Patents by Inventor Alain Coulombe
Alain Coulombe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7403650Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: GrantFiled: June 26, 2006Date of Patent: July 22, 2008Assignee: SolVision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Publication number: 20070146727Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: ApplicationFiled: June 26, 2006Publication date: June 28, 2007Applicant: SOLVISION INC.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Patent number: 7079666Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: GrantFiled: March 22, 2001Date of Patent: July 18, 2006Assignee: Solvision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Patent number: 7023559Abstract: A method and a system for measuring the relief of an object are described herein. The system includes a grid projecting for projecting a grid, an image acquisition apparatus that includes a camera, and a computer. Providing a reference object having common elements with the object to measure, the method includes the steps of a) positioning the grid at three different known positions relative to the camera and the common elements; b) for each position of the grid, projecting the grid unto the reference object and, with the camera, taking an image of the reference object to yield three images having values for each pixel of the camera and c) computing the reference object phase for each pixel using the three reference object intensity values for the corresponding pixel. Steps a), b) and c) are repeated by replacing the reference object by the object to be measured.Type: GrantFiled: July 14, 2000Date of Patent: April 4, 2006Assignee: Solvision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Patent number: 6771807Abstract: A method and a system for detecting surface defects on electronic circuits, such as Printed Circuit Boards (PCB), are described herein. The method first comprises identifying contours on a digital image of the PCB. Then anomalies are detected on the PCB image by comparing the identified contours to contours on a vectorial model of the PCB. Each detected anomaly is compared to manufacturing data to verify if it corresponds to a defect.Type: GrantFiled: January 18, 2001Date of Patent: August 3, 2004Assignee: Solvision Inc.Inventors: Alain Coulombe, Michel Cantin, Louis BĂ©rard, Jonathan Gauthier
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Publication number: 20020018118Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: ApplicationFiled: March 22, 2001Publication date: February 14, 2002Applicant: SOLVISION INC.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Publication number: 20010028732Abstract: A method and a system for detecting surface defects on electronic circuits, such as Printed Circuit Boards (PCB), are described herein. The method first comprises identifying contours on a digital image of the PCB. Then anomalies are detected on the PCB image by comparing the identified contours to contours on a vectorial model of the PCB. Each detected anomaly is compared to manufacturing data to verify if it corresponds to a defect.Type: ApplicationFiled: January 18, 2001Publication date: October 11, 2001Inventors: Alain Coulombe, Michel Cantin, Louis Berard, Jonathan Gauthier
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Patent number: 6038879Abstract: The combined air exchange and air conditioning unit is used for conditioning air from a conditioned space. The unit comprises an exhaust air chamber, a return air chamber, a supply air chamber, and a fresh air chamber. A supply blower is used for drawing air from inside the supply air chamber to the outside and an exhaust blower is used for drawing air from inside the exhaust air chamber. A central plate damper is provided for regulating air transfers between the chambers. The damper plate is movable within a position range defined between two extreme positions, the first position allowing a connection of the return air chamber with the supply air chamber and a connection of the fresh air chamber with the exhaust air chamber, the second extreme position allowing a connection of the return air chamber with the exhaust air chamber and a connection of the fresh air chamber with the supply air chamber.Type: GrantFiled: June 4, 1997Date of Patent: March 21, 2000Assignee: Yvon TurcotteInventors: Yvon Turcotte, Alain Coulombe
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Patent number: 5757473Abstract: An optical strain sensor for measuring microdeformations of a surface with a resolution of at least 0.2 microns. The sensor comprises at least one camera for taking photographs of areas of the surface, the photographs being separated by a known fixed distance from one another before deformation has occurred. Templates are selected on the photographs taken before deformation, relocalized on photographs taken after deformation of the surface, and the deformation is derived from the computation of the difference in distances between the templates before and after deformation has occurred.Type: GrantFiled: November 13, 1996Date of Patent: May 26, 1998Assignee: Noranda, Inc.Inventors: Harald Kanduth, Denis Jacob, Christian Renaud, Michel Cantin, Alain Coulombe
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Patent number: RE42899Abstract: A method and a system for measuring the relief of an object are described herein. The system includes a grid projecting for projecting a grid, an image acquisition apparatus that includes a camera, and a computer. Providing a reference object having common elements with the object to measure, the method includes the steps of a) positioning the grid at three different known positions relative to the camera and the common elements; b) for each position of the grid, projecting the grid unto the reference object and, with the camera, taking an image of the reference object to yield three images having values for each pixel of the camera and c) computing the reference object phase for each pixel using the three reference object intensity values for the corresponding pixel. Steps a), b) and c) are repeated by replacing the reference object by the object to be measured.Type: GrantFiled: July 14, 2000Date of Patent: November 8, 2011Assignee: Zygo CorporationInventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine