhered to and deposited on surfaces of an inner wall, an electrode, and the like in a reaction chamber at a film forming step. In the cleaning method the discharged cleaning gas amount is very small, environmental influences such as global warming can be lessened, and cost can be reduced. A CVD apparatus supplying reactive gas into a reaction chamber and forming a deposited film on a surface of a base material provided in the reaction chamber includes an exhaust gas recycling path recycling an exhaust gas reaching the reaction chamber from downstream of a pump on an exhaust path for exhausting a gas from an inner part of the reaction chamber through the pump.Type: GrantFiled: March 19, 2003Date of Patent: October 2, 2012Assignees: National Institute of Advanced Industrial Science and Technology, Canon Anelva Corporation, Ulvac, Inc., Kanto Denka Kogyo Co., Ltd., Sanyo Electric Co., Ltd., Showa Denko K.K., Sony Corporation, Tokyo Eectron Limited, Hitachi Kokusai Electric Inc., Panasonic Corporation, Mitsubishi Denki Kabushiki Kaisha, Renesas Electronics CorporationInventors: Katsuo Sakai, Seiji Okura, Masaji Sakamura, Kaoru Abe, Hitoshi Murata, Etsuo Wani, Kenji Kameda, Yuki Mitsui, Yutaka Ohira, Taisuke Yonemura, Akira Sekiya
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Patent number: 8043438Abstract: An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO2 or Si3N4 stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF4 in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF4 to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.Type: GrantFiled: March 12, 2004Date of Patent: October 25, 2011Assignees: National Institute of Advanced Industrial Science and Technology, Canon Anelva Corporation, Ulvac, Inc., Sanyo Electric Co., Ltd., Sony Corporation, Tokyo Electron Limited, Hitachi Kokusai Electric Inc., Renesas Electronics Corporation, Fujitsu Semiconductor LimitedInventors: Katsuo Sakai, Kaoru Abe, Seiji Okura, Masaji Sakamura, Hitoshi Murata, Kenji Kameda, Etsuo Wani, Akira Sekiya
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Publication number: 20110061587Abstract: [Problem] To provide a method of producing a pretreated metal fluoride containing impurities such as oxygen in decreased amounts and a fluoride crystal containing impurities such as oxygen in decreased amounts and having excellent optical properties such as transparency. [Means for Solution] A metal fluoride is heated in a temperature range of not lower than 300° K. but not higher than 1780° K in the co-presence of a carbonyl fluoride of an amount of not less than 1/100 mol per mol of the metal fluoride to thereby obtain a pretreated metal fluoride while removing oxygen and water from the starting metal fluoride and from the interior of the production furnace. Further, the pretreated metal fluoride as a starting material is heated and melted, and a fluoride crystal of a high quality is obtained from the obtained melt by a crystal growing method such as a melt pull-up method or a melt pull-down method.Type: ApplicationFiled: May 15, 2009Publication date: March 17, 2011Inventors: Sumito Ishizu, Akira Sekiya, Kentaro Fukuda, Toshihisa Suyama
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Publication number: 20100191013Abstract: The present invention provides a method for inexpensively, efficiently, safely, and continuously producing COF2, without using highly toxic raw materials such as phosgene or difficult-to-get raw materials, with no risk of explosion or the like. Tetrafluoroethylene gas and oxygen gas are introduced into a reactor, and they are then heated in a gas phase in the absence of nitrogen gas for reaction, so as to produce carbonyl fluoride. The reactor is preferably a tubular reaction tube. As such tetrafluoroethylene gas, unpurified or purified tetrafluoroethylene gas obtained by heating HCFC-22 gas for thermal decomposition can be used. According to the present invention, COF2 that is useful as cleaning gas for CVD devices (chemical vapor deposition method) can be inexpensively, efficiently, and safely produced.Type: ApplicationFiled: September 26, 2006Publication date: July 29, 2010Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Heng-dao Quan, Masanori Tamura, Akira Sekiya
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Publication number: 20090105510Abstract: A method for the preparation of a novel fluorinated compound, particularly 1,1,1,3,3-pentafluoropropane (HFC-245fa), by using a fluorination catalyst obtained by treating a metal salt containing a chromium salt such as chromium oxide with chlorine gas and/or oxygen gas. Examples of the metal salt may include, besides a chromium salt, one or more catalytically active metal salts selected from magnesium salts, aluminum salts, zinc salts, sodium salts, nickel salts, iron salts, cobalt salts, vanadium salts, manganese salts and copper salts.Type: ApplicationFiled: December 17, 2008Publication date: April 23, 2009Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Heng-dao Quan, Huie Yang, Masanori Tamura, Akira Sekiya
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Publication number: 20080274334Abstract: A dry etching gas comprising a C4-6 fluorine compound which has an ether bond or carbonyl group and one or more fluorine atoms in the molecule and is constituted only of carbon, fluorine, and oxygen atoms and in which the ratio of the number of fluorine atoms to the number of carbon atoms (F/C) is 1.9 or lower (provided that the compound is neither a fluorine compound having one cyclic ether bond and one carbon-carbon double bond nor a saturated fluorine compound having one carbonyl group); a mixed dry etching gas comprising the dry etching gas and at least one gas selected from the group consisting of rare gases, O2, O3, CO, CO2, CHF3, CH2F2, CF4, C2F6, and C3F8; and a method of dry etching which comprises converting either of these dry etching gases into a plasma and processing a semiconductor material with the plasma.Type: ApplicationFiled: May 30, 2005Publication date: November 6, 2008Applicants: National Institute of Advanced Industrial Science and Technology, Zeon CorporationInventors: Akira Sekiya, Tatsuya Sugimoto, Toshiro Yamada, Takanobu Mase
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Patent number: 7332628Abstract: The process for producing carbonyl fluoride according to the invention is a process for safely and easily producing high-purity carbonyl fluoride having a low content of carbon tetrafluoride, and comprises feeding carbon monoxide and fluorine to a reactor and allowing carbon monoxide to react with fluorine under the conditions of a reactor internal pressure of less than atmospheric pressure.Type: GrantFiled: March 12, 2004Date of Patent: February 19, 2008Assignees: National Institute of Advanced Industrial Science and Technology, Asahi Glass Company, Limited, Kanto Denka Kogyo Co., Ltd., Showa Denko Kabushiki Kaisha, Daikin Industries, Ltd., Hitachi Kokusai Electric Inc.Inventors: Yuki Mitsui, Taisuke Yonemura, Yutaka Ohira, Akira Sekiya
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Patent number: 7326279Abstract: A method for removing harmful substances in a vent gas containing a halogen or halogen compound gas remaining in the pipeline of a cylinder cabinet, which comprises contacting the vent gas with a treating agent comprising an alkaline earth metal compound, an alkali metal compound, zeolite, and a carbonaceous material.Type: GrantFiled: November 28, 2003Date of Patent: February 5, 2008Assignees: Kanto Denka Kogyo Co., Ltd., Research Institute of Innovative Technology for the Earth, National Institute of Advanced Industrial Science and TechnologyInventors: Yasuo Nakazawa, Moriyuki Fukushima, Kensuke Suda, Akira Sekiya
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Patent number: 7322368Abstract: A plasma cleaning gas for CVD chamber is a gas for cleaning silicon-containing deposits on the surface of a CVD chamber inner wall and the surfaces of members placed inside the CVD chamber after film forming treatment on a substrate by a plasma CVD apparatus. The cleaning gas includes 100% by volume of fluorine gas which gas can generate plasma by electric discharge. When 100% by volume of fluorine gas is plasma-generated by electric discharge and then used as a cleaning gas, an extremely excellent etching rate can be attained and further plasma can be stably generated even in the total gas flow rate of 1000 sccm and at a chamber pressure of 400 Pa. Further, the uniformity of cleaning can be also ensured in the above conditions. Additionally the fluorine gas concentration is 100% so that the apparatus is not complicated and thereby the cleaning gas has excellent practicability.Type: GrantFiled: August 26, 2002Date of Patent: January 29, 2008Inventors: Akira Sekiya, Yuki Mitsui, Yutaka Ohira, Taisuke Yonemura
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Patent number: 7247289Abstract: A porous aluminum fluoride on which SbClxF5-x (wherein x represents a numeral of 0 to 5) is supported, SbClxF5-x being obtainable by supporting SbCl5, or the like on a porous aluminum fluoride and treating it with hydrogen fluoride. The resulting porous aluminum fluoride has a high activity as a fluorinating agent, a fluorination catalyst, or the like, is easy to handle, can be used for a flow-type reaction, and also can be used even at a high temperature.Type: GrantFiled: November 12, 2003Date of Patent: July 24, 2007Assignee: National Institute of Advanced Industrial Science and TechnologyInventors: Hengdao Quan, Masanori Tamura, Akira Sekiya
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Publication number: 20070027348Abstract: The present invention provides a novel fluorination catalyst that has high stability at high temperatures, is easily regenerated and is superior in catalytic activity and selectivity and a method for the preparation of the fluorination catalyst. The present invention also provides a method for the preparation of a novel fluorinated compound, and particularly, 1,1,1,3,3-pentafluoropropane (HFC-245fa), by using the catalyst. The fluorination catalyst of the present invention is obtained by treating a metal salt containing a chromium salt such as chromium oxide with chlorine gas and/or oxygen gas. Examples of the metal salt may include, besides a chromium salt, one or more catalytically active metal salts selected from magnesium salts, aluminum salts, zinc salts, sodium salts, nickel salts, iron salts, cobalt salts, vanadium salts, manganese salts and copper salts.Type: ApplicationFiled: July 7, 2006Publication date: February 1, 2007Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Heng-dao Quan, Huie Yang, Masanori Tamura, Akira Sekiya
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Patent number: 7138364Abstract: A chamber-cleaning gas and an etching gas used for a silicon-containing film according to the present invention comprise a perfluoro cyclic ether having 2 to 4 carbon atoms which are ether-linked with carbon atoms. The chamber-cleaning gas and the etching gas hardly generate a harmful waste gas, such as CF4, which is one of the causes for global warming so that they are good for environment. Further, they are a non-toxic gas or a volatile liquid, and are easy to use and are excellent in treatment of waste gas. Additionally, the chamber-cleaning gas of the present invention has an excellent cleaning rate.Type: GrantFiled: January 28, 2003Date of Patent: November 21, 2006Assignees: Asahi Glass Company, Limited, Anelva Corporation, Ulvac, Inc., Kanto Denka Kogyo Co., Ltd., Sanyo Electric Co., Ltd., Sony Corporation, Daikin Industries, Ltd., Hitachi Kokusai Electric Inc., Fujitsu Limited, Matsushita Electric Industrial Co., Ltd., Renesas Technology Corp., National Institute of Advanced Industrial Science and TechnologyInventors: Yutaka Ohira, Yuki Mitsui, Taisuke Yonemura, Akira Sekiya
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Publication number: 20060207630Abstract: An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO2 or Si3N4 stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF4 in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF4 to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.Type: ApplicationFiled: March 12, 2004Publication date: September 21, 2006Applicants: RESEARCH INST. OF INNOVATIVE TECH. FOR THE EARTH, National Inst. of Adv. Industrial Sci. and TechInventors: Katsuo Sakai, Kaoru Abe, Seiji Okura, Masaji Sakamura, Hitoshi Murata, Kenji Kameda, Etsuo Wani, Akira Sekiya
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Publication number: 20060194985Abstract: The process for producing carbonyl fluoride according to the invention is a process for safely and easily producing high-purity carbonyl fluoride having a low content of carbon tetrafluoride, and comprises feeding carbon monoxide and fluorine to a reactor and allowing carbon monoxide to react with fluorine under the conditions of a reactor internal pressure of less than atmospheric pressure.Type: ApplicationFiled: March 12, 2004Publication date: August 31, 2006Applicant: Research Inst. Of Innovative Tech. For The EarthInventors: Yuki Mitsui, Taisuke Yonemura, Yutaka Ohira, Akira Sekiya
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Publication number: 20060032373Abstract: A method for removing harmful substances in a vent gas containing a halogen or halogen compound gas remaining in the pipeline of a cylinder cabinet, which comprises contacting the vent gas with a treating agent comprising an alkaline earth metal compound, an alkali metal compound, zeolite, and a carbonaceous material.Type: ApplicationFiled: November 28, 2003Publication date: February 16, 2006Applicants: KANTO DENKA KOGYO., LTD., RESEARCH INSTITUTE OF INNOVATIVE TECHNOLOGY FOR THE EARTH, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Yasuo Nakazawa, Moriyuki Fukushima, Kensuke Suda, Akira Sekiya
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Publication number: 20050252451Abstract: It is an object to provide a cleaning method in a CVD apparatus capable of efficiently removing a by-product such as SiO2 or Si3N4 which is adhered to and deposited on the surfaces of an inner wall, an electrode and the like in a reaction chamber at a film forming step. Furthermore, it is an object to provide a cleaning method in which the amount of a cleaning gas to be discharged is very small, an influence on an environment such as global warming is also lessened and a cost can also be reduced. An energy is applied to a fluorine compound to react the fluorine compound, thereby generating a fluorine gas component and a component other than the fluorine gas component. Furthermore, the fluorine gas component and the component other than the fluorine gas component which are generated are separated from each other so that the fluorine gas component is separated and refined.Type: ApplicationFiled: March 13, 2003Publication date: November 17, 2005Inventors: Tatsuro Beppu, Katsuo Sakai, Seiji Okura, Masaji Sakamura, Kaoru Abe, Hitoshi Murata, Etsuo Wani, Kenji Kameda, Yuki Mitsui, Yutaka Ohira, Taisuke Yonemura, Akira Sekiya